Publication Date:
2013-09-17
Description:
Author(s): K. Matsuda, T. Nagao, Y. Kajihara, M. Inui, K. Tamura, J. Nakamura, K. Kimura, M. Yao, M. Itou, Y. Sakurai, and N. Hiraoka The electron momentum density (EMD) in liquid silicon (Si) has been measured by synchrotron-based Compton scattering. The observed variation in the valence EMD upon melting, reflecting a semiconductor-metal transition of Si, is well explained by the collapse of the Jones zone of crystalline Si. Howe... [Phys. Rev. B 88, 115125] Published Mon Sep 16, 2013
Keywords:
Electronic structure and strongly correlated systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics