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Tensor permittivity measurements of thin films at millimeter wavelengths (1988)

Zhao, Jing-Fu ; Stephan, Karl D. ; Wong, Sai-Chu ; [et al.]

Springer

International journal of infrared and millimeter waves 9 (1988), S. 1093-1105

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ISSN: 1572-9559

Source: Springer Online Journal Archives 1860-2000

Topics: Physics

Notes: Abstract Although thin dielectric films are finding more applications in microwave and millimeter-wave circuits, measurement of their dielectric properties presents some unique problems, especially if the films are anisotropic and properly characterized by a permitivity tensor. We have developed a folded open-cavity resonator to aid in the determination of the three tensor permittivity matrix elements of anisotropic thin films with thicknesses in the range 25–100 μm. A description of the method is followed by data on stretched polyethylene terephthalate at 35 GHz.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF01009303

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