ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The integral method of measuring the Seebeck voltage V(T), in which one end of the sample is held at a fixed temperature TC, and the other end is varied through the temperature T range of interest, has been adapted to short rod-shaped samples. The Seebeck coefficient S is obtained from the slope of the V(T) vs T curve, i.e., S=dV(T)/dT. The apparatus has been completely automated such that the specimen is automatically cycled through a preselected temperature range, up to a maximum temperature of 1000 °C, and the V(T), T, and TC values are acquired, stored, and analyzed by means of a microcomputer. Simplicity of sample handling and minimal operator involvement make this method well suited to the survey of large numbers of samples.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1139756
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