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Scanning force microscope and vacuum chamber for the study of ice films: Design and first results (1998)

Bluhm, H. ; Pan, S. H. ; Xu, L. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 69 (1998), S. 1781-1784

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: We present the design of a scanning force microscope and vacuum chamber for the growth and imaging of ice films in thermodynamic equilibrium and under controlled super or undersaturation. The apparatus allows measurements in the temperature range from −60 to +80 °C in a controlled water vapor atmosphere. First results on the morphology and the frictional properties of thin ice films on mica cleavage faces are presented. The films are found to grow in a two-dimensional manner, often exhibiting dendritic growth shapes. The lateral force measured on ice is higher than that observed on the surrounding substrate. © 1998 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1148841

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