ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The structural and magnetic properties of [111]-oriented multilayers comprising ferromagnetic films of Permalloy-silver alternating with Ag spacer films are described. The multilayers are grown by molecular-beam epitaxy on Pt(111) seed films on sapphire (0001) substrates at temperatures in the range 25–175 °C. For a series of multilayers with similar bilayer periods ((approximately-equal-to)50 A(ring)) the magnetoresistance (MR) is found to be strongly dependent on both growth temperature and subsequent annealing temperature. The multilayers exhibit a negative magnetoresistance in the as-grown state which more than doubles when the growth temperature is increased from 25 to 100 °C; however, the highest MR (peak 5.6%; maximum slope 0.4% per Oe) is obtained by annealing (at 400 °C) multilayers grown at 100 °C. The primary effects of annealing are an improvement of structural order, partial segregation of Ag from the ferromagnetic films into adjacent Ag films, a slight decrease in laminar order, and a reduction in long-wavelength roughness of the multilayer interfaces. No evidence is found for discontinuities in the magnetic layers with the highest MR.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.357437
