ISSN:
1432-0630
Schlagwort(e):
77
;
42.80
Quelle:
Springer Online Journal Archives 1860-2000
Thema:
Maschinenbau
,
Physik
Notizen:
Abstract The dielectric constant of a PbTe epitaxial layer has been measured by surface wave spectroscopy using an optically pumped far-infrared laser and the technique of attenuated total reflection.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1007/BF00618699
Permalink