ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A high-intensity, charged-particle-induced x-ray (PIXE) source has been developed for the purpose of characterizing x-ray detectors and optics, and measuring filter transmissions. With energetic proton beams up to 165 keV, intense line x radiations (0.5 A(ring)≤λ≤111 A(ring)) have been generated from the K, L, M, and N shells of elements 4≤Z≤92. The PIXE spectrum has orders-of-magnitude lower background continuum than a conventional electron beam or radioactive α-fluorescence source [C. K. Li, R. D. Petrasso, K. W. Wenzel et al. (to be published)].
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1143578
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