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  • American Institute of Physics (AIP)  (3)
  • 1
    Electronic Resource
    Electronic Resource
    Effects and loss of lead in doped Bi-Sr-Ca-Cu-O films (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 1929-1931 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Films of Bi-Sr-Ca-Cu-O, with and without lead doping, were prepared by rf magnetron sputtering of oxide targets. The films were annealed in oxygen for varying durations and characterized by electron microprobe and x-ray diffraction. The results show a drastic loss of lead during annealing. Films with the lead-enhanced Bi2Sr2Ca2Cu3Oy (2223) phase had no detectable lead after annealing. The films were seen to grow in stages of 2201, 2212, and finally 2223 phases. The lead affected film development through these stages.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.101499
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    A scanning tunneling microscope study of a palladium sphere in hydrogen gas: Expansion and surface topology (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 4054-4060 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A scanning tunneling microscope monitored the time dependence of both the expansion and surface morphology changes of 1–2 mm palladium spheres exposed to 0.5 atm hydrogen gas. The surfaces were initially smooth except for 2–10 nm high steps separating flat terraces 50–150 nm wide. Spheres exposed to hydrogen expanded, during which time the surface buckled forming 30–50-nm-deep and 1000-nm-wide features and the step structures vanished. There were two distinct regimes in the expansion: 25%–30% of the total expansion occurred in the first regime, which only lasted about 5% of the time required to reach 90% of the total expansion; and in the second regime the sphere asymptotically approached the final size. Some samples took ∼500 h to expand, but other samples with only slightly different surface morphology expanded in as little as 8 h. We developed a quantitative model describing the time dependence of the observed expansion in the asymptotic regime by assuming the eventual formation of β-Pd hydride and the elastic properties of the material. The model also suggested the cause of the surface buckling.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358449
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    A scanning force microscope with a fiber-optic-interferometer displacement sensor (1991)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 62 (1991), S. 1280-1284 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We present a simple optic-fiber displacement sensor for a scanning force microscope (SFM). The design minimizes the alignment difficulties after a cantilever is changed and is easily adaptable to tube scanners so very compact SFM designs should be possible for imaging at low temperatures or in strong magnetic fields. We also provide a theoretical analysis and results to show that the sensitivity of the device can be improved by increasing the reflectivity of the fiber end. The increased sensitivity makes it possible to work under fluids.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1142485
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