Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
69 (1998), S. 3558-3562
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We describe a torque magnetometer for use at low temperatures based on a high-Q silicon torsional oscillator. The oscillator is fabricated using standard lithographic techniques from a single-crystal silicon wafer. The sample stage of the oscillator has an area of 0.57 cm2 and is suitable for deposition of thin magnetic film samples. Oscillator motion is detected through a capacitance measurement. The small torsion constant of the oscillator combined with a Q value 〉106 allow detection of magnetic moments as small as 10−13 A m2. Magnetometer sensitivity is measured using small superconducting open cylinders machined from aluminum. © 1998 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1149137
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