Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
79 (1996), S. 3619-3621
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The electronic structure of silicon rods has been studied by means of the tight-binding recursion method to investigate the dependence of the energy gap (Eg) on a rod length and the direction of the rod axis. An empirical expression for Eg is derived from numerical results for the rods in 〈100〉, 〈110〉, and 〈111〉 directions. This expression is applicable to the energy gaps of wires and crystallites, which can be regarded as limiting cases of rods. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.361416
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