Publication Date:
2013-08-31
Description:
The use of a variant of the Hartmann test is described to sense the coalignment of the 36 primary mirror segments of the Keck 10-meter Telescope. The Shack-Hartmann alignment camera is a surface-tilt-error-sensing device, operable with high sensitivity over a wide range of tilt errors. An interferometer, on the other hand, is a surface-height-error-sensing device. In general, if the surface height error exceeds a few wavelengths of the incident illumination, an interferogram is difficult to interpret and loses utility. The Shack-Hartmann aligment camera is, therefore, likely to be attractive as a development tool for segmented mirror telescopes, particularly at early stages of development in which the surface quality of developmental segments may be too poor to justify interferometric testing. The constraints are examined which would define the first-order properties of a Shack-Hartmann alignment camera and the precision and range of measurement one could expect to achieve with it are investigated. Fundamental constraints do arise, however, from consideration of geometrical imaging, diffraction, and the density of sampling of images at the detector array. Geometrical imagining determines the linear size of the image, and depends on the primary mirror diameter and the f-number of a lenslet. Diffraction is another constraint; it depends on the lenslet aperture. Finally, the sampling density at the detector array is important since the number of pixels in the image determines how accurately the centroid of the image can be measured. When these factors are considered under realistic assumptions it is apparent that the first order design of a Shack-Hartmann alignment camera is completely determined by the first-order constraints considered, and that in the case of a 20-meter telescope with seeing-limited imaging, such a camera, used with a suitable detector array, will achieve useful precision.
Keywords:
INSTRUMENTATION AND PHOTOGRAPHY
Type:
Report of the Asilomar 3 LDR Workshop; p 110-111
Format:
application/pdf
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