Electronic Resource
Springer
Fresenius' journal of analytical chemistry
364 (1999), S. 385-390
ISSN:
1432-1130
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
Notes:
Abstract Contamination in semiconductor industry is a very serious drawback during the production of integrated circuits. Connected with the ongoing miniaturization smaller and smaller amounts of metal contamination can effect the integrated circuits. Because of the outstanding detection limits ICP-MS is widely spread in semiconductor industry. The main applications are metal and semi-metal analysis in deionized water, chemicals and on the wafer surface. The challenges in semiconductor industry are the required detection limits, which are mainly limited by contamination during sample treatment and the background of the instruments.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/s002160051355
|
Location |
Call Number |
Expected |
Availability |