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  • Articles  (1,043)
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  • Analytical Chemistry and Spectroscopy  (333)
  • ASTROPHYSICS
  • LUNAR AND PLANETARY EXPLORATION
  • 1980-1984  (1,043)
  • 1925-1929
  • 1984  (536)
  • 1983  (507)
  • Physics  (1,043)
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  • 1980-1984  (1,043)
  • 1925-1929
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  • 1
    Electronic Resource
    Electronic Resource
    Letter to the editor (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 50-50 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120112
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  • 2
    Electronic Resource
    Electronic Resource
    Forthcoming meetings & conferences (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. vii 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120210
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  • 3
    Electronic Resource
    Electronic Resource
    Application of the linear relationship between the reciprocal of analyte-line intensity and the reciprocal of concentration to the analysis of geological materials (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 87-90 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The linear relationship between the reciprocal of analyte-line intensity, and the reciprocal of concentration has been applied to the determination of ten major and minor elements in silicate rocks and minerals. The analyses were carried out on fused specimens of 11 rock standards, with and without added La2O3, and with and without added NaNO3. The method requires no absorption matrix effect corrections, and is ideally suited to the analysis of geological materials with a wide range of chemical composition. It clearly has the advantage of simplicity and speed, and can be applied to the analysis of samples when suitable standards are not available. The results obtained in all cases are in excellent agreement with the literature. However, the discs with La2O3 added yield results with better precision and accuracy than do those without La2O3. Na2O is normally determined on separately prepared rock powder pellets, but can be satisfactorily analysed by this method, using the La2O3 added discs, together with all of the other major and minor elements. Na2O analyses are more readily obtained using discs without added NaNO3. We, therefore, recommend that the analysis of geological materials be carried out on fused glass discs with La2O3 added and without NaNO3.
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120209
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  • 4
    Electronic Resource
    Electronic Resource
    Product news (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. viii 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120213
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  • 5
    Electronic Resource
    Electronic Resource
    A detailed evaluation of counting losses of detectors in wavelength-dispersion x-ray spectroscopy (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 97-105 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The exponential equation R0 = R · eR0τdescribes the counting losses in wavelength-dispersive x-ray spectroscopic (WDF) detectors up to very high counting rates. The correction error can be considerably lower than 1% for a true counting rate of 7 · 105s-1. The dead time constant τ has however to be determined very accurately for this. Methods of determining τ with the desired accuracy are also described. And finally, a formula for correcting for dead time losses for two detectors in series, where each detector has a different dead time, is deduced and verified by experiment. Here again, one can calculate the true counting rate with an accuracy of 1% at a true counting rate of about 7 · 105 s-1.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120304
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  • 6
    Electronic Resource
    Electronic Resource
    XRF analysis of trace titanium in coal using fundamental parameters (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 118-120 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The analysis of various elements in coal has become important as coal utilization increases. The application of x-ray fluorescence (XRF) to this type of analysis is complicated by matrix-correction needs and lack of matrix-matched standards. The application of fundamental parameter mathematical corrections using easily obtainable doped graphite standards is evaluated.
    Additional Material: 2 Ill.
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    URL: http://dx.doi.org/10.1002/xrs.1300120308
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  • 7
    Electronic Resource
    Electronic Resource
    Call for papers (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 132-132 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120312
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  • 8
    Electronic Resource
    Electronic Resource
    X-ray production in thin films by electrons with energies between 40 and 100 keV. 1 - Bremsstrahlung cross-sections (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 153-162 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Cross-sections for bremsstrahlung production in thin films may be derived theoretically only if certain approximations are made or if there is recourse to numerical techniques. In this paper, two approximate equations, one based on the Sommerfeld theory and the other on the Bethe-Heitler theory, are assessed for their accuracy in predicting cross-sections differential in photon energy and emergence angle when a thin foil target is bombarded with electrons with energies between 40 and 100 keV. Experimental data are presented from eight different target materials and these are processed initially to make comparisons between experimental and theoretical spectral shapes and subsequently to compare observed and predicted absolute cross-section values. Except for the heaviest target material (Au), the Bethe-Heitler theory provided a satisfactory description of all experimental observations. In contrast, the Sommerfeld theory provided a significantly inferior description of spectral shapes and consistently overestimated absolute cross-sections by 15-20%.
    Additional Material: 5 Ill.
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    URL: http://dx.doi.org/10.1002/xrs.1300120407
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  • 9
    Electronic Resource
    Electronic Resource
    Forthcoming meetings & conferences (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. v 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120412
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  • 10
    Electronic Resource
    Electronic Resource
    Proton and photon-induced x-ray fluorescence intensity from a monolayer sample of complex chemical and granular composition (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 38-43 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A probability method is used to describe the processes of characteristic x-ray fluorescence excitation and absorption in a heterogeneous monolayer of particles. Based on this the analytical dependence of the characteristic x-ray peak intensity on the sizes and shape of particles, and the distribution of elements among the particles is inferred, for two kinds of spectrum excitation. Theoretical evaluations for applying boundaries of the ‘thin’ homogeneous layer model to a heterogeneous monolayer are given. The elements to be determined in unknown compositions are S, Fe and Pb.
    Additional Material: 6 Ill.
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    URL: http://dx.doi.org/10.1002/xrs.1300130108
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  • 11
    Electronic Resource
    Electronic Resource
    Call for papers (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. v 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300130113
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  • 12
    Electronic Resource
    Electronic Resource
    Electron ionization cross-sections for K, L and M shells (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 55-59 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The total cross-sections for ionization of K, L and M shells in various atoms have been calculated using first-order perturbation theory and Hartree-Slater wave functions. For K shells, the hydrogenic wave functions have been used. The systematic changes across the Periodic Table are discussed and the results of a Bethe parametrization are also given.
    Additional Material: 8 Ill.
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    URL: http://dx.doi.org/10.1002/xrs.1300130204
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  • 13
    Electronic Resource
    Electronic Resource
    Radiative Auger transitions and their consideration in deconvolution of energy dispersive x-ray spectra (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 78-82 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The significance of Auger transitions as spectral components in energy dispersive x-ray fluorescence spectra is demonstrated. As a summary of fundamental studies on radiative Auger effects the calculation of their energies and relative intensities is demonstrated. These theoretical deductions result in a suitable incorporation in least-squares techniques by coupling the Auger transitions to the corresponding photopeak originating from the same type of primary vacancy as a function of energy. The simplifications involved, and the removal of systematic misinterpretations and of high correlations of model parameters, are discussed.
    Additional Material: 5 Ill.
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    URL: http://dx.doi.org/10.1002/xrs.1300130208
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  • 14
    Electronic Resource
    Electronic Resource
    Sub-surface charging, a source of error in microprobe analysis (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 126-133 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Qualitative microprobe analysis of sodian potassian hydroxonian meta-autunite failed to reveal any sodium, although nearly 3% was present. Potassium, magnesium and calcium were underestimated to a smaller extent in related natural and synthetic structures. The effect is due to the migration of these interlayer cations from the analysed region - almost instantaneously in the case of sodium - and a consequent decrease in count rates, under the influence of the space-charge resulting from the incident electron beam. Experiments with the autunites and with a soda-glass subjected to various coating treatments showed that the effect of charging can be dramatic. Such charging also occurs when alkali metals are not present, a fact which has important implications for all microprobe analyses.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300130308
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  • 15
    Electronic Resource
    Electronic Resource
    Routineverfahren zur serienanalytik geologischen materials mittels XRFS (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 142-145 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Description / Table of Contents: In a geochemical exploration project, about 25 000 stream-sediment samples have been analysed. In a new multi-element technique, 36 elements have been determined by a combination of various methods. Optical spectroscopy with are and ICP excitation and wavelength- and energy-dispersive XRFS were used. An XRFS method is presented which allows the analysis of the fraction with particle diameter 〈 0. 18 mm for up to 30 elements with high precision over a large matrix range. The basic idea is to use a large number of reference samples with very different compositions for the calculation of the calibration line.
    Notes: Im Rahmen des österreichischen Rohstoff-Forschungsprojektes Geochemische Basisuntersuchung von Bach- und Flußsedimenten wurden mehr als 25 000 Proben einer Multielementanalytik auf 36 Elemente unterzogen. Neben optischer Spektroskopie mit Kohlebogen- und induktiv gekoppelter Plasmaanregung gelgangten wellenlangen- und energie-dispersive XRFS zum Einsatz. Es wird ein Verfahren beschrieben, das es ermoglicht, die Analyse der Fraktion mit einem Korndurchmesser 〈0.18 mm auf bis zu 30 Elemente rnit hoher Genauigkeit bei einer breiten Streuung des Matrixbereiches durchzufiihren. Der Grundgedanke dabei ist, eine große Zahl von gut analysierten Referenzproben verschiedenster Zusammensetzung fiir die Eichung heranzuziehen.
    Additional Material: 3 Tab.
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    URL: http://dx.doi.org/10.1002/xrs.1300130310
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  • 16
    Electronic Resource
    Electronic Resource
    Measuring the dead time of an x-ray spectrometer by means of the first- and second-order reflections method (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 44-45 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The dead time of a Philips PW 1410 x-ray fluorescence spectrometer with a photon detector has been calculated employing intensities of first- and second-order reflections. The spread of the values obtained can be considered very satisfactory in the light of the experimental difficulties inherent in this method.
    Additional Material: 1 Ill.
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    URL: http://dx.doi.org/10.1002/xrs.1300130109
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  • 17
    Electronic Resource
    Electronic Resource
    The influence of the fluorescence volume on the observed yield in energy dispersive XRF analysis (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 11-18 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: It is shown that when a narrow x-ray beam is used in energy dispersive fluorescence analysis of thick, low-Z samples large deviations from the predictions of the commonly used fundamental parameter model occur. A simple method by which the effects can be studied empirically is described. An approximate model allowing a direct calculation of the effécts is introduced. The validity of the model has been confirmed experimentally.
    Additional Material: 12 Ill.
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    URL: http://dx.doi.org/10.1002/xrs.1300120105
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  • 18
    Electronic Resource
    Electronic Resource
    Determination of composition and thickness of TiNxOy films on silicon by combined x-ray and nuclear microanalysis (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 38-41 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The stoichiometry and thickness of TiNxOy films has been determined by electron microprobe and nuclear microanalysis. The difficulty arising in the electron microprobe from the interference between NKα and TiLI lines has been overcome by using a suitable Monte Carlo computing scheme. This procedure takes into account the SiKα intensity which was found to be sensitive to composition and thickness of the overlying TiNxOy film. The good agreement between electron microprobe and nuclear microanalysis results indicate the validity of the method.
    Additional Material: 2 Ill.
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    URL: http://dx.doi.org/10.1002/xrs.1300120109
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  • 19
    Electronic Resource
    Electronic Resource
    Courses (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. v 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120113
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  • 20
    Electronic Resource
    Electronic Resource
    The estimated binary calibration curve method in the JIS x-ray fluorescence analysis of steels and standard samples necessary for the method (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 23-29 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In the Japanese Industrial Standard for the x-ray fluorescence analysis of steels, the ‘estimated binary calibration curve’ method has been adopted. In this method, the calibration curve for the binary system, consisting of an analyte and the principal constituent elements is estimated and derived by using multicomponent standard samples. The measured x-ray intensity is first converted into a tentative analytical value from this calibration curve, and then the analytical result is derived from this tentative value using the correction procedure. In this paper, some methods and standard samples of making the estimated binary calibration curve are compared and discussed, also, the characteristics of the JIS method are described.
    Additional Material: 5 Ill.
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    URL: http://dx.doi.org/10.1002/xrs.1300120107
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  • 21
    Electronic Resource
    Electronic Resource
    A study of mathematical models for XRF spectrometry analysis of copper mattes and slags (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 121-127 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The Rasberry-Heinrich method and its three modifications (delta method, expanded square intensity method and double constant method) together with the Tertian and a strictly empirical method were used for the analysis of copper mattes and slags. The expanded square intensity method, which represents a combination of theory and empiricism, gave the most accurate results.
    Additional Material: 5 Tab.
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    URL: http://dx.doi.org/10.1002/xrs.1300120309
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  • 22
    Electronic Resource
    Electronic Resource
    Masthead (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983) 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120401
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  • 23
    Electronic Resource
    Electronic Resource
    Comparison of some ambient aerosol samplers in combination with PIXE analysis (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 138-147 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: PIXE (particle induced x-ray emission) analysis of aerosols has been applied to four different samplers to determine sample thickness corrections, detection limits and required sampling times in different environments. The samplers (two total filter samplers, a two stage filter sampler and a cascade impactor) were used with filters made by Ghia, Millipore, Nucleopore and backings of polystyrene film, respectively. The calculations were based on the accumulation mode aerosol (particles in the 0.05-2μm diameter range) composition. Sampling times (resulting in detection limits 10 times lower than assumed aerosol concentrations) ranged from a quarter of an hour in urban, to a quarter of a day in rural and to two weeks in remote environments. These sampling times are calculated with the requirement that at least one element representing each of the following sources was detected: fossil fuel combustion (S, V and Ni), leaded petrol combustion (Br and Pb) and general industrial activities (Cr, Cu and Zn). Generally the two stage filter sampler employed with Nuclepore filters yielded the highest time resolution when specific flow rate, thickness and substrate impurities were taken into consideration. Thickness corrections based on a proton energy of 2.55 MeV and typical ambient urban and rural aerosol matrices show that elements of low atomic number such as P, S and Cl, where the x-ray self absorption effect is most important, require a 10-20% correction with a uniform deposit thickness of about 0.5 mg cm-2 and a non-nuniform (conical) deposit thickness of about 1 mg cm-2. For elements of higher atomic number than vanadium (K x-rays) the proton energy loss correction dominates. Sampling times resulting in the above mentioned deposit thicknesses were shortest for the cascade impactor while the Millipore and Nuclepore filter samplers were least critical in this respect.
    Additional Material: 9 Ill.
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    URL: http://dx.doi.org/10.1002/xrs.1300120404
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  • 24
    Electronic Resource
    Electronic Resource
    X-ray production in thin films by electrons with energies between 40 and 100 keV. 2For Part l. see p. 153. - Characteristic cross-sections and the overall x-ray spectrum (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 163-169 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Two approximate theories are considered for the production of characteristic x-rays when thin foil targets are bombarded with electrons with energies between 40 and 100 keV. One, due to Kolbenstvedt, is semi-classical in nature whilst the other, due to Bethe, contains two parameters which are normally adjusted empirically. Data from six different target materials are presented, but because errors in experimentally derived absolute cross-sections are large, a comparison is made between theoretical and observed ratios of characteristic Kα photons to bremsstrahlung photons in a 20 eV channel directly beneath the peak. By adjusting the Bethe parameters and using a modified Bethe-Heitler theory to predict the bremsstrahlung, agreement between experiment and theory of typically 10% is recorded. Finally, a means of simplifying the equations used to enable rapid calculation of x-ray spectra with a pocket calculator is indicated.
    Additional Material: 2 Ill.
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    URL: http://dx.doi.org/10.1002/xrs.1300120408
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  • 25
    Electronic Resource
    Electronic Resource
    A mobile installation for energy-dispersive multi-element x-ray fluorescence analysis for application in the field (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 175-181 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The construction of a mobile XRF unit is described. It consists of a radionuclide source (109Cd), shielding, a sample exchanger for powdered samples, a semiconductor detector and an electronic measuring and evaluation system. The disadvantage of the supply of liquid nitrogen or liquid air for the semiconductor detector is avoided by use of a mobile unit for the production of liquid air constructed for this purpose. Numerous measurements were carried out at several location within the Federal Republic of Germany.
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    URL: http://dx.doi.org/10.1002/xrs.1300120411
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  • 26
    Electronic Resource
    Electronic Resource
    Some possibilities for the use of so-called ‘differential’ correction equations in x-ray fluorescence analysis (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 16-22 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In connection with progress in the creation of differential and so-called differential methods of concentration correction, work has been carried out on the ordering of equations. It has been shown that it is possible to create three principal, complete systems of so-called differential concentration correction equations by (1) using the Claisse method, (2) using the method of function expansion in a Taylor series and (3) using a special method discussed in this paper. These equations can be used instead of the classical concentration correction methods. Moreover, it has been proved that the respective procedures can be used in the creation of expressions which are the analogues of classical intensity correction equations.
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    URL: http://dx.doi.org/10.1002/xrs.1300130104
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    Heterogeneity effects in direct x-ray fluorescence analysis of hair (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 27-32 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The methodology of direct hair analysis by energy-dispersive x-ray fluorescence was studied. The effect on the XRF result of having a non-homogeneous radial distribution of the analyte in a single hair strand and the macroscopic effects in a bundle of hairs were calculated to evaluate possible systematic errors. The detection limits were mapped as a function of the target thickness and surface fraction. It appeared that a 10 mg cm-2 sample thickness, i. e. a target with about four layers of hair strands, is recommended. The standard deviation of this simple direct analytical method is 6-19% for some important elements. Discrepancies with neutron activation analysis had a mean value of around 15%. About twelve elements can be determined simultaneously on a routine basis.
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    Theoretical derivation of fluorescent x-ray intensities in x-ray fluorescence spectrochemical analysis (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 52-54 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The theoretical equations for primary, secondary and tertiary fluorescent x-ray intensities have been given by Shiraiwa and Fujino. However, their derivation is unsatisfactory in some respects. In this paper these problems are discussed and a more correct derivation is given.
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    A new method for matrix corrections by radioisotope excited x-ray fluorescence (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 148-149 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A method has been investigated which allows calculations of the absorption correction factors in the energy range 1.0-5.0 keV using 55Fe excitation source. From the experimentally-measured absorption factors between 6.0 and 20.0 keV using 109Cd excitation source, the coefficients at lower energies with the associated absorption jumps are generated through an iterative procedure.
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    URL: http://dx.doi.org/10.1002/xrs.1300120405
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    Evaluation of a correction method for the particle-size effect in x-ray fluorescence analysis of ‘Thin’ and monolayer samples (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 134-137 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The application limits of a correction method for the particle-size effect in x-ray fluorescence (XRF) analysis are estimated theoretically in the presented paper. This correction method requires the use of two sources of exciting γ-or x-radiation of different energies.1 The influence of the different values of the parameter t′ (which is a function of the linear absorption coefficients for primary and fluorescent radiation) and the influence of the relative standard deviation, Sr (resulting from counting statistics) have been taken into account in evaluating the efficiency of the method. In addition, the criteria for the selection of the optimum energies of the exciting radiation, the proper times of measurement and the activities of the sources of primary radiation are proposed. An example of the application of the proposed criteria to the determination of iron (as Fe3O4) is presented.
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    Surface density measurement of pure element thin films by radioisotope x-ray fluorescence spectroscopy (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 170-172 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A method for measuring the surface density of pure element thin films using x-ray fluorescence and coherent scattering of primary radiation has been developed. The accuracy is greatly improved by intensity ratio measurements where the dependence on the accuracy of the fundamental parameters is eliminated.
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    Masthead (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984) 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
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    URL: http://dx.doi.org/10.1002/xrs.1300130101
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    Consideration of an enhancement effect simplified expression in limiting cases in x-ray fluorescence analysis (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 23-26 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The problem of a simplified expression for the enhancement term of correction equations in XRF analysis was treated using the example of binaries. Attention was paid to up-to-date propositions of a solution to that problem and new cases of solutions were considered. Some common elements of these solutions were found and on the basis of a fundamental expression of enhancement effects a more general equation is given.
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    Energy-dispersive x-ray fluorescence analysis of silicate rocks for major and trace elementsAn earlier version of this paper was presented at the 12th X-Ray Spectrometry Conference, Durham, England, September 1980. (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 2-15 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The performance of an energy-dispersive x-ray fluorescence (ED-XRF) system for the analysis of silicate rocks was investigated in detail. Data are presented to demonstrate the selection of optimum excitation conditions for the major elements (Na-Fe), analysed on glass beads, and the trace elements (particularly the Rb-Nb group) analysed on powder pellets. Limitations in spectrum analysis due to overlap interferences are discussed and have largely been overcome using x-ray profile fitting software. The results show that when operated under optimum excitation conditions, ED-XRF spectrometry can routinely achieve a high degree of accuracy and precision in the analysis of a wide range of major and trace elements in silicate rocks. For many elements, 2s standard deviations are better than 2% relative. Limits of determination for many trace elements are in the range 4-10 ppm.
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    Determination of the ash content of coal by multi-element x-ray fluorescence analysis (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 151-152 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A method for determining the ash content of coal by measuring the x-ray fluorescence of Si, Al, Ca and Fe using a diffraction spectrometer is presented. The experiments were carried out on 72 samples of coal from different deposits. A mean standard deviation of the ash content of about 1. 65% was achieved.
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    PDIDENT - a set of programs for powder diffraction phase identification (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 172-179 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: PDIDENT is a collection of interactive computer programs which have been developed as aids for qualitative phase analysis of x-ray powder diffraction data. These FORTRAN IV programs are implemented on a DEC committee on Powder Diffraction Standards (JCPDS) data base is accessed by the programs along with user-created data. The data base (sets 1-32) along with all cross-index files requires 9 Mbytes of storage. The packing of the data base, use of cross-index files and the algorithms and utility of the PDIDENT programs are described.
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    Compton scattering of x-rays: Some observations (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 192-194 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A set of experimental observations pertaining to Compton scattering of low-energy x-ray photons by matrices containing very light elements is reported.
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    A fundamental parameter method for measurement of the thickness of pure element films by an EDX technique with a proportional detector (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 182-186 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Application of the fundamental parameter method to the determination of film thickness by an EDX technique with a proportional detector was performed by considering that x-rays striking the detector were composed of the following kinds: (1) the analyte line of the film excited directly by the primary beam, (2) the analyte line of the film excited secondarily by scattered or characteristic x-rays from the substrate and (3) scattered and characteristic x-rays from the substrate which passed through the film to be analysed. The intensity of all these types were considered theoretically, and the film thickness was evaluated by fitting the theoretical intensity of the x-rays striking the detector to the experimental intensity, by use of an iteration process. In addition, the accuracy of the theoretical values of intensities excited secondarily was verified by comparison with the experimental values.
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    Melted sample (glass disk) ageing and its usability for x-ray emission spectrometry (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 148-150 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The usability of glass disks prepared from blast furnace slag samples as a function of age in x-ray emission spectrometry was investigated. Glass disks were prepared by melting sample and flux mixtures (Li2B4O7-Li2CO3-La2O3, 100: 10: 5) in the ratio 1: 100 at 1100°C for 30 min. The glass disks were examined by the ISIJ test. X-ray spectrometry and scanning electron microscopy were applied directly after preparation and again after 6, 12 and 18 months. A change in the surface of the glass disk and a decrease in the Ca Kα, Si Kα and S Kα line intensities with time were observed.
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    Evaluation of dead-time corrections in EDS systems (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 2-7 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Two common methods of applying dead-time corrections in EDS systems, both of which are carried out internally in the electronics, are examined. The Barnhart method shows serious discrepancies when making dead-time corrections and in certain cases no correction is made at all. The problem is associated with the reliance on the fast amplifier to count all x-rays collected by the detector. In practice, however, the fast amplifier does not always succeed in carrying out this function since x-rays with energies 〈 1500 eV may fall below its threshold level. The problems become worse when a formvar window is substituted for beryllium since a greater proportion of low energy x-rays can now reach the detector. The magnitude of the discrepancy is shown also to be a function of specimen and electron accelerating voltage. Similar experiments with an EDS system using the Covell method show that no such discrepancies arise.
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    Forthcoming meetings & conferences (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. vi 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
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    A new source configuration for trace analysis of small samples by XRF (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 67-71 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A new geometry for a radioactive source was developed for the XRF determination of trace elements in the range 0.1-50 μg in samples with diameters from 2-5 mm. The new set-up was constructed with five 241Am (45mCi each) point sources. The shielding and configuration of the source, as well as the choice of appropriate collimators in the optimal shapes and dimensions, were investigated in detail. The study was carried out to establish the conditions for obtaining maximum sensitivity. The count rates and signal-to-background ratios were compared with those obtained with an annular source and showed an improvement of a factor of ∼2 in the signal-to-background ratio and of a factor of 2-9 in the peak intensity for the elements studied (29≤ Z ≤ 47).
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    X-ray fluorescence analysis with a linear polarized beam after bragg reflection from a flat or a curved single crystal (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 72-78 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Improvements of the detection limits in photon induced x-ray fluorescence analysis are obtained by the reduction of the radiation background using linear polarized x-rays for excitation. A single crystal where Bragg reflection takes place at an angle 20 = 90° produces linear polarized and monochromatic x-rays. The use of a single crystal instead of amorphous scattering materials increases the intensity of the polarized beam in some cases up to a factor 104. The use of curved crystals instead of standard flat crystal geometries shows a further increase in the intensity of the exciting beam in the focus line. The crystals in use for both geometries are described. Samples can be investigated in either form, liquid or solid, no special preparation technique is required. Detection limits are given for some elements, absolute amounts of 150 picogram can be detected in some cases.
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    Announcement (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. vii 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
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    URL: http://dx.doi.org/10.1002/xrs.1300120211
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    Masthead (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983) 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
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    Real time chemical analysis of phosphoric acid using energy dispersive x-ray fluorescence (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 106-110 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Energy dispersive x-ray fluorescence is shown to be an effective analytical method for determination of calcium, sulfur and phosphorous concentrations in wet process phosphoric acid. Periodic monitoring of these quantities is essential to plant operation, and is presently carried out using separate wet chemical analyses. The XRF method described here has the advantages of increased speed, of multi-element determinations from a single measurement, and of having the potential for on-line use in an automatic plant control loop.
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    Properties of intrinsic germanium detectors at low engergies by escape peak spectroscopy (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 82-86 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The study of the energy resolution and linearity of germanium, x-ray detectors at very low energies is difficult due to the degradation of the spectral line shapes resulting from incomplete charge collection in the detectors's surface dead layer. The use of low-energy, K escapes peaks obviates this difficulty as they are absorbed at depths characteristic of their full-energy parent photons. Measurements have been performed using particle-induced x-ray emission analysis of targets having characteristic K and L x-ray energies just above the Ge K-edge. The escape peaks retain pure Gaussian shapes down to the noise level of the detector and open up the possibility of a selective field of high-resolution escape-peak spectroscopy.
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    The surface geometrical structure effect in x-ray fluorescence analysis of metallic samples (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 92-96 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The results of investigations into the effect of geometrical surface structure in x-ray fluorescence analysis of Cu-Ni alloy are presented. The experimental materials were samples of spectrometric standard quality, in which surfaces were especially prepared by grinding and polishing. The surface state was estimated qualitatively, using a scanning electron microscope, and quantitatively, using a profilograph, by the determination of the roughness parameters Ra and Rz. The relationships between the roughness parameters and Cu, Ni and Si fluorescent radiation intensities, as well as the scattered radiation from the x-ray tube anode element were established. The optimum range of the surface state for a given alloy has been defined.
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    Fabrication and use of permanent monitors and standards (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 115-117 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Epoxy adhesive and aluminium powder have been used as binders to make permanent standards for x-ray fluorescence and diffraction. These standards are easy and cheap to fabricate and are very durable. They can be used as internal standards or calibration standards. Three methods of fabrication are proposed and compared.
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    X-ray spectroscopic studies of copper compounds and complexes in aqueous solution and polycrystalline form (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 128-131 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: K-absorption edge-shifts of copper in CuCl2—2H2O CuSo4—5H2O, Cu(NO3)2—3H2O, Cu(en)3Cl2, Cu(en)3SO4 and Cu(en)3(NO3)2 in aqueous solutions as well as in polycrystalline form were measured using the x-ray absorption spectroscopic technique. Effective charge on copper ions are estimated using the method of Gianturco and Coulson. The results of the present study reveal interesting results regarding the nature of chemical bonding. An attempt is made to interpret the results in the light of the available data on these samples.
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    Quantitative light element analysis using an energy dispersive detector. 1-Dead time and the low-energy spectrum (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 69-77 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A study of the low-energy region (below 1. 5 keV) of energy dispersive x-ray spectra has been carried out. Firstly, because some counting systems do not provide a reliable dead time correction, a new method of dealing with the problem is given. Next, the effects of different positioning of the energy discriminator within the analyser circuitry are discussed with reference to the consequences for light element analysis. Electronic noise counts can present a problem for analysis of x-rays of less than 300 eV and a straightforward method for noise removal is described. Finally, an unexpected artifact in the spectrum below 500 eV is identified; its size is related to the total number of counts in the spectrum and a practical method of dealing with it is demonstrated. Once the above factors have been taken into account a low energy spectrum is produced, consisting solely of characteristic x-ray lines and a true continuum background.
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    X-ray fluorescence analysis of iron ore concentrates (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 87-90 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An x-ray method has been developed for the routine determination of many elements in iron ore concentrates. The combination of a glass disk technique, the α-coefficient method of correction and solution of linear equations yields a rapid and accurate method. The determination of eight elements was performed on different certified iron ore concentrates.
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    Product news (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. viii 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
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    Masthead (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984) 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
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    URL: http://dx.doi.org/10.1002/xrs.1300130301
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    Fundamental algorithm between concentration and intensity in XRF analysis 1 - theory (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 115-120 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A new formalism is proposed to correct with accuracy the matrix effects in x-ray fluorescence (XRF) analysis. It has been deduced from Sherman's equations and includes a new algorithm between concentration and intensity, theoretically exact, and explicit expressions permitting the calculation of αij and ρij coefficients that correct for absorption and enhancement effects, respectively. In other words, the concept of correction coefficients is established on a solid theoretical basis. In the second part, it will be shown how to adapt this new formalism to practical situations. From an estimate of composition calculated by the Claisse-Quintin algorithm and an appropriate calibration, the new algorithm is used to refine the estimated composition for greater accuracy. This last approach is equivalent to the ‘fundamental parameters’ method but is presented in a simpler version adaptable to any mini-computer.
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    Spectral intensity distributions from x-ray tubes. Calculated versus experimental evaluations (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 134-141 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Apart from their general importance, an accurate definition of spectral intensity distributions from x-ray tubes is required to support the development of mathematical matrix correction procedures for x-ray fluorescence analysis. Since a direct measurement is costly, time consuming and occasionally difficult, and a purely theoretical approach is not suitable for current utilization, a simple, readily adaptable calculation procedure is very desirable. Concerning the continuum or white radiation from the x-ray tube, such an evaluation was worked out by effecting (1) a modification to Kramers' law and (2) a refinement of the absorption correction regarding the absorption by the target itself. The new equation accounts very closely for the best known, carefully measured and corrected experimental distributions by Brown et al. and Loomis and Keith. Extended experiments are required to ensure systematization, and special steps are needed for the treatment of the characteristic radiation.
    Additional Material: 15 Ill.
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    Masthead (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984) 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
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    URL: http://dx.doi.org/10.1002/xrs.1300130401
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    Study of some cobalt biomolecular complexes by x-ray absorption spectroscopy (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 153-155 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
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    Notes: The fine structure in the vicinity of the K absorption edge of cobalt in some cobalt biomolecular complexes has been studied using a bent crystal x-ray spectrograph of the Cauchois type. The average metal - ligand bond length in these complexes has been determined by applying Levy's theory.
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    Computer method for qualitative wavelength-dispersive x-ray fluorescence analysis (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 187-191 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A computer method for the qualitative analysis of fluorescence spectra recorded with any analysing crystal and using any wavelength-dispersive x-ray spectrometer is described. Originally, the programs are designed for an Olivetti P 6066 computer without being on-line with the spectrometer. These programs may, of course, also be used with slight modifications with higher capacity and on-line computers, thus making the analysis easier and faster.
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    Product news (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. vi 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
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    Editorial (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 51-51 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
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    Trace element analysis of silicates by means of energy-dispersive x-ray spectrometry (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 64-68 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Three methods for the energy-dispersive x-ray spectrometric analysis of trace elements in silicate rock samples were compared. The comparisons were based on three new USGS reference samples, DNC-1, W-2, and BIR-1, and two established reference samples, G-1 and W-1. A loose powder sample preparation was used in the analysis of selected trace elements, including Ni, Cu, Zn, Rb, Sr, Y, Zr, Nb and Ba. For one method, the ratio of analyte line intensity to either Compton or Compton and Rayleigh scatter intensity for a series of standards was used to construct calibration graphs. The other two methods involved fundamental parameter calculations which required a knowledge of the total sample compositions in order to perform the necessary matrix corrections. The results showed good accuracy for all three methods, but those obtained from the ratio-calibration graph method were slightly better than those from the other two methods.
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    Conference report (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. vi 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
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    Forthcoming meetings & conferences (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. vii 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
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    The stopping-power correction in proton-induced x-ray emission analysis (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 100-102 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The thick-target yield of characteristic x-rays from a series of gold-silver binary alloys has been determined experimentally (relative to the yield from the pure elements) under proton bombardment, using proton energies of 1. 5, 2. 0 and 2. 5 MeV. The yield per unit concentration of gold or silver varies with alloy composition because of the progressively varying effects of proton stopping power (specific energy loss) and x-ray self-absorption in the target materials. Theoretical yields have been calculated using tabulated data for stopping power and x-ray absorption. When both of these effects are taken into account, agreement with experiment is satisfactory. These results can be made the basis of stopping power and self-absorption corrections in proton-induced x-ray emission analysis.
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    Fundamental algorithm between concentration and intensity in XRF analysis 2 - practical applicationFor Part 1, see p. 115. (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 121-125 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In Part 1, a new formalism was proposed to correct with accuracy the matrix effects in XRF analysis. In this paper it is shown how to adapt this new formalism to practical situations. From an estimate of composition calculated by the Claisse-Quintin algorithm and an appropriate calibration, the new algorithm is used to refine the estimated composition for greater accuracy. This last approach is equivalent to the ‘fundamental parameters’ method but is presented in a simpler version adaptable to any mini-computer.
    Additional Material: 1 Ill.
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    Announcement (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. viii 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
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    Non-destructive measurement of gas pressures in sealed halogen lamps by x-ray spectrometry (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 170-171 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: X-ray spectrometry has been used to determine the pressure of krypton gas in high-pressure halogen auto lamps. The method employs a standard diffraction tube, a special collimator and a solid-state detector.
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    Theoretical evalution of the efficiency of compton scattered radiation method in EDXRF analysis (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 166-169 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A theoretical evaluation of the efficiency of correction for the matrix absorption effect using Compton scattered x-rays in EDXRF analysis has been carried out for thick samples and for monoenergetic primary radiation. The limitations of this correction method and the procedure for the selection of the optimum excitation energy are presented.
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    μ/ρ Algorithm valid for 1 keV ≤ E ≤ 50 keV and 11 ≤ Z ≤ 83 (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 180-181 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Mass absorption coefficients can be calculated by this algorithm with programmable pocket calculators giving a standard deviation of about 5% when compared with McMaster's tables.
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    Forthcoming meetings & conferences (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. viii 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
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    Masthead (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    Mass Spectrometry Reviews 2 (1983) 
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    ISSN: 0277-7037
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
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    URL: http://dx.doi.org/10.1002/mas.1280020101
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    Tandem mass spectrometry (MS/MS) instrumentation (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    Mass Spectrometry Reviews 2 (1983), S. 1-45 
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    ISSN: 0277-7037
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Additional Material: 12 Ill.
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    Mass resolution in mass spectrometry/mass spectrometry (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    Mass Spectrometry Reviews 2 (1983), S. 47-76 
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    ISSN: 0277-7037
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Additional Material: 23 Ill.
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    URL: http://dx.doi.org/10.1002/mas.1280020103
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    Isotope effects in fragmentationThis article is based on a lecture featured at the 30th Annual Conference on Mass Spectrometry and Allied Topics, held in Honolulu, Hawaii, in June 1982, and sponsored in cooperation with the Australian and New Zealand Society for Mass Spectrometry, the Japanese Society for Medical Mass Spectrometry, and the Mass Spectrometry Society of Japan. This lecture was the second in what it is hoped will be a series of Introductory Lectures at the Annual Conferences, the inaugural lecture having been presented in Minneapolis in 1981 (1). (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    Mass Spectrometry Reviews 2 (1983), S. 285-298 
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    ISSN: 0277-7037
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
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    Masthead (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    Mass Spectrometry Reviews 2 (1983) 
    Details
    ISSN: 0277-7037
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
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    An x-ray spectrometer with a position-sensitive wire detector (PSD) (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 47-49 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A new crystal-type x-ray spectrometer is described, which employs a position-sensitive detector for simultaneous radiation detection in a certain energy range given by the spectrometer design. The main specifications are (a) better energy resolution and (b) longer data collection times compared with an energy-dispersive spectrometer.
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    Product news (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. vi 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
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    The accuracy and precision of routine energy-dispersive electron microprobe analysis of serpentine (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 59-66 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A serpentine mineral specimen used for a standard in a Materials Analysis Company Model 400 electron microprobe equipped with a Kevex Model 5000A energy dispersive sperctrometer and an on-line Hewlett-Packard 2100 computer, was repeatedly analysed during a study of serpentinization. The results of the repeated analyses were statistically analysed and show an acceptable level of accuracy and precision. The relative and absolute errors for the serpentine standard lie within the same ranges as the errors for the other standards (forsterite, enstatite, diopside, kyanite and kaersutite) used, although the standard deviations for the serpentine analyses are slightly greater. These results are within acceptable limits and indicate that serpentine can be routinely analysed by energy dispersed analysis, using a serpentine standard for magnesium and silicon determinations, with the same accuracy but with slightly lower precision than less hydrous silicates. Most elements were present in amounts between 2 to 63 wt% of the oxide in the standards used but 0.31 wt% Al2O3 present in the serpentine standard was routinely determined with acceptable results.
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    Masthead (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983) 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
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    A new procedure of powdered sample preparation by melting for x-ray emission spectrometry (1983)
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    X-Ray Spectrometry 12 (1983), S. 8-10 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A new procedure of powder sample preparation for x-ray emission analysis by melting has been worked out in detail. The mixture sample-flux was melted and cooled in graphite crucible. The resulting glass disk was ready for direct measurement. The re-fused graphite electrode of an electric arc furnace was used as the material for the graphite crucible. The dimension and shape of the crucible bottom were determined on the basis of sample holder dimension and sample behaviour during the cooling step. The reproducibility of Kα line measurement was below 1%. Resistance of the crucible to handling and the influence of graphite on Fe Kα, Ca Kα, SKα, Si Kα and Mg Kα line intensities also were investigated.
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    Quantitative x-ray fluorescence analysis by use of fundamental influence coefficients (1983)
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    X-Ray Spectrometry 12 (1983), S. 30-37 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The rigorous relationship existing between effective fundamental coefficients, as expressed by Tertian's identities, and Sherman's basic equations for x-ray fluorescence intensities is recalled. The properties of these coefficients in the case of binary systems are described, for usual as well as for some anomalous situations, and a general, accurate hyperbolic equation is suggested to account for coefficient variation with composition. The properties of effective coefficients in the general case of multicomponent systems (alloys, etc.) are then examined, and illustrated on the typical Fe—Ni—Cr ternary system, confirming the essential exactness of this approach. As a consequence, the authors propose to make use of calculated effective coefficients to apply mathematical matrix corrections, and give a first outline of the analytical procedure.
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    Masthead (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983) 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
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    URL: http://dx.doi.org/10.1002/xrs.1300120201
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    Editorial (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 51-51 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
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    Limitations in the use of the peak-to-background method for quantitative analysis (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 33-37 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
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    Notes: The use of peak-to-background ratios has been suggested for the analysis of particles or rough surfaces as the peak-to-background ratio is assumed to be independent of geometry. The validity of this assumption is examined for flat specimens. It is shown that the peak-to-background ratio does not vary much with sample orientation but does vary with voltage, tending to a limit at high voltages. Methods of analysis using the peak-to-background ratio are proposed and the effects of fluorescence are discussed.
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    Normalization in x-ray microanalysis (1984)
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    X-Ray Spectrometry 13 (1984), S. 49-49 
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    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
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    Principles of quantitative x-ray spectrometry. R. Tertian and F. Claisse. John Wiley, New York 1982.355 pp. $39.95 (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. vii 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300130213
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    Method of spectral background evaluation using higher energy peaks in x-ray energy analysis (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 110-114 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A method for spectral background evaluation in x-ray energy analysis is proposed, based on a simple model of background generation in the detector. This model assumes that photons, of a given energy, interacting with the detector have probabilities of generating background counts within lower energy windows. The usefulness of the method resides in the fact that it allows a background evaluation with different levels of complexity and accuracy. The method also permits accurate background calculation with samples of variable mass and composition, such as biological and environmental materials.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300130305
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    Forthcoming meetings & conferences (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. v 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300130112
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    Quantitative analysis of bulk samples without standards by using peak-to-background ratios (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 159-165 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A method is described for the quantitative analysis of bulk specimens without standards by using peak-to-local background ratios in energy-dispersive electron probe microanalysis. Theoretical transport investigations have been used to derive an expression for the absolute determination of (P/B) ratios. Accurate measurement of the background below a peak is carried out without an exact knowledge of the surface geometry of the specimens. The advantages of this method are discussed in comparison with other correction procedures and the efficiency is demonstrated by means of quantitative analysis of nine binary specimens and two steel specimens.
    Additional Material: 3 Ill.
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    URL: http://dx.doi.org/10.1002/xrs.1300130407
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  • 91
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    Editorial (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 1-1 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120102
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  • 92
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    Sample analysis using gamma ray induced fluorescent x-ray emission (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 19-22 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A non-destructive method for the analysis of materials using gamma ray-induced fluorescent x-ray emission has been developed. In this method, special preparation of very thin samples in which the absorption of the incident gamma rays and the emitted fluorescent x-rays is negligible, is not needed, and the absorption correction is determined experimentally. A suitable choice of the incident gamma ray energies is made to minimise enhancement effects through selective photoionization of the elements in the sample. The method is applied to the analysis of a typical sample of the soldering material using 279 keV and 59.5 keV gamma rays from 203Hg and 241Am radioactive sources respectively. The results of the analysis are found to agree well with those obtained from the chemical analysis.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120106
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  • 93
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    Application of x-ray microprobe technique to clay minerals: Vermiculite (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 42-46 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The usual method of polishing the surface of a solid sample for examination using the x-ray microprobe technique cannot be adopted for clay minerals. A modified method is suggested and its validity is tested using vermiculite mineral. It is observed that precision of quantitative elemental analysis increases significantly according to the present pretreatment procedure; variation from values obtained by wet chemical method is 〈 1% for SiO2, MgO and Fe2O3 and 2-3% for the rest. However, values obtained with the x-ray microprobe technique vary enormously from point to point and this non-uniformity is explained in terms of the structural characteristics of the clay mineral. The variation increases with the rise in temperature of treatment due to structural modifications occurring during heat treatment. The x-ray microprobe technique has been found to be quite effective in determination of trace elements such as K and Ti.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120110
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  • 94
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    The effect of elastically scattered protons on the energy resolution of x-ray detectors in PIXE measurements (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 52-58 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Extensive use has been made of particle-induced x-ray emission (PIXE) analysis over the past several years. The optimization of its detection sensitivity calls for the judicious selection of several parameters including, inter alia, the beam energy used and the x-ray window thickness. Thin windows are required in order to detect the light elements whose x-ray energies are so low that they are heavily attenuated by any absorber material between the target and the detector. The choice of beam energy is dependant on the respective x-ray production cross-sections for elements of interest, the related background generated, as well as the associated beam energy degradation in the targets. These considerations often lead to a state where protons, elastically scattered from the target, have sufficient energy to penetrate the window and enter the x-ray detector. The extent to which such protons and their related secondary electron production affect the energy spectrum resolution of intrinsic germanium and Si(Li) x-ray detectors is demonstrated for a proton beam energy range from 2.1 to 3.5 MeV with a window thickness equivalent to the range of a 2.5 MeV proton.
    Additional Material: 11 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120203
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  • 95
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    Determination of brass composition and plating thickness on brass-plated wire and cord by x-ray fluorescence spectrometry (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 79-81 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The control of brass composition and plating weight on brass-plated steel wire and cord used as reinforcement in tyres is generally carried out by atomic absorption spectrometry, or by polarography. These methods require a mineralization of the sample and the analysis time is very long. On account of this, we have studied a direct analytical method on wires based on x-ray fluorescence spectrometry. The mathematical method we use suppresses the influence of the cord construction and allows to calculate simultaneously the composition and thickness of the brass coating. The analytical performances, i.e. repeatability, accuracy and analysis time, are better than those prevailing with atomic absorption spectrometry or differential pulse polarography. Moreover, by dispensing with mineralization of the sample, XRFS is particularly well-fitted for a routine control in production.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120207
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  • 96
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    Erratum (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. vii 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120212
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  • 97
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    Editorial (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 91-91 
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    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120302
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  • 98
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    Automated matrix-correction of line ratios in energy-dispersive x-ray fluorescence spectrum deconvolution (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 111-114 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Most computer XRF-spectrum deconvolution routines make use of fixed intensity ratios for the lines from one element. The magnitude of the error that fixed ratios imply has been quantitatively evaluated for samples with a varible thickness or matrix. A procedure for routinely adapting the line ratios according to the matrix effect in every sample (by making use of the matrix information present in the scatter peaks) enhances the accuracy of the spectrum evaluation.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120306
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  • 99
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    Forthcoming meetings & conferences (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 132-132 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120311
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  • 100
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    Editorial (1983)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 12 (1983), S. 133-133 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300120402
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