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  • Electronics and Electrical Engineering
  • Industrial Chemistry
  • Inorganic Chemistry
  • Life and Medical Sciences
  • 2005-2009  (783)
  • 2000-2004  (863)
  • 1950-1954  (3,585)
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  • 101
    Publication Date: 2019-07-13
    Description: This paper presents a mathematical model characterizing the behavior of a simple amplifier using a FeFET. The model is based on empirical data and incorporates several variables that affect the output, including frequency, load resistance, and gate-to-source voltage. Since the amplifier is the basis of many circuit configurations, a mathematical model that describes the behavior of a FeFET-based amplifier will help in the integration of FeFETs into many other circuits.
    Keywords: Electronics and Electrical Engineering
    Type: M09-0795 , International Symposium on Integrated Ferroelectrics and Functionalities; Sep 27, 2009 - Sep 30, 2009; Colorado Springs, CO; United States
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  • 102
    Publication Date: 2019-07-13
    Description: The use of ferroelectric materials for digital memory devices is widely researched and implemented, but ferroelectric devices also possess unique characteristics that make them have interesting and useful properties in digital circuits. Because ferroelectric transistors possess the properties of hysteresis and nonlinearity, a digital inverter containing a FeFET has very different characteristics than one with a traditional FET. This paper characterizes the properties of the measurement and modeling of a FeFET based digital inverter. The circuit was set up using discrete FeFETs. The purpose of this circuit was not to produce a practical integrated circuit that could be inserted directly into existing digital circuits, but to explore the properties and characteristics of such a device and to look at possible future uses. Input and output characteristics are presented, as well as timing measurements. Comparisons are made between the ferroelectric device and the properties of a standard digital inverter. Potential benefits and possible uses of such a device are presented.
    Keywords: Electronics and Electrical Engineering
    Type: M09-0793 , International Symposium on Integrated Ferroelectrics and Functionalities; Sep 27, 2009 - Sep 30, 2009; Colorado Springs, CO; United States
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  • 103
    Publication Date: 2019-07-13
    Description: Previous research investigated expanding the use of Ferroelectric Field-Effect Transistors (FFET) to other electronic devices beyond memory circuits. Ferroelectric based transistors possess unique characteris tics that give them interesting and useful properties in digital logic circuits. The NAND gate was chosen for investigation as it is one of the fundamental building blocks of digital electronic circuits. In t his paper, NAND gate circuits were constructed utilizing individual F FETs. N-channel FFETs with positive polarization were used for the standard CMOS NAND gate n-channel transistors and n-channel FFETs with n egative polarization were used for the standard CMOS NAND gate p-chan nel transistors. The voltage transfer curves were obtained for the NA ND gate. Comparisons were made between the actual device data and the previous modeled data. These results are compared to standard MOS logic circuits. The circuits analyzed are not intended to be fully opera tional circuits that would interface with existing logic circuits, bu t as a research tool to look into the possibility of using ferroelectric transistors in future logic circuits. Possible applications for th ese devices are presented, and their potential benefits and drawbacks are discussed.
    Keywords: Electronics and Electrical Engineering
    Type: M09-0748 , Measurement and Analysis of a Ferroelectric Field-Effect Transistor NAND Gate 15th conference; Sep 27, 2009 - Sep 30, 2009; Colorado Springs, CO; United States
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  • 104
    Publication Date: 2019-07-13
    Description: The Electromagnetic Systems Branch (EV4) of the Avionic Systems Division at NASA Johnson Space Center in Houston, TX is studying the utility of surface acoustic wave (SAW) radiofrequency identification (RFID) tags for multiple wireless applications including detection, identification, tracking, and remote sensing of objects on the lunar surface, monitoring of environmental test facilities, structural shape and health monitoring, and nondestructive test and evaluation of assets. For all of these applications, it is anticipated that the system utilized to interrogate the SAW RFID tags may need to operate at fairly long range and in the presence of considerable multipath and multiple-access interference. Towards that end, EV4 is developing a prototype SAW RFID wireless interrogation system for use in such environments called the Passive Adaptive RFID Sensor Equipment (PARSED) system. The system utilizes a digitally beam-formed planar receiving antenna array to extend range and provide direction-of-arrival information coupled with an approximate maximum-likelihood signal processing algorithm to provide near-optimal estimation of both range and temperature. The system is capable of forming a large number of beams within the field of view and resolving the information from several tags within each beam. The combination of both spatial and waveform discrimination provides the capability to track and monitor telemetry from a large number of objects appearing simultaneously within the field of view of the receiving array. In this paper, we will consider the application of the PARSEQ system to the problem of simultaneous detection, identification, localization, and temperature estimation for multiple objects. We will summarize the overall design of the PARSEQ system and present a detailed description of the design and performance of the signal detection and estimation algorithms incorporated in the system. The system is currently configured only to measure temperature (jointly with range and tag ID), but future versions will be revised to measure parameters other than temperature as SAW tags capable of interfacing with external sensors become available. It is anticipated that the estimation of arbitrary parameters measured using SAW-based sensors will be based on techniques very similar to the joint range and temperature estimation techniques described in this paper.
    Keywords: Electronics and Electrical Engineering
    Type: JSC-CN-19047 , 2010 IEEE Aerospace Conference; Mar 06, 2010 - Mar 13, 2010; Big Sky, MT; United States
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  • 105
    Publication Date: 2019-07-13
    Description: This paper demonstrates a novel optimization-based approach to estimating fault states in a DC power system. Potential faults changing the circuit topology are included along with faulty measurements. Our approach can be considered as a relaxation of the mixed estimation problem. We develop a linear model of the circuit and pose a convex problem for estimating the faults and other hidden states. A sparse fault vector solution is computed by using 11 regularization. The solution is computed reliably and efficiently, and gives accurate diagnostics on the faults. We demonstrate a real-time implementation of the approach for an instrumented electrical power system testbed, the ADAPT testbed at NASA ARC. The estimates are computed in milliseconds on a PC. The approach performs well despite unmodeled transients and other modeling uncertainties present in the system.
    Keywords: Electronics and Electrical Engineering
    Type: ARC-E-DAA-331 , American Control Conference; Jun 10, 2009 - Jun 12, 2009; Saint Louis, MO; United States
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  • 106
    Publication Date: 2019-07-13
    Description: This paper introduces a generic distributed prognostic health management (PHM) architecture with specific application to the electrical power systems domain. Current state-of-the-art PHM systems are mostly centralized in nature, where all the processing is reliant on a single processor. This can lead to loss of functionality in case of a crash of the central processor or monitor. Furthermore, with increases in the volume of sensor data as well as the complexity of algorithms, traditional centralized systems become unsuitable for successful deployment, and efficient distributed architectures are required. A distributed architecture though, is not effective unless there is an algorithmic framework to take advantage of its unique abilities. The health management paradigm envisaged here incorporates a heterogeneous set of system components monitored by a varied suite of sensors and a particle filtering (PF) framework that has the power and the flexibility to adapt to the different diagnostic and prognostic needs. Both the diagnostic and prognostic tasks are formulated as a particle filtering problem in order to explicitly represent and manage uncertainties; however, typically the complexity of the prognostic routine is higher than the computational power of one computational element ( CE). Individual CEs run diagnostic routines until the system variable being monitored crosses beyond a nominal threshold, upon which it coordinates with other networked CEs to run the prognostic routine in a distributed fashion. Implementation results from a network of distributed embedded devices monitoring a prototypical aircraft electrical power system are presented, where the CEs are Sun Microsystems Small Programmable Object Technology (SPOT) devices.
    Keywords: Electronics and Electrical Engineering
    Type: ARC-E-DAA-TN401 , MFPT 2009; Apr 28, 2009 - Apr 30, 2009; Dayton, OH; United States
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  • 107
    Publication Date: 2019-07-13
    Description: A method for the prediction of time-domain signatures of chafed coaxial cables is presented. The method is quasi-static in nature, and is thus efficient enough to be included in inference and inversion routines. Unlike previous models proposed, no restriction on the geometry or size of the chafe is required in the present approach. The model is validated and its speed is illustrated via comparison to simulations from a commercial, three-dimensional electromagnetic simulator.
    Keywords: Electronics and Electrical Engineering
    Type: ARC-E-DAA-TN261 , Annual Review of Progress in Applied Computational Electromagnetics; Mar 08, 2009 - Mar 12, 2009; Monterey, CA; United States
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  • 108
    Publication Date: 2019-07-13
    Description: IBM 5AM SiGe HBT is device-under-test. High-speed measurement setup. Low-impedance current transient measurements. SNL, JYFL, GANIL. Microbeam to broadbeam position inference. Improvement to state-of-the-art. Microbeam (SNL) transients reveal position dependent heavy ion response, Unique response for different device regions Unique response for different bias schemes. Similarities to TPA pulsed-laser data. Broadbeam transients (JYFL and GANIL) provide realistic heavy ion response. Feedback using microbeam data. Overcome issues of LET and ion range with microbeam. **Angled Ar-40 data in full paper. Data sets yield first-order results, suitable for TCAD calibration feedback.
    Keywords: Electronics and Electrical Engineering
    Type: 2009 IEEE Nuclear and Space Radiation Effects Conference; Jul 20, 2009 - Jul 24, 2009; Quebec City, Quebec; Canada
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  • 109
    Publication Date: 2019-07-13
    Description: Electronics components have and increasingly critical role in avionics systems and for the development of future aircraft systems. Prognostics of such components is becoming a very important research filed as a result of the need to provide aircraft systems with system level health management. This paper reports on a prognostics application for electronics components of avionics systems, in particular, its application to the Isolated Gate Bipolar Transistor (IGBT). The remaining useful life prediction for the IGBT is based on the particle filter framework, leveraging data from an accelerated aging tests on IGBTs. The accelerated aging test provided thermal-electrical overstress by applying thermal cycling to the device. In-situ state monitoring, including measurements of the steady-state voltages and currents, electrical transients, and thermal transients are recorded and used as potential precursors of failure.
    Keywords: Electronics and Electrical Engineering
    Type: ARC-E-DAA-TN-244 , 2009 IEEE Aerospace Conference; Mar 07, 2009 - Mar 14, 2009; Big Sky, MT; United States
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  • 110
    Publication Date: 2019-07-13
    Description: This paper presents experimental results of the effectiveness of various shield termination techniques. Each termination technique is evaluated by two independent noise injection methods; transverse electromagnetic (TEM) cell operated from 3 MHz 400 MHz, and bulk current injection (BCI) operated from 50 kHz 400 MHz. Both single carrier and broadband injection tests were investigated. Recommendations as to how to achieve the best shield transfer impedance (i.e. reduced coupled noise) are made based on the empirical data. Finally, the noise injection techniques themselves are indirectly evaluated by comparing the results obtained from the TEM Cell to those from BCI.
    Keywords: Electronics and Electrical Engineering
    Type: LF99-9338 , IEEE EMC 2009 Symposium; Aug 17, 2009 - Aug 21, 2009; Austin, TX; United States
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  • 111
    Publication Date: 2019-07-13
    Description: Use of low-energy protons and high-energy light ions is becoming necessary to investigate current-generation SEU thresholds. Systematic errors can dominate measurements made with low-energy protons. Range and energy straggling contribute to systematic error. Low-energy proton testing is not a step-and-repeat process. Low-energy protons and high-energy light ions can be used to measure SEU cross section of single sensitive features; important for simulation.
    Keywords: Electronics and Electrical Engineering
    Type: The 18th Single Event Effects (SEE) Symposium; Apr 20, 2009 - Apr 22, 2009; La Jolla, California; United States
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  • 112
    Publication Date: 2019-07-13
    Description: This slide presentation reviews the method developed by the NASA Johnson Space Center (JSC) to determine tolerances to internal shorts and screening for problems in commercial off the shelf (COTS) Lithium-ion batteries. The test apparatus is shown and several examples of the usage and results of the test are discussed.
    Keywords: Electronics and Electrical Engineering
    Type: JSC-CN-18560 , 2008 NASA Battery Workshop; Nov 18, 2008 - Nov 20, 2008; Houston, TX; United States
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  • 113
    Publication Date: 2019-07-13
    Description: The design, simulation and characterization of a novel Ka-band (32.05 +/- 0.25 GHz) rectangular waveguide branchline hybrid unequal power combiner is presented. The manufactured combiner was designed to combine input signals, which are nearly in phase and with an amplitude ratio of two. The measured return loss and isolation of the branch-line hybrid are better than 22 and 27 dB, respectively. The application of the branch-line hybrid for combining two monolithic microwave integrated circuit (MMIC) power amplifiers with output power ratio of two is demonstrated. The measured combining efficiency is 92.9% at the center frequency of 32.05 GHz.
    Keywords: Electronics and Electrical Engineering
    Type: E-16925 , 2009 IEEE MTT-S International Microwave Symposium; Jun 07, 2009 - Jun 12, 2009; Boston, MA; United States
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  • 114
    Publication Date: 2019-07-13
    Description: Reliable systems health management is an important research area of NASA. A health management system that can accurately and quickly diagnose faults in various on-board systems of a vehicle will play a key role in the success of current and future NASA missions. We introduce in this paper the ProDiagnose algorithm, a diagnostic algorithm that uses a probabilistic approach, accomplished with Bayesian Network models compiled to Arithmetic Circuits, to diagnose these systems. We describe the ProDiagnose algorithm, how it works, and the probabilistic models involved. We show by experimentation on two Electrical Power Systems based on the ADAPT testbed, used in the Diagnostic Challenge Competition (DX 09), that ProDiagnose can produce results with over 96% accuracy and less than 1 second mean diagnostic time.
    Keywords: Electronics and Electrical Engineering
    Type: ARC-E-DAA-TN657 , 20th International Workshop on Principles of Diagnosis; Jun 14, 2009 - Jun 17, 2009; Stockholm; Sweden
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  • 115
    Publication Date: 2019-07-13
    Description: Lightning induced damage is one of the major concerns in aircraft health monitoring. Such short-duration high voltages can cause significant damage to electronic devices. This paper presents a study on the effects of lightning injection on power metal-oxide semiconductor field effect transistors (MOSFETs). This approach consisted of pin-injecting lightning waveforms into the gate, drain and/or source of MOSFET devices while they were in the OFF-state. Analysis of the characteristic curves of the devices showed that for certain injection modes the devices can accumulate considerable damage rendering them inoperable. Early results demonstrate that a power MOSFET, even in its off-state, can incur considerable damage due to lightning pin injection, leading to significant deviation in its behavior and performance, and to possibly early device failures.
    Keywords: Electronics and Electrical Engineering
    Type: ARC-E-DAA-TN725 , Annual Conference of the Prognostics and Health Management Society; Sep 27, 2009 - Oct 01, 2009; San Diego, CA; United States
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  • 116
    Publication Date: 2019-07-13
    Description: Raman spectroscopy is used to measure the junction temperature of a Cree SiC MESFET as a function of the ambient temperature and DC power. The carrier temperature, which is approximately equal to the ambient temperature, is varied from 25 C to 450 C, and the transistor is biased with VDS=10V and IDS of 50 mA and 100 mA. It is shown that the junction temperature is approximately 52 and 100 C higher than the ambient temperature for the DC power of 500 and 1000 mW, respectively.
    Keywords: Electronics and Electrical Engineering
    Type: E-17168-P , 2009 International Microwable Symposium; Jun 07, 2009 - Jun 12, 2009; Boston, MA; United States
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  • 117
    Publication Date: 2019-08-26
    Description: A structure for implementation of back-illuminated CMOS or CCD imagers. An epitaxial silicon layer is connected with a passivation layer, acting as a junction anode. The epitaxial silicon layer converts light passing through the passivation layer and collected by the imaging structure to photoelectrons. A semiconductor well is also provided, located opposite the passivation layer with respect to the epitaxial silicon layer, acting as a junction cathode. Prior to detection, light does not pass through a dielectric separating interconnection metal layers.
    Keywords: Electronics and Electrical Engineering
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  • 118
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    In:  CASI
    Publication Date: 2019-08-26
    Description: An electrical connector split backshell is provided, comprising two substantially identical backshell halves. Each half includes a first side and a cam projecting therefrom along an axis perpendicular thereto, the cam having an alignment tooth with a constant radius and an engagement section with a radius that increases with angular distance from the alignment tooth. Each half further includes a second side parallel to the first side and a circular sector opening disposed in the second side, the circular sector opening including an inner surface configured as a ramp with a constant radius, the ramp being configured to engage with an engagement section of a cam of the other half, the circular sector opening further including a relieved pocket configured to receive an alignment tooth of the cam of the other half. Each half further includes a back side perpendicular to the first and second sides and a wire bundle notch disposed in the back side, the wire bundle notch configured to align with a wire bundle notch of the other half to form a wire bundle opening. The two substantially identical halves are rotatably coupled by engaging the engagement section of each half to the ramp of the other half.
    Keywords: Electronics and Electrical Engineering
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  • 119
    Publication Date: 2019-07-12
    Description: An optical image-driven light induced dielectrophoresis (DEP) apparatus and method are described which provide for the manipulation of particles or cells with a diameter on the order of 100 .mu.m or less. The apparatus is referred to as optoelectric tweezers (OET) and provides a number of advantages over conventional optical tweezers, in particular the ability to perform operations in parallel and over a large area without damage to living cells. The OET device generally comprises a planar liquid-filled structure having one or more portions which are photoconductive to convert incoming light to a change in the electric field pattern. The light patterns are dynamically generated to provide a number of manipulation structures that can manipulate single particles and cells or groups of particles/cells. The OET preferably includes a microscopic imaging means to provide feedback for the optical manipulation, such as detecting position and characteristics wherein the light patterns are modulated accordingly.
    Keywords: Electronics and Electrical Engineering
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  • 120
    Publication Date: 2019-07-12
    Description: The radiometer on a chip (ROC) integrates whole wafers together to p rovide a robust, extremely powerful way of making submillimeter rece ivers that provide vertically integrated functionality. By integratin g at the wafer level, customizing the interconnects, and planarizing the transmission media, it is possible to create a lightweight asse mbly performing the function of several pieces in a more conventiona l radiometer.
    Keywords: Electronics and Electrical Engineering
    Type: NPO-46542 , NASA Tech Briefs, December 2009; 10
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  • 121
    Publication Date: 2019-07-12
    Description: In a proposed method of determining the resistances of individual DC electrical devices connected in a series or parallel string, no attempt would be made to perform direct measurements on individual devices. Instead, (1) the devices would be instrumented by connecting reactive circuit components in parallel and/or in series with the devices, as appropriate; (2) a pulse or AC voltage excitation would be applied at a single point on the string; and (3) the transient or AC steady-state current response of the string would be measured at that point only. Each reactive component(s) associated with each device would be distinct in order to associate a unique time-dependent response with that device.
    Keywords: Electronics and Electrical Engineering
    Type: MSC-23623-1 , NASA Tech Briefs, July 2009; 15
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  • 122
    Publication Date: 2019-07-12
    Description: In a proposed alternative to previous approaches to making hot-shoe contacts to the legs of thermoelectric devices, one relies on differential thermal expansion to increase contact pressures for the purpose of reducing the electrical resistances of contacts as temperatures increase. The proposed approach is particularly applicable to thermoelectric devices containing p-type (positive-charge-carrier) legs made of a Zintl compound (specifically, Yb14MnSb11) and n-type (negative charge-carrier) legs made of SiGe. This combination of thermoelectric materials has been selected for further development, primarily on the basis of projected thermoelectric performance. However, it is problematic to integrate, into a practical thermoelectric device, legs made of these materials along with a metal or semiconductor hot shoe that is required to be in thermal and electrical contact with the legs. This is partly because of the thermal-expansion mismatch of these materials: The coefficient of thermal expansion (CTE) of SiGe is 4.5 x 10(exp -6) C (exp -1), while the CTE of Yb14MnSb11 is 20 x 10(exp -6) C(exp -1). Simply joining a Yb14MnSb11 and a SiGe leg to a common hot shoe could be expected to result in significant thermal stresses in either or both legs during operation. Heretofore, such thermal stresses have been regarded as disadvantageous. In the proposed approach, stresses resulting from the CTE mismatch would be turned to advantage.
    Keywords: Electronics and Electrical Engineering
    Type: NPO-44896 , NASA Tech Briefs, May 2009; 35
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  • 123
    Publication Date: 2019-07-12
    Description: A system comprising very-large-scale integrated (VLSI) circuits is being developed as a means of bioinformatics-oriented analysis and recognition of patterns of fluorescence generated in a microarray in an advanced, highly miniaturized, portable genetic-expression-assay instrument. Such an instrument implements an on-chip combination of polymerase chain reactions and electrochemical transduction for amplification and detection of deoxyribonucleic acid (DNA).
    Keywords: Electronics and Electrical Engineering
    Type: NPO-44155 , NASA Tech Briefs, August 2009; 13-14
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  • 124
    Publication Date: 2019-07-12
    Description: An improved design for the backshell of a connector for a shielded, multiplewire cable reduces the size of the backshell, relative to traditional designs of backshells of otherwise identical cable connectors. Notwithstanding the reduction in size, the design provides all the functionality typically demanded of such a backshell, including (1) termination of the cable shield (that is, grounding of the shield to the backshell), (2) strain relief for the cable, and (3) protection against electromagnetic interference (EMI).
    Keywords: Electronics and Electrical Engineering
    Type: MSC-23670-1 , NASA Tech Briefs, February 2009; 12-13
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  • 125
    Publication Date: 2019-07-12
    Description: This design starts with commercial 85- to 115-GHz sources that are amplified to as much as 250 mW using power amplifiers developed for the Herschel Space Observatory. The frequency is then tripled using a novel waveguide GaAs Schottky diode frequency tripler. This planar diode produces 26 mW at 318 GHz. Peak conversion efficiency is over 15 percent, and the measured bandwidth of about 265 - 30 GHz is limited more by the driving source than by the tripler itself. This innovation is based on an integrated circuit designed originally for a single-chip 260- to 340-GHz balanced tripler. The power-combined version has two mirror-image tripler chips that are power-combined in-phase in a single waveguide block using a compact Y-junction divider at the input waveguide, and a Y-junction combiner at the output waveguide. The tripler uses a split-block waveguide design with two independent DC bias lines.
    Keywords: Electronics and Electrical Engineering
    Type: NPO-45479 , NASA Tech Briefs, February 2009; 11
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  • 126
    Publication Date: 2019-07-12
    Description: Two single-stage InP heterojunction bipolar transistor (HBT) amplifiers operate at 184 and 255 GHz, using Northrop Grumman Corporation s InP HBT MMIC (monolithic microwave integrated circuit) technology. At the time of this reporting, these are reported to be the highest HBT amplifiers ever created. The purpose of the amplifier design is to evaluate the technology capability for high-frequency designs and verify the model for future development work.
    Keywords: Electronics and Electrical Engineering
    Type: NPO-45465 , NASA Tech Briefs, February 2009; 8-9
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  • 127
    facet.materialart.
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    In:  CASI
    Publication Date: 2019-08-24
    Description: Methods and systems for adaptable DC offset correction are provided. An exemplary adaptable DC offset correction system evaluates an incoming baseband signal to determine an appropriate DC offset removal scheme; removes a DC offset from the incoming baseband signal based on the appropriate DC offset scheme in response to the evaluated incoming baseband signal; and outputs a reduced DC baseband signal in response to the DC offset removed from the incoming baseband signal.
    Keywords: Electronics and Electrical Engineering
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  • 128
    Publication Date: 2019-07-19
    Description: This paper presents a new technique to calibrate a microwave radiometer and antenna array system. This calibration technique uses a radiated noise source in addition to two calibration sources internal to the radiometer. The method accurately calibrates antenna arrays with embedded active devices (such as amplifiers) which are used extensively in active phased array antennas.
    Keywords: Electronics and Electrical Engineering
    Type: M09-0727
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  • 129
    Publication Date: 2019-07-13
    Description: This article reports on preliminary results of a study conducted to examine how temporary electrical overstress seed fault conditions in discrete power electronic components that cannot be detected with reliability tests but impact longevity of the device. These defects do not result in formal parametric failures per datasheet specifications, but result in substantial change in the electrical characteristics when compared with pristine device parameters. Tests were carried out on commercially available 600V IGBT devices using transmission line pulse (TLP) and system level ESD stress. It was hypothesized that the ESD causes local damage during the ESD discharge which may greatly accelerate degradation mechanisms and thus reduce the life of the components. This hypothesis was explored in simulation studies where different types of damage were imposed to different parts of the device. Experimental results agree qualitatively with the simulation for a number of tests which will motivate more in-depth modeling of the damage.
    Keywords: Electronics and Electrical Engineering
    Type: ARC-E-DAA-TN734 , Annual Conference of the Prognostics and Health; Sep 27, 2009 - Oct 01, 2009; San Diego, CA; United States
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  • 130
    Publication Date: 2019-07-13
    Description: Adaptive control techniques are well suited to nonlinear applications, such as wind turbines, which are difficult to accurately model and which have effects from poorly known operating environments. The turbulent and unpredictable conditions in which wind turbines operate create many challenges for their operation. In this paper, we design an adaptive collective pitch controller for a high-fidelity simulation of a utility scale, variable-speed horizontal axis wind turbine. The objective of the adaptive pitch controller in Region 3 is to regulate generator speed and reject step disturbances. The control objective is accomplished by collectively pitching the turbine blades. We use an extension of the Direct Model Reference Adaptive Control (DMRAC) approach to track a reference point and to reject persistent disturbances. The turbine simulation models the Controls Advanced Research Turbine (CART) of the National Renewable Energy Laboratory in Golden, Colorado. The CART is a utility-scale wind turbine which has a well-developed and extensively verified simulator. The adaptive collective pitch controller for Region 3 was compared in simulations with a bas celliansesical Proportional Integrator (PI) collective pitch controller. In the simulations, the adaptive pitch controller showed improved speed regulation in Region 3 when compared with the baseline PI pitch controller and it demonstrated robustness to modeling errors.
    Keywords: Electronics and Electrical Engineering
    Type: ARC-E-DAA-TN294 , 47th AIAA Aerospace Sciences Meeting Including the New Horizons Forum and Aerospace Exposition; Jan 05, 2009 - Jan 09, 2009; Orlando, FL; United States
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  • 131
    Publication Date: 2019-07-13
    Description: This report documents the work done to develop a beam flattener for use in the inspection of rocket motors at ATK Space Systems Utah facilities. The following pages provide a brief introduction to the necessity of this project, comprehensive description of the design methodology, and experimentally-based conclusions regarding project success.
    Keywords: Electronics and Electrical Engineering
    Type: M09-0706 , Department of Aerospace Engineering Senior Symposium; Dec 01, 2009; Ames, IA; United States
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  • 132
    Publication Date: 2019-07-13
    Description: Researchers at NASA Glenn Research Center have been investigating shunted piezoelectric circuits as potential damping treatments for turbomachinery rotor blades. This effort seeks to determine the effects of centrifugal loading on passively-shunted piezoelectric - damped plates. Passive shunt circuit parameters are optimized for the plate's third bending mode. Tests are performed both non-spinning and in the Dynamic Spin Facility to verify the analysis, and to determine the effectiveness of the damping under centrifugal loading. Results show that a resistive shunt circuit will reduce resonant vibration for this configuration. However, a tuned shunt circuit will be required to achieve the desired damping level. The analysis and testing address several issues with passive shunt circuit implementation in a rotating system, including piezoelectric material integrity under centrifugal loading, shunt circuit implementation, and tip mode damping.
    Keywords: Electronics and Electrical Engineering
    Type: E-17155-1 , AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference; May 04, 2009 - May 07, 2009; Palm Springs, CA; United States
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  • 133
    Publication Date: 2019-07-13
    Description: Future space missions are going to require large focal planes with many sensing arrays and hundreds of millions of pixels all read out at high data rates'' . This will place unique demands on the electrical and electronics (EE) subsystem design and it will be critically important to have high technology readiness level (TRL) EE concepts ready to support such missions. One such omission is the Joint Dark Energy Mission (JDEM) charged with making precise measurements of the expansion rate of the universe to reveal vital clues about the nature of dark energy - a hypothetical form of energy that permeates all of space and tends to increase the rate of the expansion. One of three JDEM concept studies - the Dark Energy Space Telescope (DESTINY) was conducted in 2008 at the NASA's Goddard Space Flight Center (GSFC) in Greenbelt, Maryland. This paper presents the EE subsystem framework, which evolved from the DESTINY science instrument study. It describes the main challenges and implementation concepts related to the design of an EE subsystem featuring multiple focal planes populated with dozens of large arrays and millions of pixels. The focal planes are passively cooled to cryogenic temperatures (below 140 K). The sensor mosaic is controlled by a large number of Readout Integrated Circuits and Application Specific Integrated Circuits - the ROICs/ASICs in near proximity to their sensor focal planes. The ASICs, in turn, are serviced by a set of "warm" EE subsystem boxes performing Field Programmable Gate Array (FPGA) based digital signal processing (DSP) computations of complex algorithms, such as sampling-up-the-ramp algorithm (SUTR), over large volumes of fast data streams. The SUTR boxes are supported by the Instrument Control/Command and Data Handling box (ICDH Primary and Backup boxes) for lossless data compression, command and low volume telemetry handling, power conversion and for communications with the spacecraft. The paper outlines how the JDEM DESTINY concept instrument EE subsystem can be built now, a design; which is generally U.S. Government work not protected by U.S. copyright IEEEAC paper # 1429. Version 4. Updated October 19, 2009 applicable to a wide variety of missions using large focal planes with lar ge mosaics of sensors.
    Keywords: Electronics and Electrical Engineering
    Type: IEEEAC Paper 1429 , 2010 IEEE Aerospace Conference; Mar 06, 2010 - Mar 13, 2010; Big Sky, MT; United States
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  • 134
    Publication Date: 2019-07-13
    Description: Varta Cell Characteristics: Voltage : 3.7 V Capacity : 1.21 Ah Dimensions : 5mm X 37mm X 38.5 mm MOSFET switches for Overvoltage and Undervoltage. Initial Screening Results 29 Cells delivered: Statistics on Ph ysical Screening: Thickness (mm): Average- 5.08; Weight(g)- 22.8938; OCV (V)- 3.787; CCV (V)- 3.491.
    Keywords: Electronics and Electrical Engineering
    Type: JSC-CN-19280 , NASA Aerospace Battery Workshop; Nov 17, 2009 - Nov 19, 2009; Huntsville, AL; United States
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  • 135
    Publication Date: 2019-07-13
    Description: Time-resolved ion beam induced charge reveals heavy ion response of IBM 5AM SiGe HBT: a) Position correlation[ b) Unique response for different bias schemes; c) Similarities to TPA pulsed-laser data. Heavy ion broad-beam transients provide more realistic device response: a) Feedback using microbeam data; b) Overcome issues of LET and ion range with microbeam. Both micro- and broad-beam data sets yield valuable input for TCAD simulations. Uncover detailed mechanisms for SiGe HBTs and other devices fabricated on lightly-doped substrates.
    Keywords: Electronics and Electrical Engineering
    Type: The 18th Annual Single Event Effects (SEE) Symposium; Apr 20, 2009 - Apr 22, 2009; La Jolla, California; United States
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  • 136
    Publication Date: 2019-07-13
    Description: This presentation discusses the effects of ionizing radiation on single event transients (SETs) in circuits. The exposure of integrated circuits to ionizing radiation changes electrical parameters. The total ionizing dose effect is observed in both complementary metal-oxide-semiconductor (CMOS) and bipolar circuits. In bipolar circuits, transistors exhibit grain degradation, while in CMOS circuits, transistors exhibit threshold voltage shifts. Changes in electrical parameters can cause changes in single event upset(SEU)/SET rates. Depending on the effect, the rates may increase or decrease. Therefore, measures taken for SEU/SET mitigation might work at the beginning of a mission but not at the end following TID exposure. The effect of TID on SET rates should be considered if SETs cannot be tolerated.
    Keywords: Electronics and Electrical Engineering
    Type: Single Event Effects Symposium; Apr 20, 2009 - Apr 22, 2009; La Jolla, CA; United States
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  • 137
    Publication Date: 2019-07-13
    Description: Commercial lithium-ion batteries in portable electronic equipment has been used by NASA for space applications since 1999. First battery that was certified for flight and flown for Shuttle use was the Canon BP 927 (2.7 Ah) battery pack. Since then, numerous portable equipment with li-ion batteries have been certified and flown and remain on-orbit for crew usage. Laptops (two generations with third one being worked on now) Camcorder Camera PDA 2 versions (second one being li-ion polymer cells) Satellite Phone Due to expense and time, certified batteries are used with different equipment with the help of adapters or by working with the manufacturer of the equipment to build the appropriate battery compartment and connector. Certified and dedicated chargers are available on Shuttle and on the ISS for safe charging.
    Keywords: Electronics and Electrical Engineering
    Type: JSC-18139 , Space Power Workshop; Apr 20, 2009 - Apr 23, 2009; California; United States
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  • 138
    Publication Date: 2019-07-13
    Description: Charger design that is 2-fault tolerant to catastrophic has been achieved for the Spacesuit Li-ion Battery with key features. Power supply control circuit and 2 microprocessors independently control against overcharge. 3 microprocessor control against undercharge (false positive: Go for EVA) conditions. 2 independent channels provide functional redundancy. Capable of charge balancing cell banks in series. Cell manufacturing and performance uniformity is excellent with both designs. Once a few outliers are removed, LV cells are slightly more uniform than MoliJ cells. If cell balance feature of charger is ever invoked, it will be an indication of a significant degradation issue, not a nominal condition.
    Keywords: Electronics and Electrical Engineering
    Type: JSC-18114 , 2009 Space Power Workshop; Apr 20, 2009 - Apr 23, 2009; Manhattan Beach, CA; United States
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  • 139
    Publication Date: 2019-07-13
    Description: A 1 GeV/u Fe-56 ion beam allows for true 90deg tilt irradiations of various microelectronic components and reveals relevant upset trends for an abundant element at the GCR flux energy peak.
    Keywords: Electronics and Electrical Engineering
    Type: Radiation Effects on Components and Systems (2009 RADECS); Sep 14, 2009 - Sep 18, 2009; Bruges; Belgium
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  • 140
    Publication Date: 2019-07-13
    Description: Time-resolved ion beam induced charge reveals heavy ion response of IBM 5AM SiGe HBT: 1) Position correlation. 2) Unique response for different bias schemes. 3) Similarities to TPA pulsed-laser data. Heavy ion broad-beam transients provide more realistic device response: 1) Feedback using microbeam data 2) Overcome existing issues of LET and ion range with microbeam Both micro- and broad-beam data sets yield valuable input for TCAD simulations. Uncover detailed mechanisms for SiGe HBTs and other devices fabricated on lightly-doped substrates.
    Keywords: Electronics and Electrical Engineering
    Type: 2009 MURI Review Meeting: Radiation Effects on Emerging Electronic Materials and Devices; Jun 10, 2009 - Jun 11, 2009; Nashville, Tennessee; United States
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  • 141
    Publication Date: 2019-07-13
    Description: SiGe HBT heavy ion current transients are measured using microbeam and both high- and low-energy broadbeam sources. These new data provide detailed insight into the effects of ion range, LET, and strike location.
    Keywords: Electronics and Electrical Engineering
    Type: IACRO 09-45871 , DE-AC04-94AL85000 , Nuclear and Space Radiation Effects Conference; Jul 20, 2009 - Jul 24, 2009; Quebec City, Quebec; Canada
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  • 142
    Publication Date: 2019-07-13
    Description: In this paper, PMN-PT single crystal piezoelectric stack actuators and flextensional actuators were designed, prototyped and characterized for space optics applications. Single crystal stack actuators with footprint of 10 mm x10 mm and the height of 50 mm were assembled using 10 mm x10mm x0.15mm PMN-PT plates. These actuators showed stroke 〉 65 - 85 microns at 150 V at room temperature, and 〉 30 microns stroke at 77 K. Flextensional actuators with dimension of 10mm x 5 mm x 7.6 mm showed stroke of 〉50 microns at room temperature at driving voltage of 150 V. A flextensional stack actuator with dimension of 10 mm x 5 mm x 47 mm showed stroke of approx. 285 microns at 150 V at room temperature and 〉 100 microns at 77K under driving of 150 V should be expected. The large cryogenic stroke and high precision of these actuators are promising for cryogenic optics applications.
    Keywords: Electronics and Electrical Engineering
    Type: LF99-9142 , SPIE Optics and Photonics 2009; Aug 02, 2009 - Aug 07, 2009; San Diego, CA; United States
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  • 143
    Publication Date: 2019-07-13
    Description: Understanding aging mechanisms of electronic components is of extreme importance in the aerospace domain where they are part of numerous critical subsystems including avionics. In particular, power MOSFETs are of special interest as they are involved in high voltage switching circuits such as drivers for electrical motors. With increased use of electronics in aircraft control, it becomes more important to understand the degradation of these components in aircraft specific environments. In this paper, we present an accelerated aging methodology for power MOSFETs that subject the devices to indirect thermal overstress during high voltage switching. During this accelerated aging process, two major modes of failure were observed - latch-up and die attach degradation. In this paper we present the details of our aging methodology along with details of experiments and analysis of the results.
    Keywords: Electronics and Electrical Engineering
    Type: ARC-E-DAA-TN724 , Annual Conference of the Prognostics and Health Management Society 2009; Sep 27, 2009 - Oct 01, 2009; San Diego, CA; United States
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  • 144
    Publication Date: 2019-07-13
    Description: Broadband electronically tunable sources in the terahertz range are a critical technology for enabling space-borne as well as ground-based applications. By power-combining MMIC amplifier and frequency tripler chips, we have recently demonstrated 〉1 mW of output power at 900 GHz. This source provides a stepping stone to enable sources in the 2-3 THz range than can sufficiently pump multi-pixel imaging arrays.
    Keywords: Electronics and Electrical Engineering
    Type: IEEE International Conference on Infrared, Millimeter, and Terahertz Waves; Sep 21, 2009 - Sep 25, 2009; Busan; Korea, Republic of
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  • 145
    Publication Date: 2018-06-11
    Description: Area array packages (AAPs) with 1.27 mm pitch have been the packages of choice for commercial applications; they are now starting to be implemented for use in military and aerospace applications. Thermal cycling characteristics of plastic ball grid array (PBGA) and chip scale package assemblies, because of their wide usage for commercial applications, have been extensively reported on in literature. Thermal cycling represents the on-off environmental condition for most electronic products and therefore is a key factor that defines reliability.However, very limited data is available for thermal cycling behavior of ceramic packages commonly used for the aerospace applications. For high reliability applications, numerous AAPs are available with an identical design pattern both in ceramic and plastic packages. This paper compares assembly reliability of ceramic and plastic packages with the identical inputs/outputs(I/Os) and pattern. The ceramic package was in the form of ceramic column grid array (CCGA) with 560 I/Os peripheral array with the identical pad design as its plastic counterpart.
    Keywords: Electronics and Electrical Engineering
    Type: Transactions On Components And Packaging Technologies (ISSN 1521-3331); Volume 31; No. 2; 285-296
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  • 146
    Publication Date: 2018-06-11
    Description: It has been observed that power MOSFETs can experience an SEGR and continue to function with altered parameters. We propose that there are three different types of SEGR modes; the micro-break, the thermal runaway, and the avalanche breakdown. Data that demonstrates these stages of device failure are presented as well as a proposed model for the micro-break. Brief discussions of the other modes, based on analysis combined with our interpretations of the older literature, are also given.
    Keywords: Electronics and Electrical Engineering
    Type: IEEE Transactions On Nuclear Science; Volume 55; No. 4; 2366-2375
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  • 147
    Publication Date: 2018-06-11
    Description: High density PWB (printed wiring board) with microvia technology is required for implementation of high density and high I/O area array packages (AAP). COTS (commercial off-the-shelf) AAP packaging technologies in high reliability versions with 1.27 mm pitch are now being considered for use in a number of NASA systems including Space Shuttle and Mars Rovers. NASA functional system designs are requiring more and more dense AAP packages and board space, which makes board microvia technology very attractive for effectively routing a large number of package inputs/outputs. However, the reliability of the fine feature microvias including via in pads is unknown for space applications. Understanding process and QA (quality assurance) indicators for reliability are important for low risk insertion of these newly available packages and PWBs. This paper presents literature search as well as test results for a high density board subjected to various thermal cycle and reflow profiles representative of tin-lead and lead-free solder reflow. Microvias sizes ranged from two to six mil with and without filling. Daisy chain microvias monitored during the test and PWBs were cross-sectioned to determine failure and locations. Optical and SEM photographs as well as resistance changes during cycling and Tg/Td (glass transition/decomposition temperature) characterisations are presented.
    Keywords: Electronics and Electrical Engineering
    Type: International Journal of Materials and Structural Integrity; Volume 2; Nos. 1/2; 47-63
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  • 148
    facet.materialart.
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    In:  CASI
    Publication Date: 2018-08-10
    Description: SpaceWire spaceflight applications are growing steadily and the data protocol is well documented and standardized. Yet, unique requirements for various programs often make it necessary to deviate from the standard. The introduction of new technologies into the SpaceWire community can only serve to support increased technology growth. The physical layer is often overlooked as a critical component of the SpaceWire link but experience will show that in certain situations a good physical layer design may be crucial to the success of the program. The SpaceWire cable assembly, consisting of the SpaceWire connector and cable, is one of the components that may offer design variations.
    Keywords: Electronics and Electrical Engineering
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  • 149
    Publication Date: 2018-06-06
    Description: Spectrographic astronomy measurements in the near-infrared region will be done by functional two-dimensional microshutter arrays that are being fabricated at the NASA Goddard Space Flight Center for the James Webb Space Telescope (JWST). These micro-shutter arrays will represent the first mission-critical MEMS devices to be flown in space. JWST will use microshutter arrays to select focal plane object. 2-D programmable aperture masks of more than 200,000 elements select such space object. The use of silicon wafer material promises high efficiency and high contrast. Microshutter operation temperature is around 35K. Microshutter arrays are fabricated as close-packed silicon nitride membranes with a unit cell size of 105 x 204 micrometers. A layer of magnetic material is deposited onto each shutter. Individual shutters are equipped with a torsion flexure. Reactive ion etching (RIE) releases the shutters so they can open up to 90 degrees using the torsion flexure. Shutter rotation is initiated into a silicon support structure via an external magnetic field. Two electrically independent aluminum electrodes are deposited, one onto each shutter and another onto the support structure side-wall, permitting electrostatic latching and 2-D addressing to hold specific shutters open via external electronics.
    Keywords: Electronics and Electrical Engineering
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  • 150
    Publication Date: 2018-06-06
    Description: Four probe antennas transfer signals from waveguide to microstrip lines. The probes not only provide broadband impedance matching, but also thermally isolate waveguide and detector. In addition, we developed a new photonic waveguide choke joint design, with four-fold symmetry, to suppress power leakage at the interface. We have developed facilities to test superconducting circuit elements using a cryogenic microwave probe station, and more complete systems in waveguide. We used the ring resonator shown below to measure a dielectric loss tangent 〈 7x10(exp -4) over 10 - 45 GHz. We have combined component simulations to predict the overall coupling from waveguide modes to bolometers. The result below shows the planar circuit and waveguide interface can utilize the high beam symmetry of HE11 circular feedhorns with 〉 99% coupling efficiency over 30% fractional bandwidth.
    Keywords: Electronics and Electrical Engineering
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  • 151
    Publication Date: 2019-07-27
    Description: At an earlier conference we discussed a selection of the challenges for radiation testing of modern semiconductor devices focusing on state-of-the-art CMOS technologies. In this presentation, we extend this discussion focusing on the following areas: (1) Device packaging, (2) Evolving physical single even upset mechanisms, (3) Device complexity, and (4) the goal of understanding the limitations and interpretation of radiation testing results.
    Keywords: Electronics and Electrical Engineering
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  • 152
    Publication Date: 2019-07-19
    Description: There are complex structures for which the installation and positioning of the lightning protection system (LPS) cannot be done using the lightning protection standard guidelines. As a result, there are some "unprotected" or "exposed" areas. In an effort to quantify the lightning threat to these areas, a Monte Carlo statistical tool has been developed. This statistical tool uses two random number generators: a uniform distribution to generate the origin of downward propagating leaders and a lognormal distribution to generate the corresponding returns stroke peak currents. Downward leaders propagate vertically downward and their striking distances are defined by the polarity and peak current. Following the electrogeometrical concept, we assume that the leader attaches to the closest object within its striking distance. The statistical analysis is run for N number of years with an assumed ground flash density and the output of the program is the probability of direct attachment to objects of interest with its corresponding peak current distribution.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2008-149 , 3rd International Conference on Lightning Physics and Effects; Nov 16, 2008 - Nov 20, 2008; Florianopolis; Brazil
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  • 153
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    In:  Other Sources
    Publication Date: 2019-07-19
    Description: The dissipation mechanism of magnetic reconnection remains a subject of intense scientific interest. On one hand, one set of recent studies have shown that particle inertia-based processes, which include thermal and bulk inertial effects, provide the reconnection electric field in the diffusion region. On the other hand, a second set of studies emphasizes the role of wave-particle interactions in providing anomalous resistivity in the diffusion region. In this presentation, we present analytical theory results, as well as PIC simulations of guide-field magnetic reconnection. We will show that the thermal electron inertia-based dissipation mechanism, expressed through nongyrotropic electron pressure tensors, remains viable in three dimensions. We will demonstrate the thermal inertia effect through studies of electron distribution functions. Furthermore, we will show that the reconnection electric field provides a transient acceleration on particles traversing the inner reconnection region. This inertia1 effect can be described as a diffusion-like term of the current density, which matches key features of electron distribution functions.
    Keywords: Electronics and Electrical Engineering
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  • 154
    Publication Date: 2019-07-19
    Description: We provide an overview of the Vector Electric Field Instrument (VEFI) on the Air Force Communication/Navigation Outage Forecasting System (C/NOFS) satellite, a mission designed to understand, model, and forecast the presence of equatorial ionospheric irregularities. VEFI is a NASA GSFC instrument designed 1) to investigate the role of the ambient electric fields in initiating nighttime ionospheric density depletions and turbulence; 2) to determine the electric fields associated with abrupt, large amplitude, density depletions and 3) to quantify the spectrum of the wave electric fields and plasma densities (irregularities) associated with density depletions or Equatorial Spread-F. The VEFI instrument includes a vector electric field double probe detector, a Langmuir trigger probe, a flux gate magnetometer, a lightning detector and associated electronics. The heart of the instrument is the set of double probe detectors designed to measure DC and AC electric fields using 6 identical, mutually orthogonal, deployable 9.5 m booms tipped with 10 cm diameter spheres containing embedded preamplifiers. A description of the instrument and its sensors will be presented. If available, representative measurements will be provided.
    Keywords: Electronics and Electrical Engineering
    Type: 12th International Symposium on Equatorial Aeronomy (ISEA); May 18, 2008 - May 24, 2008; Crete; Greece
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  • 155
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    In:  Other Sources
    Publication Date: 2019-07-13
    Description: Is Verification Acceleration Possible? - Increasing the visibility of the internal nodes of the FPGA results in much faster debug time - Forcing internal signals directly allows a problem condition to be setup very quickly center dot Is this all? - No, this is part of a comprehensive effort to improve the JPL FPGA design and V&V process.
    Keywords: Electronics and Electrical Engineering
    Type: Military and Aerospace Programmable Logic Devices (MAPLD) Conference; Sep 15, 2008 - Sep 18, 2008; Annapolis, MD; United States
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  • 156
    facet.materialart.
    Unknown
    In:  CASI
    Publication Date: 2019-07-13
    Description: The primary'technical objective of this project is to undertake comprehensive testing to generate information on failure modes/criteria to better understand the reliability of: Packages (e.g., Thin Small Outline Package [TSOP], Ball Grid Array [BGA], Plastic Dual In-line Package [PDIPD assembled and reworked with lead-free alloys Packages (e.g., TSOP, BGA, PDIP) assembled and reworked with mixed (lead/lead-free) alloys.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2008-045 , Cleaner, Sustainable Industrial Materials and Processes (C.S.I.M.P.) Workshop; Mar 17, 2008 - Mar 20, 2008; Coronado, CA; United States
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  • 157
    Publication Date: 2019-07-13
    Description: Electrostatic charging of insulators is well known to pose potential threats to electronic systems under terrestrial systems. We were asked to evaluate potential hazards associated with replacement of an electronics board in the vacuum of space during the upcoming Hubble Service Repair mission in September 2008. A device called a "tribot" was built to simulate triboelectric charging of several insulators that are capable of contact charging against astronaut's gloves and suit materials. Materials were evaluated as the extent of not only the magnitude of electric fields generated by the frictional action, but also any resulting discharge which would be a source of EMI. Experimental results are quite surprising and unexpected when compared with tests performed under ambient conditions under dry and humid air.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2008-070 , International ESD Workshop; May 12, 2008 - May 15, 2008; Port d''Albret; France
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  • 158
    Publication Date: 2019-07-13
    Description: Future NASA missions are increasingly seeking to actuate mechanisms to precision levels in the nanometer range and below. Co-fired multilayer piezoelectric stacks offer the required actuation precision that is needed for such mechanisms. To obtain performance statistics and determine reliability for extended use, sets of commercial PZT stacks were tested in various AC and DC conditions at both nominal and high temperatures and voltages. In order to study the lifetime performance of these stacks, five actuators were driven sinusoidally for up to ten billion cycles. An automated data acquisition system was developed and implemented to monitor each stack's electrical current and voltage waveforms over the life of the test. As part of the monitoring tests, the displacement, impedance, capacitance and leakage current were measured to assess the operation degradation. This paper presents some of the results of this effort.
    Keywords: Electronics and Electrical Engineering
    Type: ASCE American Society of Civil Engineers, Earth and Science 2008; Mar 03, 2008; Long Beach, CA; United States
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  • 159
    Publication Date: 2019-07-13
    Description: No abstract available
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2008-275 , NASA-DoD Lead-Free Electronics Project Consortium; Dec 16, 2008; Kennedy Space Center, FL; United States
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  • 160
    Publication Date: 2019-07-12
    Description: New techniques for evaluating the incendiary behavior of insulators is presented. The onset of incendive brush discharges in air is evaluated using standard spark probe techniques for the case simulating approaches of an electrically grounded sphere to a charged insulator in the presence of a flammable atmosphere. However, this standard technique is unsuitable for the case of brush discharges that may occur during the charging-separation process for two insulator materials. We present experimental techniques to evaluate this hazard in the presence of a flammable atmosphere which is ideally suited to measure the incendiary nature of micro-discharges upon separation, a measurement never before performed. Other measurement techniques unique to this study include; surface potential measurements of insulators before, during and after contact and separation, as well as methods to verify fieldmeter calibrations using a charge insulator surface opposed to standard high voltage plates. Key words: Kapton polyimide film, incendiary discharges, brush discharges, contact and frictional electrification, ignition hazards, insulators, contact angle, surface potential measurements.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2008-013
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  • 161
    Publication Date: 2019-07-12
    Description: During the eight weeks working at NASA, I was fortunate enough to work with the Expendable Launch Vehicle's (ELV) Electromagnetic Compatibility (EMC) Team, who is responsible for the evaluation and analysis of any EMI risk an ELV mission might face. This group of people concern themselves with practically any form of electromagnetic interference that may risk the safety of a rocket, a mission, or even people. Taking this into consideration, the group investigates natural forms of interference, such as lightning, to manmade interferences, such as antennas.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2008-192
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  • 162
    Publication Date: 2019-07-12
    Description: Existing risk simulations make the assumption that when a free tin whisker has bridged two adjacent exposed electrical conductors, the result is an electrical short circuit. This conservative assumption is made because shorting is a random event that has a currently unknown probability associated with it. Due to contact resistance electrical shorts may not occur at lower voltage levels. In this experiment, we study the effect of varying voltage on the breakdown of the contact resistance which leads to a short circuit. From this data we can estimate the probability of an electrical short, as a function of voltage, given that a free tin whisker has bridged two adjacent exposed electrical conductors. Also, three tin whiskers grown from the same Space Shuttle Orbiter card guide used in the aforementioned experiment were cross-sectioned and studied using a focused ion beam (FIB). The rare polycrystalline structure seen in the FIB cross section was confirmed using transmission electron microscopy (TEM). The FIB was also used to cross section two card guides to facilitate the measurement of the grain size to determine that the tin plating on the card guides had a bright finish.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2008-017
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  • 163
    Publication Date: 2019-07-12
    Description: Existing risk simulations make the assumption that when a free tin whisker has bridged two adjacent exposed electrical conductors, the result is an electrical short circuit. This conservative assumption is made because shorting is a random event that has a currently unknown probability associated with it. Due to contact resistance, electrical shorts may not occur at lower voltage levels. In this experiment, we study the effect of varying voltage on the breakdown of the contact resistance which leads to a short circuit. From this data, we can estimate the probability of an electrical short, as a function of voltage, given that a free tin whisker has bridged two adjacent exposed electrical conductors. In addition, three tin whiskers grown from the same Space Shuttle Orbiter card guide used in the aforementioned experiment were cross sectioned and studied using a focused ion beam (FIB).
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2008-269
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  • 164
    Publication Date: 2019-07-12
    Description: In this experiment, an empirical model to quantify the probability of occurrence of an electrical short circuit from tin whiskers as a function of voltage was developed. This model can be used to improve existing risk simulation models FIB and TEM images of a tin whisker confirm the rare polycrystalline structure on one of the three whiskers studied. FIB cross-section of the card guides verified that the tin finish was bright tin.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2008-034
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  • 165
    Publication Date: 2019-07-12
    Description: Existing risk simulations make the assumption that when a free tin whisker has bridged two adjacent exposed electrical conductors, the result is an electrical short circuit. This conservative assumption is made because shorting is a random event that has a currently unknown probability associated with it. Due to contact resistance electrical shorts may not occur at lower voltage levels. In this experiment, we study the effect of varying voltage on the breakdown of the contact resistance which leads to a short circuit. From this data we can estimate the probability of an electrical short, as a function of voltage, given that a free tin whisker has bridged two adjacent exposed electrical conductors. Also, three tin whiskers grown from the same Space Shuttle Orbiter card guide used in the aforementioned experiment were cross-sectioned and studied using a focused ion beam (FIB). The rare polycrystalline structure seen in the FIB cross section was confirmed using transmission electron microscopy (TEM). The FIB was also used to cross section two card guides to facilitate the measurement of the grain size to determine that the tin plating on the card guides had a bright finish.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2008-017 , KSC-2008-017R
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  • 166
    facet.materialart.
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    In:  CASI
    Publication Date: 2019-07-12
    Description: The Electrical Power Distribution Control Team takes on the task of determining power failures throughout the Orbiter. The Displays and Controls Team takes on the task of determining distribution, circuit breakers, and switch failures that might occur on the Orbiter or displays that stop working. This paper will identify the circuit packages I have put together for the D&C group, the redesigning of a Hybrid Driver Controller box, and the web designing the Displays and Controls website for easier access to information which can range from indicators to switches.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2008-284
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  • 167
    Publication Date: 2019-07-19
    Description: We provide an overview of the Vector Electric Field Investigation (VEFI) on the Air Force Communication/Navigation Outage Forecasting System (C/NOFS) satellite, a mission designed to understand, model, and forecast the presence of equatorial ionospheric irregularities. VEFI is a NASA/GSFC instrument funded by the Air Force Research Laboratory whose main objectives are to: 1) investigate the role of the ambient electric fields in initiating nighttime ionospheric density depletions and turbulence; 2) determine the quasi-DC electric fields associated with abrupt, large amplitude, density depletions, and 3) quantify the spectrum of the wave electric fields and plasma densities (irregularities) associated with density depletions typically referred to as equatorial spread-F. The VEFI instrument includes a vector electric field double probe detector, a fixed-bias Langmuir probe operating in the ion saturation regime, a flux-gate magnetometer, an optical lightning detector, and associated electronics. The heart of the instrument is the set of detectors designed to measure DC and AC electric fields using 6 identical booms that provide 3 axis, 20-m tip-to-tip orthogonal double probes. Each probe extends a 10 cm diameter sphere containing an embedded preamplifier. VEFI also includes a burst memory that enables snapshots of data from 1-8 channels of selected instruments to be sampled at rates of up to 32 kHz each. The bursts may be triggered by the detection of density depletions, intense electric field wave activity in a given band, lightning detector pulses, or an event at a pre-determined time or location. All VEFI instrument components are working exceptionally well. A description of the instrument, its sensors, and their sampling frequencies and sensitivities will be presented. Representative measurements will be shown.
    Keywords: Electronics and Electrical Engineering
    Type: 2008 AGU General Assembly; Dec 14, 2008 - Dec 20, 2008; San Francisco, CA; United States
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  • 168
    Publication Date: 2019-07-13
    Description: This paper proposes a technique to design a compact planar broadband microwave blocking filter. The filter is constructed from multiple sections of bandstop filters with means to control radiation loss. As a result, the filter has small physical size and provides multi-decade of suppression frequency bandwidth. The total length is less than half-wavelength long at the 3-dB corner frequency of 1.45 GHz. The experimental results show that the microstrip microwave blocking filter can provide an attenuation of more than 70 dB from 7 GHz to 39.5GHz with the total DC capacitance of les than 23 pF.
    Keywords: Electronics and Electrical Engineering
    Type: LEGNEW-OLDGSFC-GSFC-LN-1032 , European Microwave Conference; Oct 27, 2008 - Oct 31, 2008; Amsterdam; Netherlands|European Radar Conference (EuRAD); Oct 30, 2008 - Oct 31, 2008; Amsterdam; Netherlands
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  • 169
    Publication Date: 2019-07-19
    Description: Spacecraft dielectric charging, sometimes called deep-dielectric-charging or bulk-charging, occurs when high energy electrons imbed themselves in dielectric materials, and the charge density builds up, sometimes to breakdown levels. Charges usually bleed off slowly due to material conductivity. At very low (cryogenic) temperatures, the dielectric conductivity decreases until charges may remain and build up over weeks, months, or years. In those cases, the guidelines given in NASA and industry documents for when dielectric charging may become important are misleading. Arcing tests of spacecraft cables at liquid nitrogen temperatures and very low flux levels have been done at NASA MSFC for the JWST Project. In this paper, we describe the results of those tests and analyze their important implications for cryogenic spacecraft cable design and construction.
    Keywords: Electronics and Electrical Engineering
    Type: 4th Space Environment Symposium; Jan 22, 2008 - Jan 23, 2008; Tokyo; Japan
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  • 170
    Publication Date: 2019-07-19
    Description: Having already developed a transition-edge-sensor (TES) microcalorimeter design that enables uniform and reproducible high spectral resolution (routinely better than 3 eV resolution at 6 keV) and is compatible with high fill-factor arrays, we are now working towards demonstrating this performance at high count rates and with the multiplexed read-out needed for instrumenting the Constellation-X X-ray Microcalorimeter Spectrometer (XMS) focal plane array. Design changes that increase the speed of the individual XMS pixels, such as lowering the heat capacity or increasing the thermal conductance of the link to the 50-mK heatsink, result in larger, faster signals, thus the coupling to the multiplexer and the overall bandwidth of the electronics must accommodate this increase in slew rate. In order to operate the array with high incident x-ray flux without unacceptable degradation of the spectral resolution, the magnitude of thermal and electrical crosstalk must be controlled. We will discuss recent progress in the thermal and electrical designs of our close-packed TES arrays, and we will present spectra acquired through the read-out chain from the multiplexer electronics, through the demultiplexer software, to real-time signal processing.
    Keywords: Electronics and Electrical Engineering
    Type: International Society for Optical Engineering (SPIE) Conference; Jun 23, 2008 - Jun 27, 2008; Marseilles; France
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  • 171
    Publication Date: 2019-07-19
    Description: The promise of photoelectric X-ray polarimetry has now been realized in laboratory demonstrations and may soon be used for astrophysical observations. Photoelectric polarimetry in gas filled proportional counters achieves high sensitivity through a combination of broad band width and good modulation. The band can be tuned by careful choice of gas composition and pressure. The measurements rely on imaging the tracks of photoelectrons. The initial direction of each track carries information about the electric field of the X-ray photon, and an ensemble of such measurements thus measures the net polarization of the source. A novel readout geometry using time projection chambers (TPC) allows deep (i.e. high efficiency) detectors, albeit without the ability to image the sky. Polarimeters which exploit the TPC geometry can be optimized for use behind telescopes, to study faint persistent sources, or as wide field of view instruments, designed to study bright transient events such as gamma-ray bursts or solar flares. We present the conceptual design of both types of TPC polarimeter. Recent laboratory results demonstrate that these polarimeters can achieve substantial gains in the polarization sensitivity achievable in experiments of modest size.
    Keywords: Electronics and Electrical Engineering
    Type: HEAD 2008; Mar 31, 2008 - Apr 03, 2008; United States
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  • 172
    Publication Date: 2019-08-26
    Description: Methods of fabricating nano-gap electrode structures in array configurations, and the structures so produced. The fabrication method involves depositing first and second pluralities of electrodes comprising nanowires using processes such as lithography, deposition of metals, lift-off processes, and chemical etching that can be performed using conventional processing tools applicable to electronic materials processing. The gap spacing in the nano-gap electrode array is defined by the thickness of a sacrificial spacer layer that is deposited between the first and second pluralities of electrodes. The sacrificial spacer layer is removed by etching, thereby leaving a structure in which the distance between pairs of electrodes is substantially equal to the thickness of the sacrificial spacer layer. Electrode arrays with gaps measured in units of nanometers are produced. In one embodiment, the first and second pluralities of electrodes are aligned in mutually orthogonal orientations.
    Keywords: Electronics and Electrical Engineering
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  • 173
    Publication Date: 2019-07-12
    Description: A hybrid piezoelectric energy harvesting transducer system includes: (a) first and second symmetric, pre-curved piezoelectric elements mounted separately on a frame so that their concave major surfaces are positioned opposite to each other; and (b) a linear piezoelectric element mounted separately on the frame and positioned between the pre-curved piezoelectric elements. The pre-curved piezoelectric elements and the linear piezoelectric element are spaced from one another and communicate with energy harvesting circuitry having contact points on the frame. The hybrid piezoelectric energy harvesting transducer system has a higher electromechanical energy conversion efficiency than any known piezoelectric transducer.
    Keywords: Electronics and Electrical Engineering
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  • 174
    facet.materialart.
    Unknown
    In:  Other Sources
    Publication Date: 2019-07-12
    Description: The purpose of this project is to characterize and correlate Electrostatic Discharge (ESD) sensitivity levels of an Integrated Circuit (IC) package using Transmission Line Pulse (TLP) and Human Body Model (HBM) methods. This characterization will be used as a baseline ESD sensitivity level to demonstrate improvement to the ESD sensitivity of the IC package through the use of EPI-FLO(Trade Mark) Polymer Voltage Suppression (PVS) protection devices developed and manufactured by Electronic Polymers, Inc. (EPI).
    Keywords: Electronics and Electrical Engineering
    Type: JPL-Publ-08-25
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  • 175
    Publication Date: 2019-07-12
    Description: Several improved designs for complementary metal oxide/semiconductor (CMOS) integrated-circuit image detectors have been developed, primarily to reduce dark currents (leakage currents) and secondarily to increase responses to blue light and increase signal-handling capacities, relative to those of prior CMOS imagers. The main conclusion that can be drawn from a study of the causes of dark currents in prior CMOS imagers is that dark currents could be reduced by relocating p/n junctions away from Si/SiO2 interfaces. In addition to reflecting this conclusion, the improved designs include several other features to counteract dark-current mechanisms and enhance performance.
    Keywords: Electronics and Electrical Engineering
    Type: NPO-41224 , NASA Tech Briefs, August 2008; 14-15
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  • 176
    Publication Date: 2019-07-12
    Description: A new version of the double-Y balun, transitioning from an unbalanced microstrip to a balanced coplanar strip (CPS) line, has been designed to feed a complementary spiral antenna with an input impedance of 100 Omega. The new double-Y balun transitions from a microstrip line with truncated ground plane to a CPS line. The balun does not employ CPW lines; hence, CPW bridges are not required at the junction. In addition, the balun does not exhibit CPW parasitic resonances, thereby improving passband performance. The new version of the double-Y balun is designed to feed a complementary spiral antenna. Panels on the right illustrate an expanded view of the balun junction. Preliminary voltage standing-wave ratio (VSWR) and insertion loss data are illustrated. Measured data were compared with numerical results computed using Momentum. It is seen that the balun exhibits a VSWR of less than 1.5 from 400 MHz to 8 GHz and a VSWR of less than 1.8 up to 13 GHz. The VSWR can be reduced further by reducing reflections from the balun junction and load resistor. Also, the balun is seen to exhibit an insertion loss of less than 1.5 dB up to 12 GHz. Further work involves characterizing the balun's performance when feeding a complementary spiral antenna.
    Keywords: Electronics and Electrical Engineering
    Type: NASA Tech Briefs, August 2008; 11-12
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  • 177
    Publication Date: 2019-07-12
    Description: A method of fabricating Bi(2-x)Sb(x)Te3-based thermoelectric microdevices involves a combination of (1) techniques used previously in the fabrication of integrated circuits and of microelectromechanical systems (MEMS) and (2) a relatively inexpensive MEMS-oriented electrochemical-deposition (ECD) technique. The present method overcomes the limitations of prior MEMS fabrication techniques and makes it possible to satisfy requirements.
    Keywords: Electronics and Electrical Engineering
    Type: NPO-30797 , NASA Tech Briefs, July 2008; 10-11
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  • 178
    Publication Date: 2019-07-12
    Description: Prototype logic gates made of n-channel junction field-effect transistors (JFETs) and epitaxial resistors have been demonstrated, with a view toward eventual implementation of digital logic devices and systems in silicon carbide (SiC) integrated circuits (ICs). This development is intended to exploit the inherent ability of SiC electronic devices to function at temperatures from 300 to somewhat above 500 C and withstand large doses of ionizing radiation. SiC-based digital logic devices and systems could enable operation of sensors and robots in nuclear reactors, in jet engines, near hydrothermal vents, and in other environments that are so hot or radioactive as to cause conventional silicon electronic devices to fail. At present, current needs for digital processing at high temperatures exceed SiC integrated circuit production capabilities, which do not allow for highly integrated circuits. Only single to small number component production of depletion mode n-channel JFETs and epitaxial resistors on a single substrate is possible. As a consequence, the fine matching of components is impossible, resulting in rather large direct-current parameter distributions within a group of transistors typically spanning multiples of 5 to 10. Add to this the lack of p-channel devices to complement the n-channel FETs, the lack of precise dropping diodes, and the lack of enhancement mode devices at these elevated temperatures and the use of conventional direct coupled and buffered direct coupled logic gate design techniques is impossible. The presented logic gate design is tolerant of device parameter distributions and is not hampered by the lack of complementary devices or dropping diodes. In addition to n-channel JFETs, these gates include level-shifting and load resistors (see figure). Instead of relying on precise matching of parameters among individual JFETS, these designs rely on choosing the values of these resistors and of supply potentials so as to make the circuits perform the desired functions throughout the ranges over which the parameters of the JFETs are distributed. The supply rails V(sub dd) and V(sub ss) and the resistors R are chosen as functions of the distribution of direct-current operating parameters of the group of transistors used.
    Keywords: Electronics and Electrical Engineering
    Type: LEW-18256-1 , NASA Tech Briefs, December 2008; 13-14
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  • 179
    Publication Date: 2019-07-12
    Description: A monolithic micro - wave integrated-circuit (MMIC) singlestage amplifier containing an InP-based high-electron-mobility transistor (HEMT) plus coplanar-waveguide (CPW) transmission lines for impedance matching and input and output coupling, all in a highly miniaturized layout as needed for high performance at operating frequencies of hundreds of gigahertz is described.
    Keywords: Electronics and Electrical Engineering
    Type: NPO-44962 , NASA Tech Briefs, July 2008; 13
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  • 180
    Publication Date: 2019-07-12
    Description: A second-harmonic generator (SHG) serves as the source of the visible laser beam in an onboard calibration scheme for NASA's planned Space Interferometry Mission (SIM), which requires an infrared laser beam and a visible laser beam coherent with the infrared laser beam. The SHG includes quasi-phase-matched waveguides made of MgO-doped, periodically poled lithium niobate, pigtailed with polarization- maintaining optical fibers. Frequency doubling by use of such waveguides affords the required combination of coherence and sufficient conversion efficiency for the intended application. The spatial period of the poling is designed to obtain quasi-phase- matching at a nominal middle excitation wavelength of 1,319.28 nm. The SHG is designed to operate at a warm bias (ambient temperature between 20 and 25 C) that would be maintained in its cooler environment by use of electric heaters; the heater power would be adjusted to regulate the temperature precisely and thereby maintain the required precision of the spatial period. At the state of development at the time of this reporting, the SHG had been packaged and subjected to most of its planned space-qualification tests.
    Keywords: Electronics and Electrical Engineering
    Type: NPO-45253 , NASA Tech Briefs, October 2008; 27
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  • 181
    Publication Date: 2019-07-12
    Description: A design modification and a fabrication process that implements the modification have been conceived to solve two problems encountered in the development of back-illuminated, back-sidethinned complementary metal oxide/ semiconductor (CMOS) image-detector integrated circuits. The two problems are (1) how to form metal electrical-contact pads on the back side that are electrically connected through the thickness in proper alignment with electrical contact points on the front side and (2) how to provide alignment keys on the back side to ensure proper registration of backside optical components (e.g., microlenses and/or color filters) with the front-side pixel pattern. The essence of the design modification is to add metal plugs that extend from the desired front-side locations through the thickness and protrude from the back side of the substrate. The plugs afford the required front-to-back electrical conduction, and the protrusions of the plugs serve as both the alignment keys and the bases upon which the back-side electrical-contact pads can be formed.
    Keywords: Electronics and Electrical Engineering
    Type: NPO-42839 , NASA Tech Briefs, July 2008; 12-13
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  • 182
    Publication Date: 2019-07-12
    Description: A proposed tool would be used to inspect alignments of mating twinaxial-connector assemblies on interconnecting wiring harnesses. More specifically, the tool would be used to inspect the alignment of each contact pin of each connector on one assembly with the corresponding socket in the corresponding connector on the other assembly. It is necessary to inspect the alignment because if mating of the assemblies is attempted when any pin/socket pair is misaligned beyond tolerance, the connection will not be completed and the dielectric material in the socket will be damaged (see Figure 1). Although the basic principle of the tool is applicable to almost any type of mating connector assemblies, the specific geometry of the tool must match the pin-and-socket geometry of the specific mating assemblies to be inspected. In the original application for which the tool was conceived, each of the mating assemblies contains eight twinaxial connectors; the pin diameter is 0.014 in. (.0.35 mm), and the maximum allowable pin/socket misalignment is 0.007 in. (.0.18 mm). Incomplete connections can result in loss of flight data within the functional path to the space shuttle crew cockpit displays. The tool (see Figure 2) would consist mainly of a transparent disk with alignment clocking tabs that can be fitted onto either connector assembly. Sets of circles or equivalent reference markings are affixed to the face of the tool, located at the desired positions of the mating contact pairs. An inspector would simply fit the tool onto a connector assembly, engaging the clocking tabs until the tool fits tightly. The inspector would then align one set of circles positioning a line of sight perpendicular to one contact within the connector assembly. Mis alignments would be evidenced by the tip of a pin contact straying past the inner edge of the circle. Socket contact misalignments would be evidenced by a crescent-shaped portion of the white dielectric appearing within the circle. The tool could include a variable magnifier plus an illuminator that could be configured so as not to cast shadows.
    Keywords: Electronics and Electrical Engineering
    Type: MSC-23757 , NASA Tech Briefs, October 2008; 21-22
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  • 183
    Publication Date: 2019-07-12
    Description: A proposed device for combining or switching electromagnetic beams would have three ports, would not contain any moving parts, and would be switchable among three operating states: Two of the ports would be for input; the remaining port would be for output. In one operating state, the signals at both input ports would be coupled through to the output port. In each of the other two operating states, the signal at only one input port would be coupled to the output port. The input port would be selected through choice of the operating state.
    Keywords: Electronics and Electrical Engineering
    Type: NPO-44316 , NASA Tech Briefs, November 2008; 11-12
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  • 184
    Publication Date: 2019-07-12
    Description: This design allows broadband power combining with high isolation between the H port and E port, and achieves a lower insertion loss than any other broadband planar magic-T. Passive micro wave/millimeter-wave signal power is combined both in-phase and out-of-phase at the ports, with the phase error being less than 1 , which is limited by port impedance. The in-phase signal combiner consists of two quarter-wavelength-long transmission lines combined at the microstrip line junction. The out-of-phase signal combiner consists of two half-wavelength-long transmission lines combined in series. Structural symmetry creates a virtual ground plane at the combining junction, and the combined signal is converted from microstrip line to slotline. Optimum realizable characteristic impedances are used so that the magic-T provides broadband response with low return loss. The magic-T is used in microwave and millimeter-wave frequencies, with the operating bandwidth being approximately 100 percent. The minimum isolation obtainable is 32 dB from port E to port H. The magic-T VSWR is less than 1.1 in the operating band. Operating temperature is mainly dependent on the variation in the dielectric constant of the substrate. Using crystallized substrate, the invention can operate in an extremely broad range of temperatures (from 0 to 400 K). It has a very high reliability because it has no moving parts and requires no maintenance, though it is desirable that the magic-T operate in a low-humidity environment. Fabrication of this design is very simple, using only two metallized layers. No bond wires, via holes, or air bridges are required. Additionally, this magic-T can operate as an individual component without auxiliary components.
    Keywords: Electronics and Electrical Engineering
    Type: GSC-15353-1 , NASA Tech Briefs, November 2008; 12
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  • 185
    Publication Date: 2019-07-12
    Description: Distributed control in a networked environment is an irreplaceable feature in systems with remote sensors and actuators. Although distributed control was not originally designed to be networked, usage of off-the-shelf networking technologies has become so prevalent that control systems are desired to have access mechanisms similar to computer networks. However, proprietary transducer interfaces for network communications and distributed control overwhelmingly dominate this industry. Unless the lack of compatibility and interoperability among transducers is resolved, the mature level of access (that computer networking can deliver) will not be achieved in such networked distributed control systems. Standardization of networked transducer interfaces will enable devices from different manufacturers to talk to each other and ensure their plug-and-play capability. One such standard is the suite of IEEE 1451 for sensor network communication and transducer interfaces. The suite not only provides a standard interface for smart transducers, but also outlines the connection of an NCAP (network capable application processor) and transducers (through a transducer interface module TIM). This paper presents the design of the compliance testing of IEEE 1451.1 (referred to as Dot1) compatible NCAP-to-NCAP communications on a link-layer independent medium. The paper also represents the first demonstration of NCAP-to-NCAP communications with Dot1 compatibility: a tester NCAP and an NCAP under test (NUT).
    Keywords: Electronics and Electrical Engineering
    Type: SSTI-2200-0105
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  • 186
    Publication Date: 2019-07-12
    Description: Differential cross sections for electromagnetic dissociation in nuclear collisions are calculated for the first time. In order to be useful for three - dimensional transport codes, these cross sections have been calculated in both the projectile and lab frames. The formulas for these cross sections are such that they can be immediately used in space radiation transport codes. Only a limited amount of data exists, but the comparison between theory and experiment is good.
    Keywords: Electronics and Electrical Engineering
    Type: NASA/TP-2008-215534 , L-19383
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  • 187
    Publication Date: 2019-07-12
    Description: A novel microwave Nondestructive Evaluation (NDE) sensor was developed in an attempt to increase the sensitivity of the microwave NDE method for detection of defects small relative to a wavelength. The sensor was designed on the basis of a negative index material (NIM) lens. Characterization of the lens was performed to determine its resonant frequency, index of refraction, focus spot size, and optimal focusing length (for proper sample location). A sub-wavelength spot size (3 dB) of 0.48 lambda was obtained. The proof of concept for the sensor was achieved when a fiberglass sample with a 3 mm diameter through hole (perpendicular to the propagation direction of the wave) was tested. The hole was successfully detected with an 8.2 cm wavelength electromagnetic wave. This method is able to detect a defect that is 0.037 lambda. This method has certain advantages over other far field and near field microwave NDE methods currently in use.
    Keywords: Electronics and Electrical Engineering
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  • 188
    Publication Date: 2019-07-12
    Description: In this work, we present an alternate set of basis functions, each defined over a pair of planar triangular patches, for the method of moments solution of electromagnetic scattering and radiation problems associated with arbitrarily-shaped, closed, conducting surfaces. The present basis functions are point-wise orthogonal to the pulse basis functions previously defined. The prime motivation to develop the present set of basis functions is to utilize them for the electromagnetic solution of dielectric bodies using a surface integral equation formulation which involves both electric and magnetic cur- rents. However, in the present work, only the conducting body solution is presented and compared with other data.
    Keywords: Electronics and Electrical Engineering
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  • 189
    Publication Date: 2019-07-12
    Description: In this work, we present a new set of basis functions, defined over a pair of planar triangular patches, for the solution of electromagnetic scattering and radiation problems associated with arbitrarily-shaped surfaces using the method of moments solution procedure. The basis functions are constant over the function subdomain and resemble pulse functions for one and two dimensional problems. Further, another set of basis functions, point-wise orthogonal to the first set, is also defined over the same function space. The primary objective of developing these basis functions is to utilize them for the electromagnetic solution involving conducting, dielectric, and composite bodies. However, in the present work, only the conducting body solution is presented and compared with other data.
    Keywords: Electronics and Electrical Engineering
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  • 190
    Publication Date: 2019-07-12
    Description: Matrix methods for solving integral equations via direct solve LU factorization are presently limited to weeks to months of very expensive supercomputer time for problems sizes of several hundred thousand unknowns. This report presents matrix LU factor solutions for electromagnetic scattering problems for problem sizes to one million unknowns with thousands of right hand sides that run in mere days on PC level hardware. This EM solution is accomplished by utilizing the numerical low rank nature of spatially blocked unknowns using the Adaptive Cross Approximation for compressing the rank deficient blocks of the system Z matrix, the L and U factors, the right hand side forcing function and the final current solution. This compressed matrix solution is applied to a frequency domain EM solution of Maxwell's equations using standard Method of Moments approach. Compressed matrix storage and operations count leads to orders of magnitude reduction in memory and run time.
    Keywords: Electronics and Electrical Engineering
    Type: NASA/CR-2008-215353
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  • 191
    Publication Date: 2019-07-12
    Description: Analysis and experimental measurement of the electromagnetic force loads on the hybrid rotor in a novel hybrid magnetic-bearing switched-reluctance motor (MBSRM) have been performed. A MBSRM has the combined characteristics of a switched-reluctance motor and a magnetic bearing. The MBSRM discussed in this report has an eight-pole stator and a six-pole hybrid rotor, which is composed of circular and scalloped lamination segments. The hybrid rotor is levitated using only one set of four stator poles, while a second set of four stator poles imparts torque to the scalloped portion of the rotor, which is driven in a traditional switched reluctance manner by a processor. Static torque and radial force analysis were done for rotor poles that were oriented to achieve maximum and minimum radial force loads on the rotor. The objective is to assess whether simple one-dimensional magnetic circuit analysis is sufficient for preliminary evaluation of this machine, which may exhibit strong three-dimensional electromagnetic field behavior. Two magnetic circuit geometries, approximating the complex topology of the magnetic fields in and around the hybrid rotor, were employed in formulating the electromagnetic radial force equations. Reasonable agreement between the experimental and the theoretical radial force loads predictions was obtained with typical magnetic bearing derating factors applied to the predictions.
    Keywords: Electronics and Electrical Engineering
    Type: NASA/TP--2008-214818 , E-15821-1
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  • 192
    Publication Date: 2019-07-12
    Description: Commercial silicon carbide and silicon Schottky barrier power diodes have been subjected to 203 MeV proton irradiation and the effects of the resultant displacement damage on the I-V characteristics have been observed. Changes in forward bias I-V characteristics are reported for fluences up to 4 x 10(exp 14) p/cm2. For devices of both material types, the series resistance is observed to increase as the fluence increases. The changes in series resistance result from changes in the free carrier concentration due to carrier removal by the defects produced. A simple model is presented that allows calculation of the series resistance of the device and then relates the carrier removal rate to the changes in series resistance. Using this model to calculate the carrier removal rate in both materials reveals that the carrier removal rate in silicon is less than that in silicon carbide, indicating that silicon is the more radiation tolerant material.
    Keywords: Electronics and Electrical Engineering
    Type: JPL-Publ-08-06
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  • 193
    Publication Date: 2019-07-12
    Description: Adding material enhancements to a terahertz traveling-wave tube amplifier is investigated. Isotropic dielectrics, negative-index metamaterials, and anisotropic crystals are simulated, and plans to increase the efficiency of the device are discussed. Early results indicate that adding dielectric to the curved sections of the serpentine-shaped slow-wave circuit produce optimal changes in the cold-test characteristics of the device and a minimal drop in operating frequency. Additional results suggest that materials with simultaneously small relative permittivities and electrical conductivities are best suited for increasing the efficiency of the device. More research is required on the subject, and recommendations are given to determine the direction.
    Keywords: Electronics and Electrical Engineering
    Type: NASA/TM-2008-215059 , E-16271
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  • 194
    Publication Date: 2019-07-12
    Description: Leading up to the Apollo missions the Extended Kalman Filter, a modified version of the Kalman Filter, was developed to estimate the state of a nonlinear system. Throughout the Apollo missions, Potter's Square Root Filter was used for lunar navigation. Now that NASA is returning to the Moon, the filters used during the Apollo missions must be compared to the filters that have been developed since that time, the Bierman-Thornton Filter (UD) and the Unscented Kalman Filter (UKF). The UD Filter involves factoring the covariance matrix into UDUT and has similar accuracy to the Square Root Filter; however it requires less computation time. Conversely, the UKF, which uses sigma points, is much more computationally intensive than any of the filters; however it produces the most accurate results. The Extended Kalman Filter, Potter's Square Root Filter, the Bierman-Thornton UD Filter, and the Unscented Kalman Filter each prove to be the most accurate filter depending on the specific conditions of the navigation system.
    Keywords: Electronics and Electrical Engineering
    Type: NASA/TM-2008-215152 , E-16352
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  • 195
    Publication Date: 2019-07-12
    Description: Real time battery impedance spectrum is acquired using one time record, Compensated Synchronous Detection (CSD). This parallel method enables battery diagnostics. The excitation current to a test battery is a sum of equal amplitude sin waves of a few frequencies spread over range of interest. The time profile of this signal has duration that is a few periods of the lowest frequency. The voltage response of the battery, average deleted, is the impedance of the battery in the time domain. Since the excitation frequencies are known, synchronous detection processes the time record and each component, both magnitude and phase, is obtained. For compensation, the components, except the one of interest, are reassembled in the time domain. The resulting signal is subtracted from the original signal and the component of interest is synchronously detected. This process is repeated for each component.
    Keywords: Electronics and Electrical Engineering
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  • 196
    Publication Date: 2019-07-12
    Description: Electronic systems in aerospace and in space exploration missions are expected to encounter extreme temperatures and wide thermal swings. To address the needs for extreme temperature electronics, research efforts exist at the NASA Glenn Research Center (GRC) to develop and evaluate electronics for extreme temperature operations, and to establish their reliability under extreme temperature operation and thermal cycling; conditions that are typical of both the aerospace and space environments. These efforts are supported by the NASA Fundamental Aeronautics/Subsonic Fixed Wing Program and by the NASA Electronic Parts and Packaging (NEPP) Program. This work reports on the results obtained on the development of a temperature sensor geared for use in harsh environments.
    Keywords: Electronics and Electrical Engineering
    Type: NASA/TM-2008-215160 , E-16402
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  • 197
    Publication Date: 2019-07-12
    Description: A temperature sensor based on a commercial-off-the-shelf (COTS) Silicon-on-Insulator (SOI) Timer was designed for extreme temperature applications. The sensor can operate under a wide temperature range from hot jet engine compartments to cryogenic space exploration missions. For example, in Jet Engine Distributed Control Architecture, the sensor must be able to operate at temperatures exceeding 150 C. For space missions, extremely low cryogenic temperatures need to be measured. The output of the sensor, which consisted of a stream of digitized pulses whose period was proportional to the sensed temperature, can be interfaced with a controller or a computer. The data acquisition system would then give a direct readout of the temperature through the use of a look-up table, a built-in algorithm, or a mathematical model. Because of the wide range of temperature measurement and because the sensor is made of carefully selected COTS parts, this work is directly applicable to the NASA Fundamental Aeronautics/Subsonic Fixed Wing Program--Jet Engine Distributed Engine Control Task and to the NASA Electronic Parts and Packaging (NEPP) Program. In the past, a temperature sensor was designed and built using an SOI operational amplifier, and a report was issued. This work used an SOI 555 timer as its core and is completely new work.
    Keywords: Electronics and Electrical Engineering
    Type: NASA/TM--2008-215159 , E-16401
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  • 198
    Publication Date: 2019-07-12
    Description: A sensor chip, comprising a flexible, polymer-based substrate, and at least one microfabricated sensor disposed on the substrate and including a conductive element. The at least one sensor comprises at least one of a tactile sensor and a flow sensor. Other embodiments of the present invention include sensors and/or multi-modal sensor nodes.
    Keywords: Electronics and Electrical Engineering
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  • 199
    Publication Date: 2019-07-12
    Description: A device for the transdermal delivery of a therapeutic agent to a biological subject that includes a first electrode comprising a first array of electrically conductive microprojections for providing electrical communication through a skin portion of the subject to a second electrode comprising a second array of electrically conductive microprojections. Additionally, a reservoir for holding the therapeutic agent surrounding the first electrode and a pulse generator for providing an exponential decay pulse between the first and second electrodes may be provided. A method includes the steps of piercing a stratum corneum layer of skin with two arrays of conductive microprojections, encapsulating the therapeutic agent into biocompatible charged carriers, surrounding the conductive microprojections with the therapeutic agent, generating an exponential decay pulse between the two arrays of conductive microprojections to create a non-uniform electrical field and electrokinetically driving the therapeutic agent through the stratum corneum layer of skin.
    Keywords: Electronics and Electrical Engineering
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  • 200
    Publication Date: 2019-07-12
    Description: A conductive atomic force microscopy (cAFM) technique which can concurrently monitor topography, charge transport, and electroluminescence with nanometer spatial resolution. This cAFM approach is particularly well suited for probing the electroluminescent response characteristics of operating organic light-emitting diodes (OLEDs) over short length scales.
    Keywords: Electronics and Electrical Engineering
    Format: application/pdf
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