ISSN:
1432-0630
Keywords:
07.60
;
42.80
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract An optical characterization of thin semiconducting multilayers in the infrared range, using a combination ofm-lines and reflection spectroscopy techniques is exposed. Such a method, non-destructive, allows to determine the thickness and the refractive index of each component of a multilayer multimodal planar waveguide.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00617709
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