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  • 1
    Electronic Resource
    Electronic Resource
    An apple II based datasystem for AES depth profiling on a varian spectrometer (1985)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 7 (1985), S. 150-154 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A description is given of an Apple II based Auger spectroscopy datasystem specifically designed for depth profiling applications. Software features which are not available on commercial systems are emphasized. In particular, the utility of peak overlap and noise threshold subtraction routines are demonstrated with reference to two examples of practical profiling.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740070307
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