Improvement of electron microscope images by the direct phasing method

The resolution improvement and/or phase correction method devised for X-ray crystallography has been developed within the weak-scattering approximation for electron crystallography. Here the information of electron micrography and electron diffraction can be effectively combined. The usefulness of this method to improve the resolution and to improve the image quality has been demonstrated by test calculations. This method will be effective for radiation-sensitive materials, because it can work with only one micrograph and the diffraction data.