Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
63 (1988), S. 5166-5168
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
In WO3 thin films the optical dispersion parameters (single-oscillator energy E0 and dispersion energy Ed developed by Wemple and DiDomenico [Phys. Rev. B 3, 1338 (1971)]) have been analyzed in the sample thickness range 100–1000 nm using the experimental results by Davazoglou and Donnadieu [Thin Solid Films 147, 131 (1987)]. The single-oscillator energy E0 exhibits no thickness dependence in three different oxidation modes (mode 1: annealed at 600 °C in air; mode 2: annealed at 500 °C in air; mode 3: annealed at 500 °C in oxygen). The dispersion energy Ed exhibits a large thickness dependence for all modes, which shows the difference in the sample preparations.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.340420
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