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  • Other Sources  (981)
  • ELECTRONICS AND ELECTRICAL ENGINEERING  (981)
  • 1995-1999  (104)
  • 1980-1984  (877)
  • 1
    Publication Date: 2004-12-03
    Description: Product realization is the process of defining, designing, developing, and delivering products to the market. While the main thrust of this JTEC panel was to conduct a complete investigation of the state of Japanese low-cost electronic packaging technologies, it is very difficult to totally separate the development of technology and products from the product realization process. Japan's electronics firms adhere to a product realization strategy based on a strong customer focus, a consistent commitment to excellence in design, and a cost-effective approach to technology commercialization. The Japanese product-pull strategy has been a successful driver and influencing factor in every aspect of the product development cycle.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: JTEC Panel Report on Electronic Manufacturing and Packaging in Japan; p 127-154
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  • 2
    Publication Date: 2004-12-03
    Description: Quality and reliability are two attributes required for all Japanese products, although the JTEC panel found these attributes to be secondary to customer cost requirements. While our Japanese hosts gave presentations on the challenges of technology, cost, and miniaturization, quality and reliability were infrequently the focus of our discussions. Quality and reliability were assumed to be sufficient to meet customer needs. Fujitsu's slogan, 'quality built-in, with cost and performance as prime consideration,' illustrates this point. Sony's definition of a next-generation product is 'one that is going to be half the size and half the price at the same performance of the existing one'. Quality and reliability are so integral to Japan's electronics industry that they need no new emphasis.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: JTEC Panel Report on Electronic Manufacturing and Packaging in Japan; p 115-126
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  • 3
    Publication Date: 2004-12-03
    Description: In the consumer electronics industry, precision processing technology is the basis for enhancing product functions and for minimizing components and end products. Throughout Japan, manufacturing technology is seen as critical to the production and assembly of advanced products. While its population has increased less than 30 percent over twenty-five years, Japan's gross national product has increase thirtyfold; this growth has resulted in large part from rapid replacement of manual operations with innovative, high-speed, large-scale, continuously running, complex machines that process a growing number of miniaturized components. The JTEC panel found that introduction of next-generation electronics products in Japan goes hand-in-hand with introduction of new and improved production equipment. In the panel's judgment, Japan's advanced process technologies and equipment development and its highly automated factories are crucial elements of its domination of the consumer electronics marketplace - and Japan's expertise in manufacturing consumer electronics products gives it potentially unapproachable process expertise in all electronics markets.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: JTEC Panel Report on Electronic Manufacturing and Packaging in Japan; p 97-114
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  • 4
    Publication Date: 2004-12-03
    Description: The JTEC panel found that, after four decades of development in electronics and manufacturing technologies, Japanese electronics companies are leaders in the development, support, and management of complex, low-cost packaging and assembly technologies used in the production of a broad range of consumer electronics products. The electronics industry's suppliers provide basic materials and equipment required for electronic packaging applications. Panelists concluded that some Japanese firms could be leading U.S. competitors by as much as a decade in these areas. Japan's technology and manufacturing infrastructure is an integral part of its microelectronics industry's success.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: JTEC Panel Report on Electronic Manufacturing and Packaging in Japan; p 35-58
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  • 5
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    In:  CASI
    Publication Date: 2004-12-03
    Description: JTEC panelists found a strong consistency among the electronics firms they visited: all the firms had clear visions or roadmaps for their research and development activities and had committed resources to ensure that they achieve targeted results. The overarching vision driving Japan's electronics industry is that of achieving market success through developing appealing, high-quality, low-cost consumer goods - ahead of the competition. Specifics of the vision include improving performance, quality, and portability of consumer electronics products. Such visions help Japanese companies define in detail the roadmaps they will follow to develop new and improved electronic packaging technologies.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: JTEC Panel Report on Electronic Manufacturing and Packaging in Japan; p 21-34
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  • 6
    Publication Date: 2004-12-03
    Description: The JTEC panel found Japan to have significant leadership over the United States in the strategic area of electronic packaging. Many technologies and products once considered the 'heart and soul' of U.S. industry have been lost over the past decades to Japan and other Asian countries. The loss of consumer electronics technologies and products is the most notable of these losses, because electronics is the United States' largest employment sector and is critical for growth businesses in consumer products, computers, automobiles, aerospace, and telecommunications. In the past there was a distinction between consumer and industrial product technologies. While Japan concentrated on the consumer market, the United States dominated the industrial sector. No such distinction is anticipated in the future; the consumer-oriented technologies Japan has dominated are expected to characterize both domains. The future of U.S. competitiveness will, therefore, depend on the ability of the United States to rebuild its technological capabilities in the area of portable electronic packaging.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: JTEC Panel Report on Electronic Manufacturing and Packaging in Japan; p 59-96
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  • 7
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    In:  CASI
    Publication Date: 2004-12-03
    Description: The purpose of this JTEC study is to evaluate Japan's electronic manufacturing and packaging capabilities within the context of global economic competition. To carry out this study, the JTEC panel evaluated the framework of the Japanese consumer electronics industry and various technological and organizational factors that are likely to determine who will win and lose in the marketplace. This study begins with a brief overview of the electronics industry, especially as it operates in Japan today. Succeeding chapters examine the electronics infrastructure in Japan and take an in-depth look at the central issues of product development in order to identify those parameters that will determine future directions for electronic packaging technologies.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: JTEC Panel Report on Electronic Manufacturing and Packaging in Japan; p 1-20
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  • 8
    Publication Date: 2006-02-14
    Description: Characterization tests were carried out at three charge levels and four discharge levels. The "c' or capacity of the battery is designated at 6.5 ampere-hours. The recharge ampere-hours was the same for all test conditions, 6.5 A-H, regardless of the discharge capacity removed for any particular discharge rate. Less capacity can be removed at higher discharge rates to the same termination voltage, which was 0.50 volts for the weakest (lowest voltage) cell. The general trend of efficiencies increases as the charge rate increases as noted in results of the table included in the handout package. The data also indicate the efficiency increases as the discharge rate decreases. This is true; however, efficiencies at the discharge rates of c and 2c are penalized because these cycles received more overcharge than necessary.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 496-500
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  • 9
    Publication Date: 2006-02-14
    Description: The probability of Ni-Cd battery survival was determined by researching survival data on cells fabricated from 1964-1977. A log of cell failure times were plotted against cumulative failure percentage and mean and standard deviation were determined.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 470-479
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  • 10
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    In:  CASI
    Publication Date: 2006-02-14
    Description: The design of long life, low weight nickel cadmium cells is studied. The status of a program to optimize nickel electrodes for the best performance is discussed. The pore size of the plaque, the mechanical strength and active material loading are considered in depth.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 253-469
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  • 11
    Publication Date: 2006-02-14
    Description: An evaluation of the current nickel hydrogen cell design is presented. The IPV, or the Individual Pressure Vessel, is the state of the art right now. The present design, 3 1/2 inch cell, has a current limit of 50 ampere-hours. The nickel hydrogen cell design is the state of the art. Its size is 3 1/2 inches which limits it to 50 hours. The probable limits of that are probably 160 amphere IPV cell remaining in the passive cooling mode. The IPV stacks is a parallel connection of electrodes. Positive electrodes are connected with leads to the top portion of the stack and negative electrodes are connected with leads and pulled down to the bottom. So it is a combination connection of paralleling series electrostacking--parallel inside each individual stack, and series connected from one stack to the next. It offers, in the analysis, improvements in packaging, cost, energy density, and specific energy.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 480-495
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  • 12
    Publication Date: 2006-02-14
    Description: Nickel Hydrogen cell and battery technology has matured to the point where a real choice exists between Nickel Hydrogen and Nickel Cadmium batteries for each new spacecraft application. During the past few years, a number of spacecraft programs have been evaluated at Hughes with respect to this choice, with the results being split about fifty-fifty. The following paragraphs contain criteria which were used in making the battery selection.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 430-438
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  • 13
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    In:  CASI
    Publication Date: 2006-02-14
    Description: The Defense Research Establishment Ottawa (DREO) has been studying the nickel-cadmium system, both vented and sealed, since the early 1950's. Reasonable success has been achieved in a wide variety of applications covering: military vehicle use under Arctic conditions; high performance military aircraft; manpacked communications sets; remote standby power and small portable instrumentation. Early studies on the vented system for high rate vehicle and aircraft cranking applications proved useful in later studies on the sealed NiCd system. This was especially true in the areas of plate loading and electrolyte composition. To achieve high rate cranking currents of 20C to 30C, it was necessary to have light to moderate plate loadings, a large reactive surface area, and electrolyte of optimum conductivity. DREO undertook some fundamental studies to understand the system from the inside out rather than test cells from the outside and then analyze their components. The conclusions of these studies were incorporated into the Procurement Specification for Ni-Cd cells ISISA Spec S615-P-2. A brief comment will be made on the choice of cell design and how some of the factors of cell manufacture could affect cell performance.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 439-451
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  • 14
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    In:  CASI
    Publication Date: 2006-02-14
    Description: Events from the development and orbital flight experience with a nickel hydrogen battery are described. The events highlight characteristics of nickel hydrogen which afford superior capability in overcharge, overdischarge and state of charge evaluation, when compared to the nickel cadmium electrochemical system. Some developments in nickel hydrogen technology that provide the potential of furthering nickel hydrogen superiority for satellite applications are also discussed.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 416-429
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  • 15
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    In:  CASI
    Publication Date: 2006-02-14
    Description: Ni-H2 batteries are just now being put into service. All of the remaining INTELSAT V satellites (approximately 10), starting with the next to be launched in early 1983, will use Ni-H2 batteries. In addition, the next generation of INTELSAT VI satellites, and probably INTELSAT VII and VIII, will use Ni-H2 batteries. This means that international telecommunications satellites will use Ni-H2 batteries through the 1990's. It is projected that the lifetime of these batteries will be greater than 10 years at deep depth-of-discharge (DOD), and that the battery subsystem will no longer limit satellite lifetime or communications capability during eclipse periods. This paper discusses the advantages of the Ni-H2 battery, as compared with the Ni-Cd battery, for telecommunications satellites.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 389-415
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  • 16
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    In:  CASI
    Publication Date: 2006-02-14
    Description: Nickel-hydrogen cells appear to be an improvement over the nickel-cadmium in applications requiring longer lifetime and reduced weight. An even more efficient couple, the silver-hydrogen couple, is also considered. After a theoretical study first performed by the Battelle Institute of Geneva under ESA (European Space Agency) contract, SAFT has undertaken more detailed analyses of the silver-hydrogen degradation mechanisms. ESA and the French Department of Defense contracted with SAFT for a full-development program of the silver-hydrogen technology.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 347-371
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  • 17
    Publication Date: 2006-02-14
    Description: This effects of reconditioning on the performance of NiCd batteries are reviewed. These effects are correlated with cell experiments and individual electrode investigations. The effects of reconditioning on the positive electrode performance are found to be significant. A mechanism is proposed that rationalizes the operation of the nickel electrode and suggests that reconditioning minimizes depth of discharge stress during use and maintains uniformity of the active material.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 324-345
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  • 18
    Publication Date: 2006-02-14
    Description: Cost considerations for spacecraft battery reconditioning are studied. Results indicate that the cost of performing reconditioning is minuscule compared with spacecraft system investment. Results also indicate that spacecraft life extension of a few days justifies incorporation of reconditioning circuitry.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 303-310
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  • 19
    Publication Date: 2006-02-14
    Description: Six (6) geostationary spacecraft, manufactured by RCA Astro, are presently operating in orbit. All of their batteries are performing well. They all contain unique battery reconditioning circuitry, permitting individual cell reconditioning to practically zero volts without the danger of cell reversal. This reconditioning is performed just prior to start of each eclipse season. This technique has maintained the battery's end-of-discharge voltage with mission life. The oldest operating RCA Astro geostationary spacecraft, Satcom F1 and F2, have now completed almost 7 and 6-3/4 years in orbit, respectively. Their battery performance, reported herein, show that a major milestone in the mission longevity of nickel-cadmium batteries has heen achieved. Low earth orbit test data show a long lasting effect of maintaining end-of-discharge voltages for nickel cadmium cells using periodic reconditioning. The unique RCA light-weight reconditioning circuitry can accomplish a quick reconditioning and prevent cell reversal. Reconditioning, thus, has the potential for extending mission life of geostationary as well as low earth orbit spacecraft, when two or more batteries are present.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 311-323
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  • 20
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    In:  CASI
    Publication Date: 2006-02-14
    Description: Deep-discharge reconditioning (DDR) can be of great benefit to battery performance, especially in geosynchronous orbit, if performed properly and regularly, and can be essential to operation of batteries at the high depths of discharge (DOD) required to minimize weight. The procedure should be tailored to fit the nature of the degradation occuring during regular cycling. DDR is not without its drawbacks, however, and these differ depending on the normal DOD to be sustained and/or whether the discharge is done at the battery or the cell level. Battery-level discharge carries the minimum weight penalty but raises questions of the effects of low-rate cell reversal that as yet have no firm answers. Cell level discharge avoids cell reversal but carries significant penalties of weight and complexity. Thus no universal procedure or method of implementation of deep-discharge reconditioning is now available and thus the various approaches must be evaluated for each application.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 297-302
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  • 21
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    In:  CASI
    Publication Date: 2006-02-14
    Description: It is argued that sophisticated battery control systems are required to support the high power, high energy spacecraft secondary battery systems of the post 1985 time period. Four categories of battery control system functions are defined and discussed: battery operational control, auxiliary system control, battery system status indication and fault detection fault isolation. A concept for implementation of such a control system is also presented and discussed.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 270-279
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  • 22
    Publication Date: 2006-02-14
    Description: A comparison of voltage limited control methods limit control methods for fixed array and oriented array missions is given. The LANDSAT D, Earth Radiation Budget Experiment and Solar maximum Mission techniques are compared.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: The 1982 Goddard Space Flight Center Battery Workshop; p 231-258
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  • 23
    Publication Date: 2006-02-14
    Description: Battery charge control for orbiting spacecraft with mission durations from three to ten years, is a critical design feature that is discussed. Starting in 1974, the General Electric Space Systems Division designed, manufactured and tested battery systems for six different space programs. Three of these are geosynchronous missions, two are medium altitude missions and one is a near-earth mission. All six power subsystems contain nickel cadmium batteries which are charged using a temperature compensated voltage limit. This charging method was found to be successful in extending the life of nickel cadmium batteries in all three types of earth orbits. Test data and flight data are presented for each type of orbit.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 259-269
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  • 24
    Publication Date: 2006-02-14
    Description: A simple non-linear circuit model for battery behavior is given. It is based on time-dependent features of the well-known PIN change storage diode, whose behavior is described by equations similar to those associated with electrochemical cells. The circuit simulation computer program ADVICE was used to predict non-linear response from a topological description of the battery analog built from advice components. By a reasonable choice of one set of parameters, the circuit accurately simulates a wide spectrum of measured non-linear battery responses to within a few millivolts.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 201-215
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  • 25
    Publication Date: 2006-02-14
    Description: A generalized code applicable to many different electrochemical systems and geometric designs is discussed. The code is to be set up so that physical property data such as thermal conductivity, viscosity, density, and configuration (e.g. physical dimensions) are the input data. Thus, by changing these parameters many different battery configurations can be handled. The outputs, as a function of time and space, are voltage, current, temperature, pressure, velocity, and species concentration.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 178-199
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  • 26
    Publication Date: 2006-02-14
    Description: Previous work is refined and extended to describe the discharge curve of Ni-Cd cells. Several models are discussed which are based on chronopotentiometry theory and on a thermodynamic approach. Emphasis is placed on improvement of the fit for the initial portion of discharge. Equations are presented which improve the fit for all regions of the discharge curve.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 164-177
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  • 27
    Publication Date: 2006-02-14
    Description: A model to simulate nickel-cadmium battery performance and response in a spacecraft electrical power system energy balance calculation was developed. The voltage of the battery is given as a function of temperature, operating depth-of-charge (DOD), and battery state-of-charge. Also accounted for is charge inefficiency. A battery is modeled by analysis of the results of a multiparameter battery cycling test at various temperatures and DOD's.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 117-124
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  • 28
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    In:  CASI
    Publication Date: 2006-02-14
    Description: Using the accelerating rate calorimeter, the hazards associated with exothermic reactions occurring in Li/SO2 cells under the conditions of discharge, forced overdischarge, resistive overdischarge, and forced overdischarge at low tempratures are quantitatively defined in terms of: rate of pressure generation, overall pressure rise, rate of temperature, and overall heat generation. Consistent with the findings of other investigators, it is believed that the major reactions contributing to Li/SO2 cell exothermicity are: the lithium/acetonitrile reaction, the thermal decomposition of lithium dithionite, and the lithium/sulfur reaction.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 85-99
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  • 29
    Publication Date: 2006-02-14
    Description: Cell design criteria were established which can result in a safe lithium/thionyl chloride cell. A cell vent, a low area internal anode cell, cell balance and composition of the cathode-electrolyte solution were found to be important factors in the design of a safe cell. In addition to routine testing, both undischarged and discharged cells were subjected to electrical abuse, environmental abuse and mechanical abuse without disassembly.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 75-84
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  • 30
    Publication Date: 2006-02-14
    Description: The roll of general cell design characteristics in preventing hazardous reactions during voltage reversal of lithium cells is discussed. Anode limited versus cathode limited design and case positive versus case negative design are addressed.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 67-74
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  • 31
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    In:  CASI
    Publication Date: 2006-02-14
    Description: The ovedischarge test program and results for double A and D lithium cells are discussed. Temperature increases and sparking responses are dressed.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 60-63
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  • 32
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    In:  CASI
    Publication Date: 2006-02-14
    Description: Lithium cell performance at extremely low temperatures was tested and materials which could be used to make a cell completely electro-chemically inert for the purpose of deactivation were investigated. The effects of temperature and current density on polarization and performance loss are discussed along with discharge recovery behavior.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 64-66
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  • 33
    Publication Date: 2006-02-14
    Description: Lithium batteries offer many advantages for Navy systems but may also exhibit undesirable hazardous behavior. Safety problems have been traced to a variety of chemical and physical causes. The Navy has established a central safety office with responsibility for all lithium battery use. Before an item is approved for Navy use, it must pass both a design review and a set of end item tests. These reviews focus on complete systems which include a battery inside the end item. After system approval, specific regulations govern the transportation, storage, and disposal of the unit containing lithium batteries. Each of these areas is discussed in detail.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 23-34
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  • 34
    Publication Date: 2006-02-14
    Description: The unique power requirement of NASA's Galileo Jupiter Probe are most readily met by a Li/SO2 battery; however, because this battery system is not space flight proven, extensive effort was required to qualify this device from the stand point of performance and safety. Due to the rather checkered safety record of the Li/SO2 system, safety has been foremost among the design considerations and has been addressed at the cell, battery and system level. The mission requirements which led to the choice of the Li/SO2 battery and the safety engineering which went into the battery and power system design are described.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 15-22
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  • 35
    Publication Date: 2006-02-14
    Description: Results of an experiment investigating overdischarge behavior of two types of Li/SO2 cells are presented. Forced overdischarges of the Li/LiBr, CH3CN/SO2 cell can result in unsafe behavior such as venting with fire and release of toxic gases. The hazards may be minimized or eliminated by careful cell design considerations and practice of high standards of quality contol in cell manufacture. Seemingly safe cells at 25 C when forced overdischarged at -25 C, even at low currents, exhibited incipient signs of hazards. Their cathodes indicated signs of shock sensitivity. Cathode limited Li/SOCl2 cells were safe during forced overdischarge for long periods of time. Lithium limited Li/SOCl2 cells in which practically all Li had been used up before cell reversal did not exhibit hazardous behavior. Anode limited Li/SOCl2 cells, but not Li limited, exhibited detonations, all during overdischarges at relatively low current densities of or = 1 mA/sq cm 2. Anode potentials 4v with large oscillations preceeded the events. The events were confined to the anode and the temperature rose high enough to melt Ni grids.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 47-59
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  • 36
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    In:  CASI
    Publication Date: 2006-02-14
    Description: In order to determine whether larger size lithium batteries would be commercially marketable, the performance of several D size lithium batteries was compared with that of an equivalent alkaline manganese battery, and the relative costs of the different systems were compared. It is concluded that opportunities exist in the consumer market for the larger sizes of the low rate and moderate rate lithium batteries, and that the high rate lithium batteries need further improvements before they can be recommended for consumer applications.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 35-45
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  • 37
    Publication Date: 2006-02-14
    Description: Case histories were described of hazardous behavior for three different cell sizes ranging in nominal capacity from 300 mAh to 12,000 Ah. Design characteristics and other facts believed to have been responsible for the cell explosions, are presented. Obvious facts are discussed as causes for hazardous behavior of lithium batteries in general and oxyhalide batteries in particular.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 3-14
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  • 38
    Publication Date: 2006-02-14
    Description: The 587B series of protectors are unique, low clamping voltage transient suppressors to protect ac-powered equipment from the 6000V peak open-circuit voltage and 3000A short circuit current as defined in IEEE standard 587 for Category B transients. The devices, which incorporate multiple-stage solid-state protector components, were specifically designed to operate under multiple exposures to maximum threat levels in this severe environment. The output voltage peaks are limited to 350V under maximum threat conditions for a 120V ac power line, thus providing adequate protection to vulnerable electronic equipment. The principle of operation and test performance data is discussed.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Langley Research Center Intern. Aerospace and Ground Conf. on Lightning and Static Elec.; 5 p
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  • 39
    Publication Date: 2006-02-14
    Description: The feasibility study of detection of lightning discharges from a geosynchronous satellite requires adequate ground-based information regarding emission characteristics. In this investigation, a measurement system for collection of S-band emission data is set up and calibrated, and the operations procedures for rapid data collection during a storm activity developed. The system collects emission data in two modes; a digitized, high-resolution, short duration record stored in solid-state memory, and a continuous long-duration record on magnetic tape. Representative lightning flash data are shown. Preliminary results indicate appreciable RF emissions at 2 gHz from both the leader and return strokes portions of the cloud-to-ground discharge with strong peaks associated with the return strokes.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Alabama Univ. in Huntsville The 1981 NASA(ASEE Summer Fac. Fellowship Program; 20 p
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  • 40
    Publication Date: 2006-01-16
    Description: The utilization of rotary transformers as an alternative to slip rings for the power transfer from solar panels to a satellite's main body could be advantageous, especially if an ac bus system is taken into consideration. Different approaches with main emphasis on the electromagnetic design were investigated and showed efficiencies of up to 99% with a 3 kW power capability. A solidly preloaded pair of ball bearings with ceramic balls assures proper transformer air gaps and acceptable torque changes over temperature and temperature gradients. The bearing and power transfer assembly is driven by a direct drive stepper motor with inherent redundancy properties and needs no caging mechanism.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Marshall Space Flight Center The 15th Aerospace Mech. Symp.; p 189-203
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  • 41
    Publication Date: 2006-02-14
    Description: The development of a superconducting connector for superconducting circuits on space flights is described. It is proposed that such connectors be used between the superconducting readout loop and the SQUID magnetometer in the Gravity Probe B experiment. Two types of connectors were developed. One type employs gold plated niobium wires making pressure connections to gold plated niobium pads. Lead-plated beryllium-copper spring contacts can replace the niobium wires. The other type is a rigid solder or weld connection between the niobium wires and the niobium pads. A description of the methods used to produce these connectors is given and their performance analyzed.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Alabama Univ. in Huntsville The 1981 NASA(ASEE Summer Fac. Fellowship Program; 10 p
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  • 42
    Publication Date: 2006-10-01
    Description: A number of 12 ampere-hour cells, nickel cadmium, were cycled under various conditions of temperature and depth of discharge. Using this data, it was confirmed that a five parameter fit equation could be used to model the data within a few millivolts. Both charge and discharge curves can be fit with accuracies in the range of one or two millivolts. The fit coefficients when plotted versus cycles show definite trends and patterns which can be used in an operational sense to predict battery voltage as a function of temperature and depth of discharge.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1982 Goddard Space Flight Center Battery Workshop; p 125-163
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  • 43
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    Publication Date: 2011-08-19
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA Technol. Appl. Team; p 37
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  • 44
    Publication Date: 2011-08-18
    Description: In this paper, the linearized relativistic Vlasov equation is solved and a dispersion relation is calculated for the interaction between a relativistic electron beam and the electromagnetic fields of a rectangular waveguide supporting TE(mn) modes. The dispersion relation is simplified to the special case of a frame of reference moving with the electrons and the resulting coupling coefficient epsilon(mn)super l is calculated for various TE(mn) modes. The dependence of epsilon(mn)super l on the parity of the harmonic number l and various mn modes of the waveguide are discussed.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Electron Devices (ISSN 0018-9383); ED-31; 1212-121
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  • 45
    Publication Date: 2011-08-18
    Description: Double-drift GaAs IMPATT diodes were designed for V-band frequency operations and fabricated using molecular-beam epitaxy. The diodes were fabricated in two configurations: (1) circular mesa diodes with silver-plated (integrated) heat sinks: (2) pill-type diodes bonded to diamond heat sinks. Both configurations utilized a miniature quartz-ring package. Output power greater than 1 W CW was achieved at V-band frequencies from diodes on diamond heat sinks. The best conversion efficiency was 13.3 percent at 55.5 GHz with 1 W output power.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Electronics Letters (ISSN 0013-5194); 20; 212-214
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  • 46
    Publication Date: 2011-08-18
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 47
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    Publication Date: 2011-08-18
    Description: There has been a continuing evolution toward larger arrays of infrared detectors, and the technology base derived from the Galileo Near Infrared Mapping Spectrometer (NIMS) has been expanded to linear arrays including from 128 to 512 elements. This advance is based on the commercial availability of high-quality InSb photodiodes and 128/256 element FET switch MUX's (multiplexing elements). The present investigation is concerned with an experimental 128-element linear imager using InSb detectors and silicon MUX for readout. Attention is given to detector array electrical characteristics, the detector readout architecture, noise, and special effects.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 48
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    Publication Date: 2011-08-18
    Description: State-of-the-art performance is demonstrated with solid-state amplifiers in K-band. The amplifier provides 8.2 watts of power with 39 dB gain over a frequency band of 1.4 GHz. Nonlinearity analyses of solid-state amplifiers suggest that system performance can be improved significantly by using an FET amplifier. Preliminary investigations reveal that the solid-state amplifiers can be space-qualified and can be expected to replace the TWTA in many communication links in the near future. It is pointed out that with improvements in device technology, the power, bandwidth and efficiency of solid-state amplifiers using FETs can be further improved. With FETs operating at a junction temperature of less than 125 C, solid-state amplifiers are inherently reliable, indicating a ten-year mean time to failure.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Microwave Journal (ISSN 0026-2897); 27; 115
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  • 49
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    Publication Date: 2011-08-18
    Description: The results of work done on the quantitative characterization of single-event upset (SEU) in bipolar random-access memories (RAMs) have been obtained through computer simulation of SEU in RAM cells that contain circuit models for bipolar transistors. The models include current generators that emulate the charge collected from ion tracks. The computer simulation results are compared with test data obtained from a RAM in a bipolar microprocessor chip. This methodology is applicable to other bipolar integrated circuit constructions in addition to RAM cells.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Nuclear Science (ISSN 0018-9499); NS-30; 4540-454
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  • 50
    Publication Date: 2011-08-18
    Description: This paper reports on a study of damage equivalence in rad-hard MOS devices with 100,000 rads (SiO2) capability. Damage sensitivities for electrons of 1, 2, 3, 5, and 7 MeV, protons of 1, 3, 7, 22, and 40 MeV, 3.4-MeV alphas, and Co-60 gammas were measured and compared. Results indicated that qualitatively the same charge recombination effects occurred in hard oxide devices for doses of 100,000 rads (SiO2) as in soft oxide parts for doses of 1 to 4 krads (SiO2). Consequently, damage equivalency or non-equivalency depended on radiation type and energy. However, recovery effects, both during and after irradiation, controlled relative damage sensitivity and its dependency on total dose, dose rate, supply bias, gate bias, radiation type, and energy. Correction factors can be derived from these data or from similar tests of other hard oxide type, so as to properly evaluate the combined effects of the total space environment.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Nuclear Science (ISSN 0018-9499); NS-30; 4363-436
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  • 51
    Publication Date: 2011-08-19
    Description: The accuracy of high-speed wafer-level measurements on digital IC's is limited by the probe interface. This limitation strongly encourages the use of built-in on-chip test hardware to reduce the number of critical off-chip high-speed interfaces. A novel synchronous propagation delay test structure is described which will provide accurate parametric data under typical automatic test conditions. Built-in test features added to complex combinational circuits are shown which are useful for delay measurement and which reduce the total number of high-speed I/O connections while still providing acceptable fault coverage in many cases.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Electron Devices (ISSN 0018-9383); ED-31; 1072-107
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  • 52
    Publication Date: 2011-08-19
    Description: Basic theoretical and experimental characteristics of a novel 'Thin-MOS' technology, which has promising aspects for integrated high-frequency devices up to several hundred gigahertz are presented. The operation of such devices depends on charge injection into undoped silicon layers of about 1000-A thickness, grown by molecular beam epitaxy on heavily doped substrates, and isolation by thermally grown oxides of about 100-A thickness. Capacitance-voltage characteristics measured at high and low frequencies agree well with theoretical ones derived from uni and ambipolar space-charge models. It is concluded that after oxidation the residual doping in the epilayer is less than approximately 10 to the 16th/cu cm and rises by 3 orders of magnitude at the substrate interface within less than 100 A and that interface states at the oxide interface can be kept low.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Solid-State Electronics (ISSN 0038-1101); 27; 867-880
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  • 53
    Publication Date: 2011-08-18
    Description: The electron emitting capabilities of Spindt-type field emitting cathodes (FEC) are being studied at the Lewis Research Center, NASA. These cathodes, having 5000 emitting points in a 1 mm diameter, have been shown to be capable of emission current densities of 10 A/sq cm and higher. The purposes of this study are to (1) demonstrate that the cathodes can be processed and used in a tube-type configuration, (2) determine whether, at a sufficiently high current density, the cathode can operate in the space charge mode, and (3) evaluate failure mechanisms in this unique type of electron emitter. FEC's have been tested in a diode configuration, by the use of pulse techniques, up to current densities of 6 A/sq cm and anode potentials of 3000 V. Space charge effects have been observed in the range of 5 A/sq cm as an apparent linear increase of cathode current with anode voltage for a constant emitter-gate potential. Failed cathodes were studied by means of scanning electron microscopy and the major failure modes encountered are attributed to gas evolution, followed by arcing, which destroys either individual emitters or a large segment of the cathode area.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Applications of Surface Science (ISSN 0378-5963); 16; 277-291
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  • 54
    Publication Date: 2011-08-18
    Description: A fault model and a system model are necessary to assess the tolerance or resilience of a digital system to lightning-induced transients. It is noted that these models are usually developed separately. A new approach is outlined here for this assessment problem which combines the fault and system models into an overall model. With this approach, referred to as the containment set approach, an assessment of the effects of lightning-induced transients can be made in terms of a state transition matrix. This matrix can be generated by means of fault injection experiments. In addition, certain nonredundancy-oriented design alternatives to the achievement of lightning-induced transient tolerance in digital systems are indicated by the containment set approach.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 55
    Publication Date: 2011-08-18
    Description: A new concept of using a tapped output-filter inductor and an auxiliary commutating diode to reduce the likelihood of transformer core saturation in a push-pull, voltage-fed converter is presented. The linearized circuit model and transfer functions are derived with a hybrid approach using both state-space and circuit averaging. Operation of the new converter - including parasitic effects - is discussed, and a design equation for inductor tap ratio is established. It is predicted and experimentally confirmed that the new converter has more symmetrical transformer core operation, and the potential exits for lower transistor turnon current and reduced transistor voltage stress. These benefits reduce switching loss and enhance transistor reliability.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 56
    Publication Date: 2011-08-18
    Description: A 110-118-GHz receiver based on a superconducting quasiparticle tunnel junction mixer is described. The single-sideband noise temperature is as low as 68 + or - 3 K. This is nearly twice the sensitivity of any other receiver at this frequency. The receiver was designed using a low-frequency scale model in conjunction with the quantum mixer theory. A scaled version of the receiver for operation at 46 GHz has a single-sideband noise temperature of 55 K. The factors leading to the success of this design are discussed.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Applied Physics Letters (ISSN 0003-6951); 43; 786-788
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  • 57
    Publication Date: 2011-08-19
    Description: Two methods are described to obtain the value of the series resistance (R) of a Schottky diode from its forward I-V characteristic. The value of R is then used to plot the curve ln(I) versus V sub D (= V - IR) which becomes a straight line even if ln(I) versus V does not. The ideality factor n and the Schottky-barrier height of the diode then follow from the standard procedure. The main advantages of the methods are: (1) a linear regression can be used to calculate the value of R; (2) many data points are used over the whole data range, which raises the accuracy of the results, and (3) the validity of constant R assumption can be checked by the linearity of the ln (I) versus V sub D curve. The methods are illustrated on the experimental data of a real diode.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Electron Devices (ISSN 0018-9383); ED-31; 1502
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  • 58
    Publication Date: 2011-08-19
    Description: Enhanced electron trapping has been observed in n-channels of rad-hard CMOS devices due to electron and gamma-ray irradiation. Room-temperature annealing results in a positive shift in the threshold potential far beyond its initial value. The slope of the annealing curve immediately after irradiation was found to depend strongly on the gate bias applied during irradiation. Some dependence was also observed on the electron dose rate. No clear dependence on energy and shielding over a delidded device was observed. The threshold shift is probably due to electron trapping at the radiation-induced interface states and tunneling of electrons through the oxide-silicon energy barrier to fill the radiation-induced electron traps. A mathematical analysis, based on two parallel annealing kinetics, hole annealing and electron trapping, is applied to the data for various electron dose rates.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Nuclear Science (ISSN 0018-9499); NS-31; 1492-149
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  • 59
    Publication Date: 2011-08-19
    Description: The ionizing radiation responses of metal oxide semiconductor (MOS) field-effect transistors (FETs) and MOS capacitors are compared. It is shown that the radiation-induced threshold voltage shift correlates closely with the shift in the MOS capacitor inversion voltage. The radiation-induced interface-state density of the MOSFETs and MOS capacitors was determined by several techniques. It is shown that the presence of 'slow' states can interfere with the interface-state measurements.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Nuclear Science (ISSN 0018-9499); NS-31; 1461-146
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  • 60
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    Publication Date: 2011-08-19
    Description: Three read/write random access memories, AM91L24, HM1-6514, and MWS 5114, were subjected to total dose irradiation at three dose rates, with electrical testing after each increment of dosage. Annealing measurements were performed after the radiation tests were completed. The AM91L24 showed a strong dose rate effect and substantial post-irradiation annealing of radiation-induced damage. The dose rate effect was that a lower dose rate produced less net damage than an eqivalent total dose applied at a higher rate. The HM1-6514 showed essentially no dose rate effect and no annealing damage, and the MWS 5114 exhibited a moderate effect with some annealing. It was concluded that dose rate is an important parameter in radiation test procedures for MOS microcircuits and that annealing measurements may be important evaluation aids for such tests.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Nuclear Science (ISSN 0018-9499); NS-31; 1348-135
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  • 61
    Publication Date: 2011-08-19
    Description: This paper examines bipolar junction transistor models suitable for calculating the effects of large excursions of some of the variables determining the operation of a transistor. Both the Ebers-Moll and Gummel-Poon models are studied, and the junction and diffusion capacitances are evaluated on the basis of the latter model. The most interesting result of this analysis is that a bipolar junction transistor when struck by a cosmic particle may cause a single event upset in an electronic circuit if the transistor is operated at a low forward base-emitter bias.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Journal of Applied Physics (ISSN 0021-8979); 56; 2964-297
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  • 62
    Publication Date: 2011-08-19
    Description: A magnetically-collimated, double-pulsed electron gun capable of generating electron pulses with a peak instantaneous current of approximately 70 microamps and a temporal width of 0.35 ns (FWHM) has been developed. Calibration is accomplished by measuring the lifetime of the well known 2(1P)-to-1(1S) transition in helium (58.4nm) at a near-threshold electron-impact energy by use of the delayed-coincidence technique.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Journal of Physics E - Scientific Instruments (ISSN 0022-3735); 17; 1008-101
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  • 63
    Publication Date: 2013-08-31
    Description: For monolithic high-T(sub c) superconductors (HTSC's) calculations are presented of: (1) the initial flux jump field, H(sub fj), in melt-processed YBCO based on a field and temperature dependent J(sub c), and (2) the radial and circumferential stresses in solid and hollow cylinders containing trapped magnetic flux. For model multi filamentary (MF) HTSC/Ag strands calculations are presented of: (1) the limiting filament diameters for adiabatic and dynamic stability, and (2) the hysteretic and eddy current components of AC loss. Again for MF HTSC/Ag composite strands the need for filamentary subdivision and twisting is discussed.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Johnson Space Center, Proceedings of the 4th International Conference and Exhibition: World Congress on Superconductivity, Volume 1; p 138-14
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  • 64
    Publication Date: 2013-08-31
    Description: One of the prospective, practical applications of high-temperature superconductors is the fault-current limitation in electrical energy networks. The development and testing of experimental HTSC serial current limiters have been reported in the literature. A Hungarian electric power company has proposed the development of a parallel equipment for arc suppressing both in the industrial and customers' networks. On the basis of the company's proposal the authors have outlined the scheme of a compound circuit that can be applied both for current limitation and arc suppressing. In this paper the design principles and methods of the shunt equipment are presented. These principles involve the electrical, mechanical and cryogenic aspects with the special view on the electrical and mechanical connection between the HTSC material and the current lead. Preliminary experiments and tests have been carried out to demonstrate the validity of the design principles developed. The results of the experiments and of the technological investigations are presented.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Johnson Space Center, Proceedings of the 4th International Conference and Exhibition: World Congress on Superconductivity, Volume 1; p 126-13
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  • 65
    Publication Date: 2013-08-31
    Description: This talk presents the latest stage in formal development of a fault-tolerant clock synchronization circuit. The development spans from a high level specification of the required properties to a circuit realizing the core function of the system. An abstract description of an algorithm has been verified to satisfy the high-level properties using the mechanical verification system EHDM. This abstract description is recast as a behavioral specification input to the Digital Design Derivation system (DDD) developed at Indiana University. DDD provides a formal design algebra for developing correct digital hardware. Using DDD as the principle design environment, a core circuit implementing the clock synchronization algorithm was developed. The design process consisted of standard DDD transformations augmented with an ad hoc refinement justified using the Prototype Verification System (PVS) from SRI International. Subsequent to the above development, Wilfredo Torres-Pomales discovered an area-efficient realization of the same function. Establishing correctness of this optimization requires reasoning in arithmetic, so a general verification is outside the domain of both DDD transformations and model-checking techniques. DDD represents digital hardware by systems of mutually recursive stream equations. A collection of PVS theories was developed to aid in reasoning about DDD-style streams. These theories include a combinator for defining streams that satisfy stream equations, and a means for proving stream equivalence by exhibiting a stream bisimulation. DDD was used to isolate the sub-system involved in Torres-Pomales' optimization. The equivalence between the original design and the optimized verified was verified in PVS by exhibiting a suitable bisimulation. The verification depended upon type constraints on the input streams and made extensive use of the PVS type system. The dependent types in PVS provided a useful mechanism for defining an appropriate bisimulation.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Third NASA Langley Formal Methods Workshop; p 225-231
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  • 66
    Publication Date: 2013-08-31
    Description: High strength light weight metal clad aramid fibers can provide significant weight savings when used to replace conventional metal wire in aerospace cable. An overview of metal clad aramid fiber materials and information on performance and use in braided electrical shielding and signal conductors is provided.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Lewis Research Center, Third NASA Workshop on Wiring for Space Applications; p 197-210
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  • 67
    Publication Date: 2013-08-31
    Description: The objective of this program is to identify, develop, and demonstrate an optimum wire insulation system capable of continuous operation at 300 C which possesses a combination of superior electrical (AC or DC), mechanical, and physical properties over Kapton derived insulations described in MIL-W-81381 and those hybrid materials commonly known as TKT constructions.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Lewis Research Center, Third NASA Workshop on Wiring for Space Applications; p 187-196
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  • 68
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    Publication Date: 2013-08-31
    Description: This document outlines arc tracking signals -- both the data acquisition and signal processing. The objective is to obtain the salient features of the arc tracking phenomenon. As part of the signal processing, the power spectral density is obtained and used in a MATLAB program.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Lewis Research Center, Third NASA Workshop on Wiring for Space Applications; p 159-167
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  • 69
    Publication Date: 2013-08-31
    Description: Several wire insulation constructions were evaluated with and without continuous glow discharges at low pressure and high temperature to determine the aging characteristics of acceptable wire insulation constructions. It was known at the beginning of the test program that insulation aging takes several years when operated at normal ambient temperature and pressure of 20 C and 760 torr. Likewise, it was known that the accelerated aging process decreases insulation life by approximately 50% for each 10 C temperature rise. Therefore, the first phases of the program, not reported in these test results, were to select wire insulation constructions that could operate at high temperature and low pressure for over 10,000 hours with negligible shrinkage and little materials' deterioration.The final phase of the program was to determine accelerated aging characteristics. When an insulation construction is subjected to partial discharges the insulation is locally heated by the bombardment of the discharges, the insulation is also subjected to ozone and other deteriorating gas particles that may significantly increase the aging process. Several insulation systems using either a single material or combinations of teflon, kapton, and glass insulation constructions were tested. All constructions were rated to be partial discharge and/or corona-free at 240 volts, 400 Hz and 260 C (500 F) for 50, 000 hours at altitudes equivalent to the Paschen law. Minimum partial discharge aging tests were preceded by screening tests lasting 20 hours at 260 C. The aging process was accelerated by subjecting the test articles to temperatures up to 370 C (700 F) with and without partial discharges. After one month operation with continuous glow discharges surrounding the test articles, most insulation systems were either destroyed or became brittle, cracked, and unsafe for use. Time with space radiation as with partial discharges is accumulative.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Lewis Research Center, Third NASA Workshop on Wiring for Space Applications; p 169-185
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  • 70
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    In:  CASI
    Publication Date: 2013-08-31
    Description: The wet arc-propagation resistance test for wire insulation provides an assessment of the ability of an insulation to prevent damage in an electrical environment. Results of an arc-propagation test may vary slightly due to the method of arc initiation; therefore a standard test method must be selected to evaluate the general arc-propagation resistance characteristics of an insulation. This test method initiates an arc by dripping salt water over pre-damaged wires which creates a conductive path between the wires. The power supply, test current, circuit resistances, and other variables are optimized for testing 20 guage wires. The use of other wire sizes may require modifications to the test variables. The dry arc-propagation resistance test for wire insulation also provides an assessment of the ability of an insulation to prevent damage in an electrical arc environment. In service, electrical arcs may originate form a variety of factors including insulation deterioration, faulty installation, and chafing. Here too, a standard test method must be selected to evaluate the general arc-propagation resistance characteristics of an insulation. This test method initiates an arc with a vibrating blade. The test also evaluates the ability of the insulation to prevent further arc-propagation when the electrical arc is re-energized.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Lewis Research Center, Third NASA Workshop on Wiring for Space Applications; p 143-158
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  • 71
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    In:  CASI
    Publication Date: 2013-08-31
    Description: Tensolite, a custom cable manufacturer specializing in high temperature materials as the dielectric medium, develops an advance arc track resistant airframe wire called Tufflite 2000. Tufflite 2000 has the following advantages over the other traditional wires: lighter weight and smaller in diameter; excellent wet and dry arc track resistance; superior dynamic cut-through performance even at elevated temperatures; flight proven performance on Boeing 737 and 757 airplanes; and true 260 C performance by utilizing Nickel plated copper conductors. This paper reports the different tests performed on Tufflite 2000: accelerated aging, arc resistance (wet and dry), dynamic cut through, humidity resistance, wire-to-wire abrasion, flammability, smoke, weight, notch sensitivity, flexibility, and markability. It particularly focuses on the BSI (British Standards Institute) dry arc resistance test and BSI wet arc tracking.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Lewis Research Center, Third NASA Workshop on Wiring for Space Applications; p 129-141
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  • 72
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    In:  CASI
    Publication Date: 2013-08-31
    Description: The objective of this test is to examine the mechanical and electrical properties of PFPI insulation. Some of the parameters considered during the test are: AC corona (400 Hz), wire fusing time, abrasion resistance, dynamic cut through, notch propagation, and weight loss (outgassing). In addition the degradation of the samples caused by the immature manufacturing status of the PFPI materials for wiring is considered.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Lewis Research Center, Third NASA Workshop on Wiring for Space Applications; p 85-89
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  • 73
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    In:  CASI
    Publication Date: 2013-08-31
    Description: In this Naval Air Warfare Center (NAWC) Aircraft Division status report, the general and wire and cable component activities, the systems engineering activities, the aircraft wiring lead maintenance activities, the NAVAIR/NASA interface activities, and the Base Realignment and Closure (BRAC) Commission recommendations are presented.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Lewis Research Center, Third NASA Workshop on Wiring for Space Applications; p 49-54
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  • 74
    Publication Date: 2013-08-31
    Description: This viewgraph presentation provides an overview of activities at DASA-RI concerning the testing of wires for manned spacecraft, including test facilities, arc-tracking tests, flammability tests, microgravity tests, and standardization, and outlines future activities.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Lewis Research Center, Third NASA Workshop on Wiring for Space Applications; p 31-39
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  • 75
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    In:  CASI
    Publication Date: 2013-08-31
    Description: The program goal is to develop a computerized life prediction model capable of identifying present aging progress and predicting end of life for aircraft wiring. A summary is given in viewgraph format of progress made on phase 1 objectives, which were to identify critical aircraft wiring problems; relate most common failures identified to the wire mechanism causing the failure; assess wiring requirments, materials, and stress environment for fighter aircraft; and demonstrate the feasibility of a time-temperature-environment model.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Lewis Research Center, Third NASA Workshop on Wiring for Space Applications; p 27-30
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  • 76
    Publication Date: 2013-08-31
    Description: The advent of superconductivity above 77 K represents to the power cable industry a technological discontinuity analogous to that seen in the copper telecommunications industry by the arrival of optical fibers. This phenomenon is discussed along with technical criteria and performance targets needed for high temperature superconducting wire to have an economic impact in transmission cables.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Johnson Space Center, Proceedings of the 4th International Conference and Exhibition: World Congress on Superconductivity, Volume 2; p 650-66
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  • 77
    Publication Date: 2013-08-31
    Description: The integration of new energy technologies into electric power systems requires methods which recognize the full range of dynamic events in both the new generating unit and the power system. Since new energy technologies are initially perceived as small contributors to large systems, little attention is generally paid to system integration, i.e. dynamic events in the power system are ignored. As a result, most new energy sources are only capable of base-load operation, i.e. they have no load following or cycling capability. Wind turbines are no exception. Greater awareness of this implicit (and often unnecessary) limitation is needed. Analysis methods are recommended which include very low penetration (infinite bus) as well as very high penetration (stand-alone) scenarios.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: DASCON Engineering, Collected Papers on Wind Turbine Technology; p 153-156
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  • 78
    Publication Date: 2013-08-31
    Description: Interest in variable speed generating technology has accelerated as greater emphasis on overall efficiency and superior dynamic and control properties in wind-electric generating systems are sought. This paper reviews variable speed technology options providing advantages and disadvantages of each. Furthermore, the dynamic properties of variable speed systems are contrasted with synchronous operation. Finally, control properties of variable speed systems are examined.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: DASCON Engineering, Collected Papers on Wind Turbine Technology; p 185-190
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  • 79
    Publication Date: 2013-08-31
    Description: The findings of electrical short circuit and current overload tests performed on commercial aircraft wiring are presented. A series of bench-scale tests were conducted to evaluate circuit breaker response to overcurrent and to determine if the wire showed any visible signs of thermal degradation due to overcurrent. Three types of wire used in commercial aircraft were evaluated: MIL-W-22759/34 (150 C rated), MIL-W-81381/12 (200 C rated), and BMS 1360 (260 C rated). A second series of tests evaluated circuit breaker response to short circuits and ticking faults. These tests were also meant to determine if the three test wires behaved differently under these conditions and if a short circuit or ticking fault could start a fire. It is concluded that circuit breakers provided reliable overcurrent protection. Circuit breakers may not protect wire from ticking faults but can protect wire from direct shorts. These tests indicated that the appearance of a wire subjected to a current that totally degrades the insulation looks identical to a wire subjected to a fire; however the 'fire exposed' conductor was more brittle than the conductor degraded by overcurrent. Preliminary testing indicates that direct short circuits are not likely to start a fire. Preliminary testing indicated that direct short circuits do not erode insulation and conductor to the extent that ticking faults did. Circuit breakers may not safeguard against the ignition of flammable materials by ticking faults. The flammability of materials near ticking faults is far more important than the rating of the wire insulation material.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Lewis Research Center, Third NASA Workshop on Wiring for Space Applications; p 41-48
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  • 80
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    In:  CASI
    Publication Date: 2013-08-31
    Description: Hardware provider wire systems and current wire insulation issues for the International Space Station (ISS) program are discussed in this viewgraph presentation. Wire insulation issues include silicone wire contamination, Tefzel cold temperature flexibility, and Russian polyimide wire insulation. ISS is a complex program with hardware developed and managed by many countries and hundreds of contractors. Most of the obvious wire insulation issues are known by contractors and have been precluded by proper selection.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: In. NASA Lewis Research Center, Third NASA Workshop on Wiring for Space Applications; p 21-26
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  • 81
    Publication Date: 2013-08-31
    Description: An efficient implementation of the forward-backward least-mean-square (FBLMS) adaptive line enhancer is presented in this article. Without changing the characteristics of the FBLMS adaptive line enhancer, the proposed implementation technique reduces multiplications by 25% and additions by 12.5% in two successive time samples in comparison with those operations of direct implementation in both prediction and weight control. The proposed FBLMS architecture and algorithm can be applied to digital receivers for enhancing signal-to-noise ratio to allow fast carrier acquisition and tracking in both stationary and nonstationary environments.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: The Telecommunications and Data Acquisition Report; p 16-26
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  • 82
    Publication Date: 2013-08-31
    Description: The electrical system options for variable speed operation of a wind turbine generator are treated in this paper. The key operating characteristics of each system are discussed and the major advantages and disadvantages of each are identified
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: DASCON Engineering, Collected Papers on Wind Turbine Technology; p 191-197
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  • 83
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    In:  Other Sources
    Publication Date: 2011-08-18
    Description: The properties of bandpass filters for broadband photometry are reported in the 3-12/cm frequency range. The filters are based on a combination of capacitive grids deposited on thick Mylar substrates and are designed to have very high out-of-band rejection. Low frequencies are blocked by a thick grill that consists of a hexagonal grid of circular holes in a thick metal plate.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Applied Optics; 20; Apr. 15
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  • 84
    Publication Date: 2011-08-18
    Description: The conference covered the radiation effects on devices, circuits, and systems, physics and basic radiation effects in materials, dosimetry and radiation transport, spacecraft charging, and space radiation effects. Other subjects included single particle upset phenomena, systems-generated electromagnetic pulse phenomena, fabrication of hardened components, testing techniques, and hardness assurance.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 85
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    Publication Date: 2011-08-18
    Description: Approximate phase stability estimates for the coherent reference generator (CRG) unit in the DSN's Frequency and Timing Subsystem (FTS) are calculated. The method used involves estimating the phase noise introduced by CRG components based upon measurements made in the past on similar components in other parts of the FTS and obtaining the CRG phase noise from the component phase noises. Three estimates of phase stability are calculated: the fractional frequency change for a 5 C step in temperature, the phase noise spectral density, and the Allan standard deviation. It is found from these estimates that the CRG phase stability is better than that of the H-maser physics unit + receiver. Thus, the first step in improving FTS phase stability would be to make improvements in the H-maser physics unit + receiver. These results are corroborated by indirect clock stability estimates calculated from Doppler data.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: The Telecommun. and Data Acquisition Progr. Rept. 42-64; p 222-231
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  • 86
    Publication Date: 2011-08-18
    Description: High power (20 kW) S and X-band transmitting systems were added to the Second Generation Common Aperture X/S Feedcone System to demonstrate X and S band uplink/downlink capabilities. Design considerations of new X band components, cone layout, and capabilities are discussed.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: The Telecommun. and Data Acquisition Rept.; p 97-103
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  • 87
    Publication Date: 2011-08-18
    Description: For the transmission of imagery at high data rates over large distances with limited power and system gain, it is usually necessary to compress the data before transmitting it over a noisy channel that uses channel coding to reduce the effect of noise introduced errors. Both compression and channel noise introduce distortion into the imagery. In order to design a communication link that provides adequate quality of received images, it is necessary first to define some suitable distortion measure that accounts for both these kinds of distortion and then to perform various tradeoffs to arrive at system parameter values that will provide a sufficiently low level of received image distortion. The overall mean square error is used as the distortion measure and a description of how to perform these tradeoffs are included.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Telecommun. and Data Acquisition; p 63-72
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  • 88
    Publication Date: 2011-08-17
    Description: The paper presents a general theory for the determination of the short circuit current generated by a sinusoidally amplitude-modulated electron beam in the presence of recombination centers with an arbitrary number of charge states. It is shown that a measurement of the coherent phase shift with respect to the incident beam as a function of the modulation frequency of the beam ascertains the magnitudes of electron and hole capture cross sections. The surface exposed to the electron beam must have a negligible surface recombination velocity for the measurements to be unambiguous.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Journal of Applied Physics; 51; Aug. 198
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  • 89
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    Publication Date: 2011-08-17
    Description: NASA-Lewis Research Center has conducted an ongoing life test program on commercial impregnated tungsten cathodes since 1971. This brief is an update of the information as of December 1979. B-type cathodes, operated at 1100 C have been run in simulated microwave tubes at 2 A/sq cm for more than four years with about 6-percent degradation in current at a constant reference anode voltage. M-type cathodes have been operated for 30,000 h at a cathode temperature of 1010 C and 2 A/sq cm with no degradation in current as a constant reference anode voltage.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Electron Devices; ED-27; July 198
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  • 90
    Publication Date: 2011-08-18
    Description: A small ferroelectric ceramic element is used with an insulating gate transistor and two diodes as an electrically addressed, nonvolatile memory device which is read out nondestructively. The device uses the anomalous photovoltaic effect in ferroelectric ceramics, an effect in which the polarity and magnitude of photovoltages depend on the direction and magnitude of remanent polarization. Experimental results give memory characteristics. The device could be programmed with pulses as short as 200 ns. There is long-time retention of stored data.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Applied Physics Letters; 38; Feb. 1
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  • 91
    Publication Date: 2011-08-18
    Description: A new switching phenomenon in metal-oxide semiconductor tunnel junction has been discovered. With a sufficiently large negative bias applied to the electrode, incident visible light of intensity greater than about 1 microW/sq cm causes the reverse-biased junction to switch from a low-current to a high-current state. It is believed that hot-electron-induced impact ionization provides the positive feedback necessary for switching, and causes the junction to remain in its high-current state after the optical excitation is removed. The junction may be switched back to the low-current state electrically. The basic junction characteristics have been measured, and a simple model for the switching phenomenon has been developed.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Applied Physics Letters; 38; Jan. 1
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  • 92
    Publication Date: 2011-08-18
    Description: The 31 and 92 GHz measurements of the superconductor-Schottky diode extended to millimeter wavelengths by a redesign of the semiconductor interface are reported. Diodes were fabricated by pulse electroplating Pb on 2 x 10 to the 19th/cu cm p-Ga-As etched with HCl; a thin Au overplate is deposited to protect the Pb film from degradation and to improve its lifetime. The noise performance was almost ideal at 31 and 92 GHz; it was concluded that this diode is a quantum-limited-detector at 31 GHz, with excessive parasitic losses at 92 GHz.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 93
    Publication Date: 2011-08-18
    Description: The overall LSI (large-scale integrated circuits) architecture design and current status of the VBLI (very long baseline interferometry) block 2 correlator is addressed. The VBLI correlator algorithms demand a computing system that provides a throughput of hundreds of millions of instructions per second to perform cross-correlation detection for six baselines. The LSI technology lights the way for the computation of complex parallel process and is raising the upper bound of computerization.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: The Telecommun. and Data Acquisition Progr. Rept. 42-64; p 30-40
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  • 94
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    Publication Date: 2011-08-18
    Description: A four way distribution amplifier with up to 100 dB isolation and with low phase noise of -140 dBc in a 1 Hz bandwidth 10 Hz from a 100 MHz signal was developed. It is to be used in the stabilized optical fiber distribution system to provide multiple outputs.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Telecommun. and Data Acquisition; p 31-34
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  • 95
    Publication Date: 2011-08-17
    Description: The study deals with an empirical, simple formula extracted from a three-dimensional helical-TWT computer program that expresses the lowest energy in a spent beam in terms of beam perveance and electronic efficiency. The formula has a general validity down to 4 - 5 dB below saturation and gives 1 - delta V/V with less than 20% error down to 10 dB below saturation.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Electron Devices; ED-27; Mar. 198
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  • 96
    Publication Date: 2011-08-18
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 97
    Publication Date: 2011-08-17
    Description: Preliminary experimental results are reported on a self-structured, multilayer bubble memory with buried data layer. Stripe domains are used to move carrier bubbles by magnetostatic coupling. An expression is derived for that coupling as a function of thickness of the GGG separation layer. Experimental values of coupling are given as a function of bias field. An expression for stripe curvature as a function of bias field is derived. The performance of seven different current access stripe propagation circuits is reported.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 98
    Publication Date: 2011-08-17
    Description: A method is developed for optimizing the energy release from a megajoule capacitive discharge in a series RLC circuit with an RL load. Both the resistance and inductance of the load are represented by effective values that characterize their behavior during the discharge. Using Kirchhoff's laws, equations utilizing the load impedance and the external circuit impedance are derived for determining the instantaneous load voltage and energy characteristics. A program (ERES) computes and displays the load characteristics and the circuit current. Use of the ERES program allows a designer to perturbate values of the circuit elements in order to produce the desired time distribution for the load energy input.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Journal of Applied Physics; 51; Jan. 198
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  • 99
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    Publication Date: 2011-08-18
    Description: The SETI (Search for Extraterrestrial Intelligence) breadboard subsystem was begun in order to develop the technology to efficiently implement a SETI instrument capable of searching wide bandwidth with high resolution. The downconverter covered is the interface hardware between the receiver IF output and ADC used as the input to the spectrum analyzer.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: The Telecommun. and Data Acquisition Rept.; p 1-5
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  • 100
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    Publication Date: 2011-08-18
    Description: Materials illustrating a presentation on 400 Hz constant speed generation systems are presented. The system features are outlined, components and functioning described, and display graphics illustrated.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Langley Research Center Elec. Flight Systems; p 125-146
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