ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
A description is given of an Apple II based Auger spectroscopy datasystem specifically designed for depth profiling applications. Software features which are not available on commercial systems are emphasized. In particular, the utility of peak overlap and noise threshold subtraction routines are demonstrated with reference to two examples of practical profiling.
Additional Material:
2 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/sia.740070307
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