ISSN:
1432-0630
Schlagwort(e):
07.60
;
42.80
Quelle:
Springer Online Journal Archives 1860-2000
Thema:
Maschinenbau
,
Physik
Notizen:
Abstract An optical characterization of thin semiconducting multilayers in the infrared range, using a combination ofm-lines and reflection spectroscopy techniques is exposed. Such a method, non-destructive, allows to determine the thickness and the refractive index of each component of a multilayer multimodal planar waveguide.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1007/BF00617709
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