ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Focusing optics have been installed on the 5.0 T Wiggler beam line of the SRS at Daresbury Laboratory for use with x-ray diffraction measurements of surfaces and interfaces. A significant increase in the flux has been achieved without excessive degradation of the resolution in the vertical plane. The full width at half-maximum of the focused image compares well with the predictions of ray tracing analysis.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1143207
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