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Improvement of electron microscope images by the direct phasing method (1982)

Ishizuka, K. ; Miyazaki, M. ; Uyeda, N.

[S.l.] : International Union of Crystallography (IUCr)

Acta crystallographica 38 (1982), S. 408-413

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ISSN: 1600-5724

Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Topics: Chemistry and Pharmacology , Geosciences , Physics

Notes: The resolution improvement and/or phase correction method devised for X-ray crystallography has been developed within the weak-scattering approximation for electron crystallography. Here the information of electron micrography and electron diffraction can be effectively combined. The usefulness of this method to improve the resolution and to improve the image quality has been demonstrated by test calculations. This method will be effective for radiation-sensitive materials, because it can work with only one micrograph and the diffraction data.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1107/S056773948200093X

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