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Dependence of the x-ray photoacoustic signal intensity of copper on sample thickness and modulation frequency (1992)

Toyoda, Taro ; Masujima, T. ; Shiwaku, H. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 72 (1992), S. 5187-5189

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: The hard x-ray photoacoustic signal intensities of copper have been measured at an x-ray absorption near-edge structure (XANES) region as functions of sample thickness (from 5 to 300 μm) and modulation frequency (from 5 to 50 Hz). It is shown that the photoacoustic signal intensities show maxima at the sample thickness close to 10 μm for each modulation frequency. The x-ray photoacoustic signal varies from f−1.0 ( f denotes modulation frequency) up to 20 μm sample thickness, whereas it varies from f−0.5 beyond a 20 μm sample thickness, which is not consistent with the Rosencwaig–Gersho theory for the photoacoustic effect in solids.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.351999

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