Publikationsdatum:
2013-09-17
Beschreibung:
Author(s): M. Wu, E. Benckiser, M. W. Haverkort, A. Frano, Y. Lu, U. Nwankwo, S. Brück, P. Audehm, E. Goering, S. Macke, V. Hinkov, P. Wochner, G. Christiani, S. Heinze, G. Logvenov, H.-U. Habermeier, and B. Keimer A combined analysis of x-ray absorption and resonant reflectivity data was used to obtain the orbital polarization profiles of superlattices composed of four-unit-cell-thick layers of metallic LaNiO 3 and layers of insulating R X O 3 ( R =La, Gd, Dy and X =Al, Ga, Sc), grown on substrates that impose eithe... [Phys. Rev. B 88, 125124] Published Mon Sep 16, 2013
Schlagwort(e):
Electronic structure and strongly correlated systems
Print ISSN:
1098-0121
Digitale ISSN:
1095-3795
Thema:
Physik
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