ISSN:
1432-0630
Keywords:
PACS: 74.76.Bz; 74.72.Jt; 74.62.Bf
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract. The growth of SmBa2Cu3O7-x superconducting thin films by off-axis pulsed laser deposition on different substrates (SrTiO3, MgO, LaAlO3, and YSZ) has been analyzed by means of resistance vs. temperature and X-ray diffraction measurements. The onset and width of the resistive transition depend on the substrate type and are in the ranges (89–80) K and (1–9) K, respectively. X-ray diffraction spectra show only the 00l reflections, from which the lattice parameter c can be estimated. Moreover, the rocking curves of the 005 peaks give an indication of the films’ crystallinity and oxygen stoichiometry.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/s003390051473
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