ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We have implemented a Wolter-type x-ray optic in a high- (22×) magnification microscope on Nova. We report on the on-line characterization of this system and show results from the several types of experiments performed. The point spread function, contrast transfer function at selected spatial frequencies, x-ray throughput, alignment accuracy, and field of view have all been measured as configured for Nova experiments. Such characterization may be used to remove the degradation introduced by the instrument. This work was performed under the auspices of the U.S. DOE by the Lawrence Livermore National Laboratory under Contract No. W-7405-ENG-48.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1140085
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