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  • 1
    Electronic Resource
    Electronic Resource
    Viscoelastic and electrical properties of self-assembled monolayers on gold (111) films (1993)
    s.l. : American Chemical Society
    Langmuir 9 (1993), S. 3600-3611 
    Details
    ISSN: 1520-5827
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/la00036a041
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  • 2
    Electronic Resource
    Electronic Resource
    Nanometer scale mechanical properties of gold(111) thin films (1992)
    s.l. : American Chemical Society
    Langmuir 8 (1992), S. 2832-2842 
    Details
    ISSN: 1520-5827
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/la00047a041
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  • 3
    Electronic Resource
    Electronic Resource
    Subsurface impurities in Pd(111) studied by scanning tunneling microscopy (2001)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 115 (2001), S. 10927-10934 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Low concentrations of three distinct impurity species beneath the Pd(111) surface are studied by STM. The subsurface impurities are distinguished by their image contrast, diffusion properties, and interactions with adsorbed molecules. Isolated subsurface impurities appear at low gap resistance (〈(approximate) MΩ) as three-fold symmetric modulations of the Pd 1×1 surface corrugation. One impurity type is found to occupy substitutional sites in the layer below the surface. Based on Auger spectroscopy this species is identified as sulfur. The other two species are found to occupy octahedral interstitial sites immediately below the surface layer. Two-dimensional diffusion of the interstitial impurities occurs below room temperature. The onset temperature for diffusion is lowered dramatically in the presence of surface adsorbates. Quantitative measures of the diffusion barriers are consistent with surface facilitated diffusion of interstitial oxygen and carbon atoms. The mobile impurities interact with adsorbed atoms and molecules, limiting surface diffusion, nucleating island growth, and serving as active sites for surface reactions. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1420732
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  • 4
    Electronic Resource
    Electronic Resource
    Coadsorbate induced compression of sulfur overlayers on Re(0001) and Pt(111) by CO (1994)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 100 (1994), S. 6092-6097 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Low coverages of sulfur chemisorbed on the rhenium(0001) and platinum(111) surfaces were studied in UHV by scanning tunneling microscopy (STM) and low-energy electron diffraction (LEED). On both of these surfaces of triangular symmetry the lowest coverage (≈0.25 monolayers) ordered structure is p(2×2). Exposure of this ordered sulfur overlayer on either surface to low pressures (10−9 Torr) of CO induces compression of the sulfur layer to a structure associated with a higher local coverage and CO chemisorbs in the holes created in the sulfur layer. The reordering was observed by both a change in the LEED pattern and by real space STM imaging of the surface. On the Re surface the new overlayer has (3(square root of)3×3(square root of)3)R30° symmetry, while on the Pt surface it has ((square root of)3×(square root of)3)R30° symmetry. There was no increase in the amount of sulfur on the surface during this reordering. On both surfaces the overlayers could be returned to the original p(2×2) by annealing for several seconds at 600 °C, during which CO desorbs and sulfur atoms reoccupy the vacant metal sites. This phenomenon of the compression of atoms in a strongly chemisorbed layer upon coadsorption of another molecule provides a mechanism for carrying out catalytic reactions on metal surfaces that are covered with strongly chemisorbed layers that do not participate in the reaction.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.467121
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  • 5
    Electronic Resource
    Electronic Resource
    Dissociative hydrogen adsorption on palladium requires aggregates of three or more vacancies (2003)
    [s.l.] : Macmillian Magazines Ltd.
    Nature 422 (2003), S. 705-707 
    Details
    ISSN: 1476-4687
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Notes: [Auszug] During reaction, a catalyst surface usually interacts with a constantly fluctuating mix of reactants, products, ‘spectators’ that do not participate in the reaction, and species that either promote or inhibit the activity of the catalyst. How molecules adsorb and dissociate under ...
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1038/nature01557
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  • 6
    Electronic Resource
    Electronic Resource
    A new system for LEED intensity measurements using a real-time digital video processor (1986)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 57 (1986), S. 3012-3018 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new system for low-energy electron diffraction (LEED) intensity measurements has been developed using a video camera and digital processing of the video signal. Complete two-dimensional LEED patterns are digitized in real time with high resolution using a commercial video processor. Intensity-voltage (I-V) data on all beams in complex LEED patterns are collected simultaneously. A microcomputer analysis program automatically tracks the diffraction beams as a function of energy and calculates beam position, size, and integrated intensity, including a local background correction. Using a video tape recorder for intermediate data storage, a complete set of I-V curves can be collected in less than 100 s.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1138983
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  • 7
    Electronic Resource
    Electronic Resource
    Calibration of frictional forces in atomic force microscopy (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3298-3306 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The atomic force microscope can provide information on the atomic-level frictional properties of surfaces, but reproducible quantitative measurements are difficult to obtain. Parameters that are either unknown or difficult to precisely measure include the normal and lateral cantilever force constants (particularly with microfabricated cantilevers), the tip height, the deflection sensor response, and the tip structure and composition at the tip-surface contact. We present an in situ experimental procedure to determine the response of a cantilever to lateral forces in terms of its normal force response. This procedure is quite general. It will work with any type of deflection sensor and does not require the knowledge or direct measurement of the lever dimensions or the tip height. In addition, the shape of the tip apex can be determined. We also discuss a number of specific issues related to force and friction measurements using optical lever deflection sensing. We present experimental results on the lateral force response of commercially available V-shaped cantilevers. Our results are consistent with estimates of lever mechanical properties using continuum elasticity theory. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147411
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  • 8
    Electronic Resource
    Electronic Resource
    Design consideration in an ultrafast scanning tunneling microscope (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 4130-4134 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe an ultrafast scanning tunneling microscope (USTM) with picosecond temporal resolution. We present results of single-point ultrafast tunneling measurements and outline some of the methods and pitfalls in USTM. Ultimately, the technique has the potential to create picosecond scale movies of surface phenomena with atomic spatial resolution. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145359
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  • 9
    Electronic Resource
    Electronic Resource
    A variable temperature ultrahigh vacuum atomic force microscope (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 5266-5271 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new atomic force microscope (AFM) that operates in ultrahigh vacuum (UHV) is described. The sample is held fixed with spring clamps while the AMF cantilever and deflection sensor are scanned above it. Thus, the sample is easily coupled to a liquid nitrogen cooled thermal reservoir which allows AFM operation from ≈100 K to room temperature. AFM operation above room temperature is also possible. The microscope head is capable of coarse x-y positioning over millimeter distances so that AFM images can be taken virtually anywhere upon a macroscopic sample. The optical beam deflection scheme is used for detection, allowing simultaneous normal and lateral force measurements. The sample can be transferred from the AFM stage to a low energy electron diffraction/Auger electron spectrometer stage for surface analysis. Atomic lattice resolution AFM images taken in UHV are presented at 110, 296, and 430 K. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146097
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  • 10
    Electronic Resource
    Electronic Resource
    Scanning force microscope and vacuum chamber for the study of ice films: Design and first results (1998)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 1781-1784 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We present the design of a scanning force microscope and vacuum chamber for the growth and imaging of ice films in thermodynamic equilibrium and under controlled super or undersaturation. The apparatus allows measurements in the temperature range from −60 to +80 °C in a controlled water vapor atmosphere. First results on the morphology and the frictional properties of thin ice films on mica cleavage faces are presented. The films are found to grow in a two-dimensional manner, often exhibiting dendritic growth shapes. The lateral force measured on ice is higher than that observed on the surrounding substrate. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148841
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