Publication Date:
2011-08-09
Description:
Author(s): H. T. Nembach, T. J. Silva, J. M. Shaw, M. L. Schneider, M. J. Carey, S. Maat, and J. R. Childress X-ray diffraction (XRD), magnetometry, and ferromagnetic resonance (FMR) measurements were performed on sputtered thin films of the nominal Heusler alloy (Co 2 Mn) 1− x Ge x with varying Ge content and annealing temperatures. XRD indicates some degree of B2 alloy formation, with strong (110) texturing. FM... [Phys. Rev. B 84, 054424] Published Mon Aug 08, 2011
Keywords:
Magnetism
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics