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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 14 (1992), S. 881-902 
    ISSN: 0392-6737
    Keywords: Conductivity phenomena in semiconductors and insulators ; Organics semiconductors ; Semiempirical NDO calculations (CNDO, INDO, MINDO, PCILO methods, etc.)
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Summary The dielectric and electronic properties of thianthren (C6H4(S)2H4C6) are determined by means of optical reflectivity, absorption measurements and reflection electron energy loss spectroscopy. The experimental results are interpreted on the basis of a Complete Neglect of Differential Overlap (CNDO) calculation used in three different parametrization schemes. Emphasis is laid on the discussion of the problems which generally affect the analysis of electron energy loss spectra, and a procedure to obtain the complex dielectric function from electron energy loss measurements performed in the reflection mode is suggested.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 6 (1985), S. 93-104 
    ISSN: 0392-6737
    Keywords: Conductivity phenomena in semiconductors and insulators
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Description / Table of Contents: Riassunto Si sono eseguite misure di conducibilità, fotoconducibilità e potere termoelettrico in funzione della temperatura su una serie di film di silicio amorfo idrogenato drogati con fosforo e boro. I risultati sono stati interpretati sulla base di un modello che prevede due distinti meccanismi di transporto: nella regione ad alta temperatura attraverso stati estesi di banda, in quella a bassa temperatura con conduzione di tipo «hopping» in una banda d'impurezze la cui densità degli stati aumenta al crescere del contenuto di drogante. Si è anche osservato uno spostamento del livello di Fermi fino a 0.4 eV, verso le soglie di mobilità e una forte dipendenza della fotoconducibilità al variare del tipo e della quantità di drogante.
    Abstract: Резюме(*) Провенеды измерения проводимости фотопропроводимости и термоэлектрической силы в зависимости от температуры для ряда a-Si: Н пленок ри n-типа, приготовленных с помощью метода испарения. Результаты объясняются с помощью модели, включающей два механизма проводимости: в области высоких температур через растянутые зонные состонния, а в области низких температур через зону примеси, для которой плотность состояний увеличивается с увеличением содержания легирующей примеси. Обнаружен сдвиг уровня Ферми до 0.4 эВ для обоих типов легирующих примесей. Кроме того, легирование фосфором быстро увеличивает фотопроводимость на два порядка, тогда как легирование бором уменьшает фотопроводимость.
    Notes: Summary Conductivity, photoconductivity and thermopower measurements have been made as functions of temperature on a series of p- and n-type a-Si: H films prepared by a reactive, evaporation method. The results have been fitted with a model including two conduction paths: in the high-temperature range through extended band states and in the low-temperature range as hopping in an impurity band, whose density of states increases with increasing dopant content. A shift of the Fermi level up to 0.4 eV towards the mobility edges for both types of dopants has been found. Moreover, phosphorus doping radiply increases the photoconductivity values by about two orders of magnitude, while boron incorporation causes considerable reduction.
    Type of Medium: Electronic Resource
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