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  • American Institute of Physics (AIP)  (5)
  • Blackwell Publishing Ltd
  • 1985-1989  (5)
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Year
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 2113-2121 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: To investigate the effects of microstructure of the Schottky characteristics of WSix contacts to n-type GaAs, cross-sectional transmission electron microscopy, x-ray diffraction, and secondary-ion mass spectrometry have been used to study the interfacial and bulk film microstructures. The barrier heights and ideality factors of WSi0.1 and WSi0.6 contacts were obtained by forward current-voltage and capacitance-voltage measurements. These Schottky characteristics were found to be unrelated to the bulk film microstructure, but closely related to the interfacial microstructure at the WSix/GaAs interfaces. Both the WSi0.1/GaAs and WSi0.6/GaAs interface morphologies were observed to be stable and remain smooth during annealing at 800 °C for 10 min, while a rough interface with W protrusions and Ga and As out-diffusion was observed in two-layer W/WSi0.6 contacts. The stability of the WSix interfacial microstructure is suggested to depend on both the chemical stability of the WSix films with GaAs and the intervening oxides between WSix and GaAs. Nontrivial amounts of W and Si were observed to diffuse from the WSi0.1 film into the GaAs substrate during annealing at 800 °C for 10 min. Although these in-diffused impurities in the GaAs substrate do not seem to affect the Schottky characteristics after the 800 °C annealing, they could be a potential problem in long-term stability. Of the three WSix film compositions, the single-layer WSi0.6 films were found to have the least W and Si in-diffusion and thus the best thermal stability.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 57 (1986), S. 1816-1818 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A two-dimensional Thomson scattering system is being designed for the Advanced Toroidal Facility (ATF) torsatron experiment. This system will provide electron temperature and density measurements at 15 points along a vertical chord with each shot from a two-dimensional Te and ne map of an ATF toroidal cross section can be obtained. The horizontal Thomson scattering viewing port is offset by 15° toriodally from the ports passing the vertical laser beam. Translating and rotating mirors will be used to relay light from the viewing port to the collection lens. This makes it possible to scan horizontally, view as much of the vertical laser beam as possible, and to use a fixed focal length, fixed position lens. Three sets of spectrometers optimized to three temperature ranges will be used. At the output of each spectrometer, dispersed light will be detected by an array of five, seven, or eight photomultiplier tubes, depending on the temperature range of the spectrometer.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The beam from an electron gun was used to trace flux surfaces in the Advanced Toroidal Facility (ATF) torsatron. The ATF magnetic field was run steady state at 0.1 T, and the electron beam was detected optically with an image-intensified, solid-state camera when it impinged on a phosphor-coated screen. Closed flux surfaces and islands at several low-order resonances were observed. The largest island, located at the ι= 1/2 surface, was from 5 to 6 cm in width, and its presence implied the existence of magnetic field errors. To determine if these error fields could be traced to small misalignments of the magnetic coils, a device capable of accurately measuring the radial and vertical magnetic field components of individual coil sets was placed in the center of ATF. This device allowed for a determination of the precise location of each of the coils that make up the ATF coil set. No significant coil misalignments were found. A further investigation of the coil configuration led to the identification of dipole fields in the helical field coil leads as the source of the field errors. The techniques developed in making these measurements are described in the text.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 57 (1986), S. 1819-1821 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: One of the major problems in Thomson scattering measurement of electron temperature is the suppression of stray light. Filters of AR-coated ruby with a high-percentage doping of Cr have been produced for use on SCATPAK II. The filters have negligible attenuation of the signal above 7000 A(ring) and attenuate light at the laser line by a factor of (approximately-equal-to)9. Experimental details of the filter performance, design, and fabrication are presented. The filter performance is compared with experimental measurements of the Cr-in-sapphire absorption cross section at the R1 line. Ruby filters present a cost-effective method of stray light suppression for experiments using ruby lasers and the red-shifted portion of the scattered spectrum.
    Type of Medium: Electronic Resource
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  • 5
    ISSN: 1089-7666
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Wave absorption in the ISX-B tokamak [Phys. Rev. Lett. 44, 647 (1980)] at the second harmonic (ω=2ωce) of the electron-cyclotron frequency is reported. Measurements of the absorption of a wave polarized in the extraordinary mode and propagating perpendicular to the toroidal magnetic field are in agreement with computations.
    Type of Medium: Electronic Resource
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