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  • 11
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 5020-5020 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Conventional techniques of magnetic domain imaging are usually not selective with respect to the chemical species in a system under investigation. This limitation can be overcome by employing soft x-ray magnetic dichroism which combines both magnetic sensitivity and chemical selectivity. We present first results on magnetic domain imaging at surfaces obtained with a newly developed photoelectron emission microscope using magnetic circular dichroism (MCD). Topographic studies on a silicon surface showed the instrument to be capable of a lateral resolution of better than 50 nm. Two approaches of separating chemical and magnetic information are demonstrated for Permalloy micropatterns on silicon. First, the lateral distribution of the different chemical species or the magnetic domains is obtained by subtracting images taken at different photon energies (spectromicroscopy). Second, a "small spot" mode permits the acquisition of x-ray absorption spectra from surface areas of less than 2 μm diameter. The latter technique is called microspectroscopy. On a Fe(100) whisker surface we observed magnetic domains with domain boundaries ∼300 nm wide. This value corresponds to the intrinsic width of a 180° domain wall at the surface, as determined by scanning electron microscopy with spin polarization analysis.1 The studies in Ref. 1 have also shown that this kind of domain wall behaves Neél-like at the surface, i.e., the magnetization vector M rotates within the film plane over the domain boundary. Exploiting the directional characteristics of MCD we can map the component of M normal to the domain boundary and thus selectively image the wall itself. © 1997 American Institute of Physics.
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  • 12
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 6186-6188 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetization behavior of ultrathin (3 ML) epitaxial Co(001) films on Cu(1 1 13) terraced surfaces was studied in situ using magneto-optic Kerr effect. The films show easy magnetization along the steps. Unusual hard axis Kerr loops (H perpendicular to the steps and in the surface plane) are observed near room temperature and evolve at higher temperature (127 °C) toward the soft magnetic behavior more typical of the easy axis loops observed on the same films. A model is postulated for the behavior that includes a fourfold in-plane anisotropy and a uniaxial in-plane anisotropy of possibly magnetoelastic (ME) or magnetostatic (MS) origin.
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  • 13
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 5003-5003 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The spin-polarized electronic structure of the fcc high-temperature modification of cobalt has not been investigated yet, because of the experimental difficulties of photoemission at high temperature. We stabilized fcc Co by molecular-beam epitaxy on a Cu(100) substrate with large, atomically flat terasses (0.5–1 μm wide) as revealed by STM. The structure of the layers was studied by LEED and MEED, showing a tetragonal distortion of the fcc lattice perpendicular to the (100) surface plane. The dispersion of the exchange split bands perpendicular to the surface was determined for a 5-monolayer-thick sample (tetragonal distortion on average 4%–5%) by spin- and momentum-resolved photoemission. The results are compared to two relativistic spin-polarized band-structure calculations for fcc cobalt. Somewhat surprisingly, even a 5-ML-thick sample shows three-dimensional dispersion in good agreement with the calculations, as far as the average exchange splitting (1.2±0.2 eV), and the symmetry character of the bands is concerned. There are, however, some systematic deviations of minority bands near the Fermi energy which are attributed to the tetragonal compression.
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  • 14
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 85 (1999), S. 7362-7369 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The dielectric and insulating properties of epitaxial SrTiO3(STO) thin film capacitors were studied. The films were grown by inverted cylindrical magnetron sputtering in the radio frequency mode on (100) STO substrates which were covered with a (001)-oriented YBa2Cu3O7−x (YBCO) layer as a ground electrode. As a top electrode we used YBCO or Au thin films. A high dielectric constant, ε, of up to 5000 was observed at T=80 K. The capacitors revealed a large tunability, i.e., a nonlinear ε(E) dependence, with respect to voltage biasing. By applying 3 V, ε decreased to 1000 which was 20% of its maximum value. The frequency dependence of ε, the temperature dependence of the dielectric loss factor, tan δ, and the direct currency conductivity reflected that variable range hopping via localized states was present and dominated the conduction process in the STO films at low temperatures. The field strength for the electrical breakdown amounted to 300 kV/cm even for rather thin films with a thickness of about 40 nm. Below T=90 K, the STO films were ferroelectric with a high polarization of up to 30 μC/cm2 at T=4.2 K. The ferroelectric phase transition was found to be of second order and of the displacive type. © 1999 American Institute of Physics.
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  • 15
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 2496-2497 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe a setup for the measurement of thin-film magnetostriction λ which utilizes a sensitive laser-optical measurement of the substrate bending in magnetic fields up to 530 kA/m. The sensitivity reaches, e.g., for a 10 nm thick film on a 100 μm thick Si substrate, λ=5×10−8, which corresponds to a total substrate deflection on the order of 0.1 nm. The performance is tested with Co thin films of different thicknesses and annealing states. © 2001 American Institute of Physics.
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  • 16
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 57 (1985), S. 1812-1815 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We conducted an experiment to study the growth kintetics of the oxidation-induced stacking faults (OSF) of n- and p-type (100) and (111) Si wafers with resistivities of 0.8–15 Ω cm. The OSF size data are as expected for the p-type (100) and (111) wafers as well as for the n-type (100) wafers. For the n-type (111) 0.8–2 Ω cm wafers, however, no OSF were generated at a temperature higher than ∼1100 °C and those grown at 1050 °C are considerably smaller than expected. This indicates that in the n-type (111) wafers there exists a mechanism that depletes Si self-interstitials, in addition to the normal mechanism of interstitial injection. Obviously, the effect is dependent on orientation as well as on doping. The same kind of effect was found before via diffusion studies, which, however, did not appear as doping dependent. We propose that this discrepancy is apparently due to the fact that, in one diffusion experiment, p+ (111) materials (Ga implanted to a concentration exceeding 1020 cm−3) were oxidized.
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  • 17
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 57 (1985), S. 4198-4200 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A magnetoelastic model described previously has been computer programmed to allow averaging over polycrystalline grain orientations and integration of susceptibility to predict magnetization changes. In magnetoelastic (field and stress, H–σ) processes, Brown's effective field due to stress on 90° domain walls has been extended with the differential susceptibility to describe magnetization changes in σH, σσ¯H, Hσ∼, and HH¯σ∼ processes for coercive fields and stresses: magnetization in the σH process initially exceeds and then drops below that due to H alone. Susceptibility in the σσ¯H process is predicted and was observed to be first higher and then lower than for H alone. Magnetoelastic sensitivity, H(σσ¯)n, was observed to increase with magnetization as predicted by this model and by Bozorth. No Villari reversal was observed.
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  • 18
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Journal of the American Chemical Society 78 (1956), S. 3870-3871 
    ISSN: 1520-5126
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
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  • 19
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 61 (1957), S. 991-994 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
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  • 20
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 358-360 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The evolution of electrical resistance, stress, and microstructure during annealing has been studied on 100 nm NiFe(20 wt %)/200 nm Cu/100 nm NiFe trilayers. Irreversible resistance changes and the concentration-depth profiles show that, at and above 200 °C, diffusion of Ni into Cu as well as of Cu into NiFe occurs. The interdiffusion is held for an important failure mechanism of Cu/NiFe-based magnetoelectronic system at elevated temperatures. © 2000 American Institute of Physics.
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