Electronic Resource
Springer
International journal of infrared and millimeter waves
9 (1988), S. 1093-1105
ISSN:
1572-9559
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract Although thin dielectric films are finding more applications in microwave and millimeter-wave circuits, measurement of their dielectric properties presents some unique problems, especially if the films are anisotropic and properly characterized by a permitivity tensor. We have developed a folded open-cavity resonator to aid in the determination of the three tensor permittivity matrix elements of anisotropic thin films with thicknesses in the range 25–100 μm. A description of the method is followed by data on stretched polyethylene terephthalate at 35 GHz.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01009303
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