Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
71 (1992), S. 362-365
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We have studied the growth, structural properties, and magnetoresistance of Fe/Cr superlattices on Ge(100) substrates. The Fe/Cr superlattices were found to grow bcc(100) and epitaxially aligned. From Rutherford backscattering (RBS) and reflection high energy electron diffraction it is found that some intermixing occurs at the Ge–Fe interface. Using low energy electron diffraction, transmission electron microscopy, x-ray diffraction and RBS it is shown that Fe/Cr superlattices grow epitaxially matched on Ge(100) and have flat and sharp interfaces. We investigated for Fe/Cr on Ge(100) the magnetoresistance as a function of Cr interlayer thickness tCr=8–14 A(ring). The maximum value is found for tCr=12 A(ring) (ΔR/RS=15% at room temperature, ΔR/RS=95% at 4 K). A comparison is made with multilayers of the same composition, deposited on glass substrates.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.350716
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