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  • Articles  (287)
  • Analytical Chemistry and Spectroscopy  (287)
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  • Wiley-Blackwell  (287)
  • 1970-1974  (287)
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  • 1
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    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 3 (1974), S. A3 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
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  • 2
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    X-Ray Spectrometry 3 (1974), S. A5 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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  • 3
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    X-Ray Spectrometry 3 (1974) 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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  • 4
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    X-Ray Spectrometry 3 (1974), S. 51-51 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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  • 5
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Four independent techniques for quantitatively calibrating an energy dispersive X-ray fluorescence system are compared. These include commercially available powder standards, vacuum deposited standards, laboratory developed powder standards and a semi-theoretical method. A technique is presented for using the latter method in the case where the exciting radiation is bremsstrahlung. These methods are discussed and their resulting efficiency values compared. The most complete, most reliable and easiest method is the semi-theoretical method. Single compound powders of standard chemicals can be used one at a time for periodic checks of the system.
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  • 6
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    X-Ray Spectrometry 3 (1974), S. 64-73 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Theoretical to formulae for the fluoresent X-ray intenisty are obtained and calculations made for nickel + iron + chromium binary and tertiary systems. In the calculation, the continous X-ray of the irradiating source should be taken into account. The theoretical results agree well with the experimental results but have maximum deviations of 1% and it is thought that the error may be due to coexistent elements. The effect of the coexistent elements can be estimated by theoretical calculation and in routine work the effects are usually expressed as linear expansion factors. These factors are generally obtained from a series of experiments but they can be easily obtained by calculation. The errors caused by the linear approximation are also estimated and it is concluded that the approximation is approved in routine analysis of steels when the composition ranges of the steel type are limited by industrial standards.
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  • 7
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    X-Ray Spectrometry 3 (1974), S. 59-63 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Description / Table of Contents: Measurement of the extracellular fluid volume (ECFV) in the human body is an useful means of recognizing pathological conditions. X-ray fluorescence spectrometry allows a simple and accurate determination of the difusion space of bromide ions, from which the ECFV value can be calculated. The method consists of the quantitative determination of stable bromine (80Br) at low concentration in biological fluids, using the Br Kα line. A simultaneous study run with a radioactive tracer (82Br) allowed us to check the validity of the procedure.
    Notes: Le volume de liquide extracellualaire (LEC) chez l'homme estun parameétre important pour la deétection de certins eétats pathologiques. La spectromeétrie de fluorescence X permet de mesurer avec une bonne preécision I'espace de deffusion de I'ion bromure et d'en deédrire la valeur du volume de LEC. La meéthode consiste en un dosage direct du brome stabel (80Br) à faible concentration dans les liquides biologiques, en utilisant la raie Br Kα Une étude paralleéle au moyen d'un radiotraceur (82Br)permet de tester la valcur de la meéthode.
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  • 8
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    X-Ray Spectrometry 3 (1974), S. A28 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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  • 9
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    X-Ray Spectrometry 3 (1974), S. A29 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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  • 10
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    X-Ray Spectrometry 3 (1974), S. A31 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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  • 11
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    X-Ray Spectrometry 2 (1973), S. A21 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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  • 12
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    X-Ray Spectrometry 3 (1974) 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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  • 13
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    X-Ray Spectrometry 2 (1973), S. A22 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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  • 14
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    X-Ray Spectrometry 3 (1974), S. 1-1 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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  • 15
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    X-Ray Spectrometry 3 (1974), S. 21-25 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The theory of the single dilution and double dilution methods for quantitative X-ray diffraction analysis is presented, and verified experimentally for the analysis of silica in a set of seven synthetic standards. Dilution methods are a new concept in diffraction analysis, and show advantages over other methods.
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  • 16
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Description / Table of Contents: This article describes the quantitative determination of phases in polished silicate samples by means of energy dispersive X-ray microanalysis. The scanning electron microsope that was used, is equipped with a semiconductor detector for energy dispersive X-ray measurements and with a special detector for the production of backscattered electron images. The precision of the instrument used and the limit of detection obtainable were determined. The concerntration of the elements was calculated by means of Salter's empirical formula, using binary oxide systems and pure oxides as standards. The microanalysis of cement clinker is discussed.
    Notes: In diesem Artikel wird als Beitrag zur Elektronenstrahlmikroanalyse eine quantitaive röntgenographische Analyse von Phasen in polierten Anschliffen von Silikatproben beschrieben. Für die energiedispersive Messung der Röntgenstrahlung ist das Raster Elektronenmikrosk op mit einem Halbleitermessplatz und für Die Bilderzeugung mit einem Halbeitermessplatz und fü die Genauigkeit der Anlage und die damit erreichbare Nachweisgrenze werden bestimmt. Die Berechung der Konzentration wied nach einer von Salter vorgeschlagenen vorschrift mit Hilfe von binären Oxidsystemen und renien Oxiden als Standardproben berechnet. Als analytisches Bisipiel für die Elektronenstrahlmikroanalyse wurde ein Zementklinker gewählt.
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  • 17
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    X-Ray Spectrometry 3 (1974), S. 37-39 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The absorption of continuous radiation was used in X-ray absorption analysis. The entire spectrum was measured simultaneously by using a solid state detector and a multi-channel pulse height analyser. The analysis of the spectra was performed via a method, where only the energy spectrum but not the intensity of the primary beam need be known.
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  • 18
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    X-Ray Spectrometry 3 (1974), S. 31-36 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Mathematical equation are given for calculating the theoritical values of α coefficients in the Claisse-Quintin relation for any combination of elements and experimental conditions. The Claisse-Quintin relation becomes an approximation of the Sherman equation with minor deviations.The method can be extended to electron microprobe analysis.
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  • 19
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    X-Ray Spectrometry 3 (1974), S. A1 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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  • 20
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    X-Ray Spectrometry 3 (1974), S. 74-77 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The amount of material usually required for X-ray fluorescene analysis of briquetted rock powders is of the order of 2 to 3 g. By reducing the diameter of the pellets and the cross-section of the incident X-ray beam, it is possible to analyse a small quantity of material (about 40 mg) reliably. The results obtained from the analysis of about 40 mg of powder for the major components (MgO, Al2O33, SiO2, P2O5, K2O, CaO, TiO2, MnO, Fe2O3) and for 12 trace elements (Cr, Ni, Cu, Zn, Ga, Rb, Sr, Zr, La, Ce, Ba, Pb) in 6 standard samples of rocks (US Geological Survey Standards: G-2, GSP-1, AGV-1, BCR-1, DTS-1 and PCC-1) are reported. These data are compared with those obtained from standard pellets and from literature values.
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  • 21
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    X-Ray Spectrometry 3 (1974), S. 88-89 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The effect of Compton scattered γ and X-rays on fluorescent intensities is examined for heavier elements when using radioisotope excitation. It is shown to have a major effect in aqueous solutions and the implication of this on mathematical correction procedures is briefly discussed.
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  • 22
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    X-Ray Spectrometry 3 (1974), S. 109-110 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An X-ray fluorescence method for the determinatios of lead, titanium, zirconium and strontium oxides in lead zirconate-titanate has been developed. The method is a simple empirical correction procedure and requires only one standard containing all the elements analyzed. Moreover, the method does not require prior determination of correction factors obtained by a complex calculation, a multiple regression procedure, or from use of a considerable number of well analyzed standards.
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  • 23
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    X-Ray Spectrometry 3 (1974) 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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  • 24
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    X-Ray Spectrometry 3 (1974), S. 135-135 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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  • 25
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    X-Ray Spectrometry 3 (1974), S. 143-148 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: This paper reports on expeeriments to determine the composition of thin aluminium + nickel films. The techniques used were similar to those described by both Rhodin and Weyl but for reasons of simplification of the calculations involved, the effective wavelength concept was employed. Fluorescence measurements were also made on aluminium + nickel powder compacts of known composition. The comparison of measured intensities from powder compacts and thin films revealed a strong particle size intensity dependence.
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  • 26
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    X-Ray Spectrometry 3 (1974), S. 151-152 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In X-ray fluorescence, as well as other quantitative methods for determining trace metal concentrations, computer methods for extracting characteristic peaks from background are very important. Cases where background is large and nonlinear, or there are overlapping peaks, present difficulties in the development of simple computer programs which give an accurate analysis of the peak. The method of analysis that will be described here was developed to meet these demands. The basic concept is simple, and good accuracy and reproducibility are achieved in samples with large nonlinear background, as well as overlapping peaks. The analysis is essentially independent of background.
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  • 27
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    X-Ray Spectrometry 3 (1974), S. 153-158 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The pulsed beam technique has been used to achieved a high data acuumulation rate in an energy-dispersive analytical system consisting of an electron probe analyser and the Harwell ‘Highspec’ pulse analyser system 3074. The use of fast beam switching ( ∼ 30 ns transient time) and the special timing facilities available in the Harwell equipment reduce the spectrum contamination due to displacement of the probe during switching to a low level and also provide precise measurements of live time, essential for accurate analysis. Analyses performed at spectrum accumulation rate of up to 12 kP.P.S. shows agreement with accepted values to within ± 1% for major constituents. Simple modification of the system permits accumulation rates up to 25 kP.P.S.
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  • 28
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    X-Ray Spectrometry 3 (1974), S. A2 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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  • 29
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    X-Ray Spectrometry 3 (1974), S. 47-50 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The results are presented of an intercomparison study between twelve investigators and three analytical techniques. The objective was to determine the precision and accuracy with which multi-element analysis of air particulates on filters can be accomplished using energy dispersive X-ray fluorescence spectrometry. Special emphasis was placed on testing calibration techniques and methods of correction for absorption in both particulate deposits and substrates. Results indicate that errors in calibration and correcting for substrate absorption can be reduced to much less than 10% for elements K and above, but the more work is required to test methods of correcting for particles size to achieve 10% accuracy at energies below 3 keV.
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  • 30
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: This work is aimed at providing a direct analytical method for powdered materials collected on cellulose filters. The origin and composition of these materials may be very different. The analytical technique employed was X-ray fluorescence spectrometry without preliminary treatment of samples.It is known that different thickness of thin deposits, due for example to different sampling condition, cause some difficulties on the correct accomplishment of the analysis. To eliminate this drawback the basic principles characterising the behaviour of X-ray penetration in the matter, were developed, thus leading to some equations, applicable to the analysis of the following kinds of samples: (a) sample of infinite thickness for X-ray penetration; (b) sample of finite thickness below the critical value; (c) sample of infinite thickness placed over the sample of finite thickness.The equation relating to case (c) was then applied to the analysis of powdered materials collected on cellulose filters.A suitable plate of a selected metal was placed over the sample, and the fluorescence radiations intensity values of the element to be analysed were recorded together with the intensity of the radiation emitted by the plate.By substituting some terms of the above mentioned equation with experimental data, X-ray intensity values were corrected, and then independent measurements were performed on the sample thickness.This work described both the theoretical part and the experimental procedures with results showing the method's reliability.
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  • 31
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    X-Ray Spectrometry 3 (1974), S. A3 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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  • 32
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    X-Ray Spectrometry 3 (1974), S. A14 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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  • 33
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    X-Ray Spectrometry 3 (1974), S. A14 
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  • 34
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    X-Ray Spectrometry 3 (1974), S. A15 
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    X-Ray Spectrometry 3 (1974) 
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    X-Ray Spectrometry 3 (1974), S. 101-101 
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    X-Ray Spectrometry 3 (1974), S. 102-108 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Fluorescence crossed effects are discussed as to their exact significance, and relative importance regarding quantitative analysis. While they do not occur in binary systems, crossed effects appear when a fluorescent element is influenced by two or more interfering elements, more particularly when it is subject to enhancement effects. Dissociating crossed effects from pure binary interactions enabled us to establish an accurate general equation for expressing interelement effects in accordance with fundamental theory, and then the associated corrections in any analytical system. As a rule, practical applications should include some suitable modification of the general formula, with respect to the magnitude of corrections for the particularsystem considered.
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    X-Ray Spectrometry 3 (1974), S. 111-114 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The problem presented by a multiphase metal system is studied, where one element is able to migrate from one phase of the alloy to another due to different states of heat treatment. The experimental work was performed on the simple Al + Si system; the results demonstrate that in extreme cases relative analytical errors of 400% may be accumulated if the ‘metallurgical history’ of sample and standard is neglected. The Claisse-Samson particle size formulae for powder samples are applied to the grain size of the phases present in the allows with good agriment, and may be used to predict whether analytical problems are to be expected.
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    X-Ray Spectrometry 3 (1974), S. 115-119 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Many of the equation systems proposed for calculating elemental composition by X-ray fluoresence spectrometry are overdetermined. In the present work an attempt has been made to overcome this difficulty by reducing the problem outlined to an eigenvalue one.
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    X-Ray Spectrometry 3 (1974), S. 120-124 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Description / Table of Contents: A method for quantitative X-ray fluorescence and analysis without reference samples is discussed. There is no comparison with pure elements necessary, since the count rate is defined as a trpical parameter of the instrument used. The quantitative analysis is performed by using count rate ratios of parirs of elements from the unknown sample, together with the method of variable take-off angle.
    Notes: Es wird eine Methods zur eichprobenfreien Rötgenfluoreszenzanalyse beschrieben. Der Vergleich mit Reinelementstandards kann dabci entfallen, da das Zählratenverhältnis von je zwei Reinelementen als Gerätefunktion definiert wird. Durch Verwendung der Zählratenverhältnisse jeweils zweier Elemente der unbekannten Probe wird zusammen mit der Methode des variablen Beobachtungswinkels die quantitaive Zusammensetzung erhalten.
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    X-Ray Spectrometry 3 (1974), S. 125-129 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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    Notes: A technique has been developed for the measurement of lead in gasoline in the range 0.002 to 5 g/U.S. gal. The method is based on the use of Campton Scattering as an internal standard, and on a comparison of the unknown with a blank and with a standard solution. A correction procedure has been devised which takes into account the dependence of the analysis on the carbon-hydrogen ration of the gasoline. The method has an accuracy, for a single measurement, of ± 0.002 at the 0.002 g/U.S. gal. level to ± 0.1 at the 5 g/U.S. gal. level.
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    X-Ray Spectrometry 3 (1974), S. 133-134 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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    Notes: A mathematical procedure used for correcting the interference between two nearest first order overlapping lines is described. The intensity of the ‘composite’ peak is assumed to be a linear superposition of the individual components; the shift in angular position of the sample. The proposed method is based on the dependence existing between the different parameters involved, which can be represented by a mathematical relationship of the [Ri]=[kij] [Cj], where Ri is the observed intensity, measured at the theoretical 2θ values for the elements involved, Kji are characteristic constants of the angular position and Cj the concentration of the elements.
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    X-Ray Spectrometry 3 (1974), S. A20 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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  • 45
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    X-Ray Spectrometry 3 (1974), S. 149-150 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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    Topics: Physics
    Notes: Twenty-five new measurements of Kβ/Kα X-ray intensity ratios for elements in the atomic number range 20 to 30 confirm other recent evidence that the variation with atomic number in this region is much less than previously thought, but there is still some disagreement for atomic numbers above 27. A table of recommended values is given.
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    X-Ray Spectrometry 3 (1974), S. 137-142 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Description / Table of Contents: An automatic device for preparing samples for X-ray fluorescence analysis is described. Based on a fusion technique with the proper flux, it produces glass buttons which can lbe directly analysed with the spectrometer.The apparatus consists essntially of two high frequency furnaces which are used for fusing the samples and casting the beads, respectively. The corresponding vessels, i.e. crucible and mould, and made of a special platinum + gold + rhodium alloy. The automatic preparation sequence lasts eight minutes.The preparation reproducibility which can be achieved with this device is illustrated by an application to the analysis of high grade iron ores dissolved in sodium tetraborate. The standard deviation obtained for iron is 0.15% at a 60% iron level.
    Notes: Description d'un appareil automatique de préparation des échantillons pour l'analyse par fluorescence de rayons X, La technique est basée sur la mise en soluation solide de l'échantillon en uve de l'obtention d'une perle directement analysable.L'appreil est composé de deux fours HF, I'un pourla fusion, I'autre pour la coulée Les récipients de fusion et de coulée sont en alliage platine+ or+ rhodium. La seéquence automatique de préparation dure huit minutes.Une application á I'anlyse de minerais de fer reches par miscen solution dens le tétraborate de sodium illustre les reproductibilités de préparation que I'on peut atteindre avec ce matériel (écart type de reproductibiliteé égal á 0,15% de Fe au niveau de 60%).
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    X-Ray Spectrometry 3 (1974), S. 167-169 
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    Notes: A mathematical approach for determining Ba/Ti molar ratios of barium titanates has been made. A computer program applies the necessary corrections for absorption and secondary fluorescene. The method requires no standards and appears to be sufficiently accurate over large compositional variations. Evaluations of the magnitude of the secondary fluorescence contributions on TiKα intensities are given.
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    X-Ray Spectrometry 3 (1974), S. 170-171 
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    Notes: Borate fusion over a propane flame has been successfully applied to the analysis of chlorine concentration in cement. Volitization and weight loss effects have proven to be negligible.
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    X-Ray Spectrometry 3 (1974), S. 159-166 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Description / Table of Contents: The loss of X-ray fluorescene intensity caused by an imperfect absorption of the primary beam in specimen which are mainly composed of light elements (for example: aqueous liquids, scoriae, minerals and rock samples) is derived and its practical measurement is described. The corrections start in the range of the K spectra near Rb (Z=37) at a few per cent and increase rapidly towards Ba (Z=56). The correction factor for all elements in question can be derived from one diagram by interpolation. To accomplish the correction it is necessary to know the matrix factor and the weight of the specimen; no additional preparation is necessary.
    Notes: Die Strahlendurchlässigkeit Von Proben mit vormiegend leichten Elementen (z.B.wässrige Lösungen, Schlacken, Mineralund Gesteinsproben) führt zu Fluoreszenzatrahlungsverlusten, die unter Berücksichtingung der Strahlengeometric berechnet Werden und deren praktische Messung beschrieben wird. Die Ergebnisse zeigen, dass die erforderlichen Korrekturen im Bereich der K-Spektren etwa beim Element Rb (Z=37)mit maximal einigen %einsetzen und zum Ba (Z=56) hin rasch ansteigen, Durch Interpolation lassen sich alle in Frage kommenden Elemente an Hand einer einzigen Korrekturtafel erfassen, Die Durchfuhrung der Korrektur verlangt die Kenntnis des Matrixfaktors und des Probengewichtes und des Probengewichtes und erfordert keine zäsatzliche präparation.
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    X-Ray Spectrometry 3 (1974), S. A27 
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    X-Ray Spectrometry 3 (1974), S. A28 
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    X-Ray Spectrometry 3 (1974), S. 172-175 
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    Notes: Liebhafsky and Zemany proposed two terms in X-ray emission analysis: one is the linear thickness of a specimen below which the absorption effect vanishes; the other is the critical thickness of a specimen above which the specimen becomes infinitely thick. The criteria for these two terms are defined here in quantitative terms. A procedure for making thin films of closely controlled thickness is described. The sample is dispersed into a film-forming polymer solution which contains an internal standard element. A thin film is made of this suspensoid by a film applicator. The internal standard element is used to correct for variation in actual film thickness. A single calibration curve can be used for samples of different matrices. Experimental data are presented to demonstrate the effectiveness of this thin-film method in eliminating matrix effects.
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    X-Ray Spectrometry 1 (1972) 
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    X-Ray Spectrometry 1 (1972), S. 1-1 
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    X-Ray Spectrometry 1 (1972), S. 3-14 
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    Notes: An attempt has been made to evaluate on the basis of simple physical theories the principal possibilities and limitations of the X-ray fluorescence method in determining both principal components and other alloying elements as well as impurities in relatively complex alloy systems. The text refers specifically to the analysis of copper-based alloys, but the principles are general ones and the arguments can easily be applied to other systems.
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    X-Ray Spectrometry 1 (1972), S. 15-21 
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    Description / Table of Contents: The equations for primary, secondary and tertiary excitation in XRFA have been modified in order to describe single- and multiple-scattering processes in XRSA. For different hydrocarbons, the corresponding ratios of coherently and incoherently scattered X-rays have been calculated and the reasons for the discrepancy of approximately 15 per cent between theory and experiment discussed.
    Notes: Es werden die Gleichungen fur die Primä, Sekundär- und Tertiäranregung bei der RFA verwendet, um aus Analogiebetrachtungen die Verhältnisse bei der Einfach-, Zweifach- und Dreifachstreuung quantitativ behandeln zu können. Der charakteristische Quotient aus körent und inkohärent gestreuter Intensität wird sodann fur verschiedene Kohlenwasserstoffe berechnet und mit den experimentell gefundenen verglichen. Die Ursachen für den etwa 15 Prozent betragenden Unterschied werden diskutiert.
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    X-Ray Spectrometry 1 (1972), S. 29-35 
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    Notes: In the general application of the X-ray spectrographic method, it is often difficult to obtain standards which closely approximate the unknown being analysed. One of the possible ways around this problem is to utilise a matrix correction procedure which does not, in principle, require large numbers of standard samples. One such method has been described by Birks and Criss and this paper describes the application of their program at the University of Florida where a wide variety of samples are encountered. Also discussed in the paper is the basis of the so-called ‘Fundamental Parameter’ method which has provided the means of analysing with great accuracy certain binary and tertiary alloys. It seems that the method holds considerable promise for the analysis of ore deposits and the prediction of inter-element effects.
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    X-Ray Spectrometry 1 (1972), S. 23-28 
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    Notes: The usefulness of the analysing crystal is generally governed by its angular dispersion and reflecting power. This is particularly so today where the increasing requirement for more speed and greater accuracy can often only be obtained by the availability of higher net intensities. Although the performance of the conventional X-ray spectrometer is satisfactory in the middle portion of the wavelength range, it lacks dispersion at the short wavelength end and sensitivity at the long wavelength end. For this reason, there is a continuing search for crystals which offer more angular dispersion in the 0.2 to 2 Å range and better reflecting power in the 5 to 20 Å region.This paper discusses results obtained with some of the newer analysing crystals which have become available during the past couple of years. These crystals include pyrolitic graphite, rubidium acid phthalate, sorbitol hexa-acetate, and the (420) and the (422) cuts of lithium fluoride.
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    X-Ray Spectrometry 1 (1972), S. 37-38 
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    Topics: Physics
    Notes: An instrument is described which permits thin-layer chromatograms to be scanned in a commercial X-ray fluorescence spectrometer. The detection of phosphorus, sulphur, chlorine and iodine has been investigated, but the application of the instrument is not restricted to these elements, for which lower limits of detection of about 2 μg were found.
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    X-Ray Spectrometry 1 (1972), S. 39-41 
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    Notes: The preparation of pellets of powdered geological samples is a critical step in X-ray fluorescence analysis. A special die has been designed to produce smooth surfaces on extremely durable pellets and to provide a protective, hard outer ring and backing. The outer ring minimises the deterioration of the edge that has in the past limited the usable life of the pellet. Repetitive preparations have shown reproducibility and homogeneity to be within normal counting statistics.
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    X-Ray Spectrometry 1 (1972), S. 45-45 
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    X-Ray Spectrometry 1 (1972), S. 43-44 
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    Notes: One of the current problems in the application of the X-ray spectrometer is the training of operators in the use of instrumentation and techniques. One of the usual consequences of rapid expansion in the use of any instrumental procedure is the lack of general experience and expertise, and in this X-ray spectrometry is no exception. As a technique it has only recently been introduced into the syllabus of the appropriate university course of study and, at the present time, this only at a very few universities. Training in X-ray spectrometry has therefore become very much an extra-mural course of study and among the more successful groups to offer courses in the U.S.A. has been the State University of New York at Albany. The following short report by Professor Chessin gives an informal description of the background of his ‘Clinics’ and describes some of his experiences.
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    X-Ray Spectrometry 1 (1972), S. 46-46 
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    X-Ray Spectrometry 1 (1972), S. A1 
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    Notes: The News and Events section is designed to provide readers with a comprehensive and up-to-the-minute current awareness service. It contains information on new instruments and equipment, changes in personel, etc. Further information concerning any item in these pages can be obtained by circling the relevant number on the reader service card. Any contributions which may be of interest to this section should be submitted to either the News and Events Editor  -  Colin Dann  -  at the publisher's London Office, or to any Regional Editor.
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    X-Ray Spectrometry 1 (1972), S. 47-47 
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    X-Ray Spectrometry 1 (1972), S. 49-50 
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    Notes: The calculator is an aid to identification of lines in X-ray emission spectra. It is designed to solve the well-known Bragg equation: nλ=2d sinθ Principal X-ray emission wavelengths (λ) of elements of atomic numbers Z=6 to 95 and lattice spacings (2d) of crystals commonly used in analysis are entered as data. The display of data is so arranged that line overlaps of the first and higher orders (n) of reflection can be seen at a glance for any spectrometer angle (θ or 2θ).
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    X-Ray Spectrometry 1 (1972), S. 51-53 
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    Notes: Phosphorus has proved to be one of the most difficult elements to determine precisely in rocks by X-ray fluorescence analysis. This is partly because of its low concentration in rocks, and because of interference from Ca 2Kβ and its associated escape peak when using the common crystals PE or EDDT. The Ge (111) crystal does not give any second order reflection. A comparison of phosphorus determined in some geological materials using PE crystal and electronic discrimination, PE crystal and manual discrimination and Ge (111) crystal is given.
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    X-Ray Spectrometry 1 (1972), S. 59-68 
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    Notes: Sorbitol hexa-acetate (SHA) crystals are now available which, in comparison with those previously grown, are at least an order of magnitude better for the reflection of Mg Kα radiation. Although the new crystals are still only half as good, in terms of absolute peak intensity, as ammonium dihydrogen phosphate (ADP), freedom from background interferences and better long term reproducibility should make SHA a reasonably attractive alternative to ADP.
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    X-Ray Spectrometry 1 (1972), S. 55-58 
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    Notes: Single crystal boules of hexagonal α-AI2O3 (corundum) were grown by the Czochralski method. The resulting size and crystal quality are appropriate for use as X-ray monochromators. Eight corundum plates of various 2d spacings were fabricated and evaluated in both an X-ray diffractometer and emission spectrometer. The corundum data were compared with crystals of ADP, Si, CaF2, Ge, NaCl, LiF, quartz and topaz. For X-ray diffraction with Cu Kα the corundum (1014) cut is of highest intensity. It is about equal to all other crystals except NaCl (200) and LiF (200). The latter have respectively about 4 and 9 times the corundum intensity. In emissior spectroscopy at wavelengths of 0.1 to 0.5 Å, the corundum (0330) cut is superior to quartz (2023) and topaz (303). The intensity is 2 to 4 times higher for corundum. High resolving power can be attained by the corundum (1456) cut with 2d=1.660 Å. Data and applications are presented for this particularly useful crystal.
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    X-Ray Spectrometry 1 (1972), S. A7 
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    Notes: Factors affecting the on-stream analysis of sulphide ore slurries have been investigated for a number of copper-zinc ores. Zinc, copper and iron were counted on streams of various solids contents, but, because of equipment limitations, sulphur was determined by calculation and the gangue, regarded as silica, by difference.Two simple correction factors were used: the ratio of Rayleigh scatter from the stream under investigation to that from water was found to vary as the cube root of the per cent solids in the stream, and the product of two ratios was adequate to relate the intensity of the characteristic radiation from streams of other solids contents to a 30 per cent stream which was used as a reference in this work. These factors made it possible to calculate the zinc, copper and iron in the solids fractions of ore slurries with an accuracy adequate for the control of sulphide ore beneficiation processes.No inter-element effects were noted, but a marked matrix effect made it necessary to use different correction factors and regression lines for the metals in ore concentrates and in heads and tails.
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    X-Ray Spectrometry 1 (1972), S. 93-98 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Rapidly recorded X-ray diffraction powder patterns from some metals and from rock salt have been obtained by using the energy sensitive Si (Li) semiconductor detector with the multichannel pulse height analyser. The measured energy resolution of the detector system was about 210 eV for Cu Kα radiation. A good agreement was obtained between observed and calculated positions and relative intensities of the diffraction lines.
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    X-Ray Spectrometry 1 (1972), S. 107-111 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: New equations have been derived to describe the dependence of characteristic X-ray intensity on particle size in heterogeneous specimens. The formulae include the effects of continuous size distributions, a problem not covered in earlier theoretical work.
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    X-Ray Spectrometry 1 (1972), S. 99-106 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The use of non-dispersive X-ray fluorescenceanalysis as a general tool in chemical laboratories has developed rather slowly until recently. Most analysers have used radioactive isotopes as the means of excitation and these have been widely used in portable instruments and in on-line control applications. For general use wide element coverage is necessary, especially the ability to cover elements of lower atomic numbers. For the determination of these light elements a compact source - sample - detector geometry is essential. Early experiments in developing an on-line system showed the possibilities of one such compact arrangement and resulted in an instrument specifically designed for use in the chemical laboratory. Solid, liquid and powder samples can be examined for silicon and all heavier elements. Basically, sample excitation is by radioactive sources but the instrument was designed to accept also a miniature X-ray tube which provides higher sensitivity and precision. The measuring head with radioactive isotope or X-ray tube can be removed and mounted for remote use either for on-line applications or in an automatic sample presenter.
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    X-Ray Spectrometry 1 (1972), S. 125-125 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
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    X-Ray Spectrometry 1 (1972), S. 119-123 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Energy dispersive analysis of X-rays is a relatively new but rapidly growing technique for X-ray fluorescence spectrometry offering simultaneous analyses of many elements with sensitivities to a few p.p.m. The digitally recorded spectra lend themselves to processing to remove background and interfering peaks. The net counts for each element can be converted to concentration using any of a variety of mathematical models for interelement effects. When proper specimen preparation is used, final accuracies of better than 1 per cent can be realised over much of the analytical range.
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    X-Ray Spectrometry 1 (1972), S. 83-92 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Description / Table of Contents: The so-called double concentration method, the principle of which is briefly recalled, has been applied to the accurate determination of major major and minor constituents, i.e. Fe2O3, MnO, TiO2, CaO, K2O, P2O5, SiO2, Al2O3, MgO and Na2O in silicate and related rocks. In such a case, this double measurement procedure allows inter-element effect correction with a theoretical relative accuracy of a few tenths of a per cent, and very careful preparation of the fused specimens and the reckoning of net intensities has allowed us to raise the practical precision to a comparable level. The results then obtained in an exploration study of fourteen standard rocks (seven from the Centre de Recherches Pétrographiques et Géochimiques, Nancy, and seven from the U.S. Geological Survey, Washington) seem very satisfactory in that they generally agree with the ‘recommended’ values to within ±1 per cent relative or eventually better. A few recommended or proposed values, as a rule in the range of very low concentrations, can even be disputed or improved.This simple and direct method which relieves us from resorting to any influence factors or fundamental parameters and computers is quasi-absolute and can be used with advantage not only for rock analysis and related compounds, but also, and with an even greater accuracy, for ore analysis as a whole.
    Notes: Nous avons appliqué la méthode de double concentration, dont nous rappelons brièvement le principe, à la détermination précise des constituants majeurs et mineurs, soit Fe2O3 MnO, TiO2, CaO, K2O, P2O5, SiO2, Al2,O3, MgO et Na2O, dans les roches silicatées ou apparentdées. Dans ce cas, la technique de la double mesure permet de corriger pour l'effet interélément avec une précision relative théorique de l'ordre de quelques dixièmes de pour cent et nous avons pu grâce des précautions particuliéres en ce qui concerne la préparation des “perles” vitri- fiées et la mesure des intensités nettes, porter la precision pratique à un niveau comparable. Une étude exploratoire alors menée sur quatorze roches étalons (dont sept du Centre de Recherches Pétrographiques et Géochimiques de Nancy et sept de l'U.S. Geological Survey à Washington) nous a conduits à des résultats très satisfaisants, en ce sens qu'ils concordent généralement avec les valeurs “recommandées” dans la limite de ±1 pour cent, voire mieux, en valeur relative. Un petit nombre de valeurs recommandées ou proposées, dans le domaine des très faibles concentrations, peuvent même être contestées ou améliorées.Cette méthode simple et directe qui nous dispense d'avoir recours à toute espèce de coefficients d'influence ou de para- mètres fondamentaux, ainsi qu'aux machines, est quasi-absolue. On peut I'employer avec avantage non seulement pour l'analyse des roches et des composés similaires, mais aussi et même avec une précision encore accrue pour l'analyse des minerais en général.
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    X-Ray Spectrometry 1 (1972), S. 113-117 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The Berry - Furuta - Rhodes model is used to derive formulae for the characteristic X-ray intensity in specimens of ‘non-infinite’ thickness, as a function of particle size both for discrete values and for continuous distributions, including the Junge distribution for aerosols. Significant simplifications in otherwise complex for mulae are obtained for a number of cases of practical importance, namely, thin specimens, monolayers and low or high packing fractions. The simplified working formulae consist of the equation for a thin, homogeneous specimen, multiplied by a grain size dependent factor. This factor is a function of fluorescent grain size only, so eliminating most inter-element effects. Practical applications of these cussed, with special reference to energy dispersive X-ray fluorescence analysis of thin briquetted specimens and of aerosols collected on filters.
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    X-Ray Spectrometry 1 (1972), S. 125-125 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
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    X-Ray Spectrometry 1 (1972), S. 126-126 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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    X-Ray Spectrometry 1 (1972) 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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    X-Ray Spectrometry 1 (1972), S. 127-127 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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    X-Ray Spectrometry 1 (1972), S. 129-141 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Major improvement in energy resolution in the last two years have made the Si(Li) X-ray energy analysis system a significant tool for X-ray spectroscopy. Its high detection efficiency, coupled with ability to analyse for all element simultaneously, has led to the development of several new techniques for X-ray analysis. This article reviews the present state of the technology for this instrument with respect to performance characteristics and operating principles. A brief reference to its more important applications is also included.
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    X-Ray Spectrometry 1 (1972), S. 147-150 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The characteristic LII,III X-ray emission bands of vanadium in pure metal and nitrides VN0.82 and VN are investigated with an electron microprobe. Results are discussed in relation to the theories proposed in the literature. Also presented is the vanadium LIII absorption spectrum from the pure metal; this spectrum is processed by the self-absorption method.
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    X-Ray Spectrometry 1 (1972), S. 143-146 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An X-ray spectrometric technique is described which enables nickel, gallium and germanium to be analysed in iron meteorites. It is important to know the concentration of these elements with sufficient accuracy in order to chemically classify iron meteorites. The spectrometer was calibrated against a set of ‘standard’ meteorites with well-established compositions.To obtain better accuracy, modification to the geometry were made to improve the peak to background ratio and eliminate machine background. This enabled nickel, gallium and germanium to be analysed with accuracies of ±0.05 per cent, ±4 p.p.m. and ±9 p.p.m. respectively for counting periods of 1 min for nickel and 10 min for gallium and germanium at the peak and background positions.
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    X-Ray Spectrometry 1 (1972), S. 151-154 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In X-ray fluorescence analyses, the matrix effects can be evaluated by computing appropriate coefficients. Utilising powder pellets of samples artificially prepared, a method for computing the matrix effects coefficient of H2O, Na2O, MgO, Al2O3, SiO2, K2O, CaO, TiO2, Fe2O3 for the analytical lines of thirteen elements: vanadium, chromium, nickel, copper, zinc, gallium, rubidium, strontium, zirconium, barium, lanthanum, cerium and lead is described. The computed coefficients have been used to analyse six international rock standards (the U.S. Geological Survey Standards: G-2, GSP-1, AGV-1, BCR-1, PCC-1, DTS-1).
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    X-Ray Spectrometry 1 (1972), S. 161-162 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An explanation is offered for the appearance of parasitic reflections from LiF (220) analysing crystals. The reflections appear to stem from an unrestricted vertical divergence at the primary collimator allowing entry of reflections from planes other than that to which the crystal is cut. Careful orientation of the crystal boule before cutting would seem to offer the most convenient way of avoiding the problem.
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    X-Ray Spectrometry 1 (1972), S. 155-159 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Several procedures for X-ray fluorescence analysis of slag including acid solution and fusing methods are compared. For eliminating erros due to inter-element effects, heavy element addition and calculation methods are considered. Data of precision and accuracy are given for eleven different combinations. For routine operation fusing with borax and casting of a bead is recommended. Fusion in a semi-automatic bead production machine is time-saving, simple and more precise than manual operation and is described in some detail.
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    X-Ray Spectrometry 1 (1972), S. 165-167 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
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    X-Ray Spectrometry 1 (1972), S. 163-164 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A description is given of the decrease in counting efficiency of a scintillation detector with time. The attenuation of an incident beam for various wavelengths was shown to be consistent with the observation that an amorphous layer had formed on the NaI crystal.
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    X-Ray Spectrometry 1 (1972), S. 168-168 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
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    X-Ray Spectrometry 2 (1973) 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
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