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  • Other Sources  (191)
  • ELECTRONICS AND ELECTRICAL ENGINEERING  (191)
  • 2005-2009
  • 1980-1984  (191)
  • 1965-1969
  • 1982  (191)
  • 1
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    Detection and analysis of radio frequency lightning emissions (1982)
    In:  CASI
    Details
    Publication Date: 2006-02-14
    Description: The feasibility study of detection of lightning discharges from a geosynchronous satellite requires adequate ground-based information regarding emission characteristics. In this investigation, a measurement system for collection of S-band emission data is set up and calibrated, and the operations procedures for rapid data collection during a storm activity developed. The system collects emission data in two modes; a digitized, high-resolution, short duration record stored in solid-state memory, and a continuous long-duration record on magnetic tape. Representative lightning flash data are shown. Preliminary results indicate appreciable RF emissions at 2 gHz from both the leader and return strokes portions of the cloud-to-ground discharge with strong peaks associated with the return strokes.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Alabama Univ. in Huntsville The 1981 NASA(ASEE Summer Fac. Fellowship Program; 20 p
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  • 2
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    The design and evaluation of superconducting connectors (1982)
    In:  CASI
    Details
    Publication Date: 2006-02-14
    Description: The development of a superconducting connector for superconducting circuits on space flights is described. It is proposed that such connectors be used between the superconducting readout loop and the SQUID magnetometer in the Gravity Probe B experiment. Two types of connectors were developed. One type employs gold plated niobium wires making pressure connections to gold plated niobium pads. Lead-plated beryllium-copper spring contacts can replace the niobium wires. The other type is a rigid solder or weld connection between the niobium wires and the niobium pads. A description of the methods used to produce these connectors is given and their performance analyzed.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Alabama Univ. in Huntsville The 1981 NASA(ASEE Summer Fac. Fellowship Program; 10 p
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  • 3
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    Smokeless wire insulation (1982)
    In:  Other Sources
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    Publication Date: 2011-08-19
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA Technol. Appl. Team; p 37
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  • 4
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    Integrating 128 element InSb array - Recent results (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: There has been a continuing evolution toward larger arrays of infrared detectors, and the technology base derived from the Galileo Near Infrared Mapping Spectrometer (NIMS) has been expanded to linear arrays including from 128 to 512 elements. This advance is based on the commercial availability of high-quality InSb photodiodes and 128/256 element FET switch MUX's (multiplexing elements). The present investigation is concerned with an experimental 128-element linear imager using InSb detectors and silicon MUX for readout. Attention is given to detector array electrical characteristics, the detector readout architecture, noise, and special effects.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 5
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    The containment set approach to digital system tolerance of lightning-induced transient faults (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: A fault model and a system model are necessary to assess the tolerance or resilience of a digital system to lightning-induced transients. It is noted that these models are usually developed separately. A new approach is outlined here for this assessment problem which combines the fault and system models into an overall model. With this approach, referred to as the containment set approach, an assessment of the effects of lightning-induced transients can be made in terms of a state transition matrix. This matrix can be generated by means of fault injection experiments. In addition, certain nonredundancy-oriented design alternatives to the achievement of lightning-induced transient tolerance in digital systems are indicated by the containment set approach.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 6
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    SETI downconverter (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: The SETI (Search for Extraterrestrial Intelligence) breadboard subsystem was begun in order to develop the technology to efficiently implement a SETI instrument capable of searching wide bandwidth with high resolution. The downconverter covered is the interface hardware between the receiver IF output and ADC used as the input to the spectrum analyzer.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: The Telecommun. and Data Acquisition Rept.; p 1-5
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  • 7
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    The 400-Hertz constant-speed electrical generation systems (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: Materials illustrating a presentation on 400 Hz constant speed generation systems are presented. The system features are outlined, components and functioning described, and display graphics illustrated.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Langley Research Center Elec. Flight Systems; p 125-146
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  • 8
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    Test chips for custom ICs - Six kinds of test structures (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: Microelectronic test chips contain a number of test structures that are used for a variety of purposes in fabricating integrated circuits. For convenience, their use is divided into six groups: layout-rule evaluating, process-parameter extraction, device-parameter extraction, circuit-parameter extraction, initial-fabrication failure analysis, and reliability failure analysis. A given test structure can be used to gather information in a number of these groups. Examples are given here of the kinds of parameters that can be obtained in each of these groups. A table is included summarizing various device failures common to bulk CMOS and indicating failure mechanisms appearing after wafer fabrication and after stress.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Circuits Manufacturing; June 198
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  • 9
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    Harmonic analysis approach to the 'TunneLadder' - A modified Karp circuit for millimeter-wave TWTA's (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: A field approach to the summed harmonic analysis of the TunneLadder structure, or modified forward-wave Karp circuit, is developed by combining TM(01) and TE(11) modes. Results suggest the suitability of this structure as a high-impedance, about 1-% bandwidth circuit, millimeter-wave forward-wave-type amplifier that is voltage tunable over about a 5-% frequency range and has excellent power handling ability. Theory gives good agreement with experimental results obtained by Karp in omega-beta dispersion and predicts qualitatively the appearances of the antisymmetric mode discussed and of the so called Hightron mode that was discussed earlier in White, Enderby and Birdsall (1964), and Enderby (1964), in addition to the desired symmetric mode.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Electron Devices; ED-29; May 1982
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  • 10
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    Single event upset sensitivity of low power Schottky devices (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: Data taken from tests involving heavy ions in the Berkeley 88 in. cyclotron being directed at low power Schottky barrier devices are reported. The tests also included trials in the Harvard cyclotron with 130 MeV protons, and at the U.C. Davis cyclotron using 56 MeV protons. The experiments were performed to study the single event upsets in MSI logic devices containing flip-flops. Results are presented of single-event upsets (SEU) causing functional degradation observed in post-exposure tests of six different devices. The effectiveness of the particles in producing SEUs in logic device functioning was found to be directly proportional to the proton energy. Shielding was determined to offer negligible protection from the particle bombardment. The results are considered significant for the design and fabrication of LS devices for space applications.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 11
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    The damage equivalence of electrons, protons, and gamma rays in MOS devices (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: The results of laboratory tests to determine the radiation damage effects induced on MOS devices from Co-60, electron, and proton radiation are reported. The tests are performed to establish the relationship between the Co-60 gamma rays and the level of damage to the MOS devices in regards to different damages which can be expected with the electron and particle bombardments experienced in space applications. CMOS devices were exposed to the Co-60 gamma rays, 1 MeV electrons, and 1 MeV protons while operating at 3, 10, and 15 V. The test data indicated that the Co-60 source was reliable for an initial evaluation of the electron damages up to 2 MeV charge. A correction factor was devised for transferring the Co-60 measurements to proton damages, independent of bias and transistor types, for any orbit or environment.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 12
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    Thermal annealing of radiation damage in CMOS ICs in the temperature range -140 C to +375 C (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: Annealing of radiation damage was investigated in the commercial, Z- and J-processes of the RCA CD4007A ICs in the temperature range from -140 C to +375 C. Tempering curves were analyzed for activation energies of thermal annealing, following irradiation at -140 C. It was found that at -140 C, the radiation-induced shifts in the threshold potentials were similar for all three processes. The radiation hardness of the Z- and J-process is primarily due to rapid annealing of radiation damage at room temperature. In the region -140 to 20 C, no dopant-dependent charge trapping is seen, similar to that observed at higher temperatures. In the unbiased Z-process n-channels, after 1 MeV electron irradiation, considerable negative charge remains in the gate oxide.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 13
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    Annual Conference on Nuclear and Space Radiation Effects, 19th, Las Vegas, NV, July 20-22, 1982, Proceedings (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: The results of research concerning the effects of nuclear and space radiation are presented. Topics discussed include the basic mechanisms of nuclear and space radiation effects, radiation effects in devices, and radiation effects in microcircuits, including studies of radiation-induced paramagnetic defects in MOS structures, silicon solar cell damage from electrical overstress, radiation-induced charge dynamics in dielectrics, and the enhanced radiation effects on submicron narrow-channel NMOS. Also examined are topics in SGEMP/IEMP phenomena, hardness assurance and testing, energy deposition, desometry, and radiation transport, and single event phenomena. Among others, studies are presented concerning the limits to hardening electronic boxes to IEMP coupling, transient radiation screening of silicon devices using backside laser irradiation, the damage equivalence of electrons, protons, and gamma rays in MOS devices, and the single event upset sensitivity of low power Schottky devices.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 14
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    The dependence of single event upset on proton energy /15-590 MeV/ (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: Low earth orbit satellite and Jupiter orbiter probe semiconductor devices may incur soft errors or single event upsets, manifested as bit flips, during exposure to such nuclear particles or heavy ions as trapped protons with energies ranging up to 1000 MeV. Experimental data is given on the average proton fluence needed to cause a bit flip as a function of proton energy for isoplanar bipolar TTL RAMs. Error dependence data shape and threshold energy can be related to the existing body of theoretical data on energy deposition following proton nuclear reactions. Experimental data also show that the relative cross sectional amplitude for functionally identical devices can be related to the device's power consumption.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 15
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    Simple phenomenological modeling of transition-region capacitance of forward-biased p-n junction diodes and transistor diodes (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: The derivation of a simple expression for the capacitance C(V) associated with the transition region of a p-n junction under a forward bias is derived by phenomenological reasoning. The treatment of C(V) is based on the conventional Shockley equations, and simpler expressions for C(V) result that are in general accord with the previous analytical and numerical results. C(V) consists of two components resulting from changes in majority carrier concentration and from free hole and electron accumulation in the space-charge region. The space-charge region is conceived as the intrinsic region of an n-i-p structure for a space-charge region markedly wider than the extrinsic Debye lengths at its edges. This region is excited in the sense that the forward bias creates hole and electron densities orders of magnitude larger than those in equilibrium. The recent Shirts-Gordon (1979) modeling of the space-charge region using a dielectric response function is contrasted with the more conventional Schottky-Shockley modeling.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Journal of Applied Physics; 53; Nov. 198
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  • 16
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    ORION downconverter and power supply (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: The receiver subsystem supplies the front end assembly (downconverter) and power supply for the ORION Mobile Station. These assemblies are designed to withstand severe environmental conditions. The mechanical, electronic, environmental and maintenance design considerations encountered during the design phase of this project are discussed. The two channel S/X downconverter has a 400 MHz bandwidth channel. Phase stability of 2 and 7 deg at S- and X-bands, respectively, is achieved with a temperature stabilized first local oscillator.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: The Telecommun. and Data Acquisition Rept.; p 3-9
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  • 17
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    Electric flight systems (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: Materials used to illustrate a presentation on the development of electric flight systems are presented. Systems concepts are outlined.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Langley Research Center Elec. Flight Systems; p 213-234
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  • 18
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    Electronics materials research (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: The electronic materials and is aimed at the establishment of quantitative relationships underlying crystal growth parameters, materials properties, electronic characteristics and device applications. The overall program evolves about the following main thrust areas: (1) crystal growth novel approaches to engineering of semiconductor materials; (2) investigation of materials properties and electronic characteristics on a macro and microscale; (3) surface properties and surface interactions with the bulk and ambients; (4) electronic properties controlling device applications and device performance.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: The Mater. Process Res. Base of the Mater. Process. Center; p 23-46
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  • 19
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    Potential reduction of DSN uplink energy cost (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: DSN Earth stations typically transmit more power than that required to meet minimum specifications for uplink performance. Energy and cost savings that could result from matching the uplink power to the amount required for specified performance are studied. The Galileo mission was selected as a case study. Although substantial reduction in transmitted energy is possible, potential savings in source energy (oil or electricity) savings are much less. This is because of the rising inefficiency in power conversion and radio frequency power generation that accompanies reduced power output.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: The Telecommun. and Data Acquisition Rept.; p 151-166
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  • 20
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    A new high-power klystron for the DSN (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: A very high reliability 100 kW klystron for the Deep Space Network (DSN) high power transmitters in support of spacecrafts to the distant planets was studied. The last phases included electron gun fabrication and beam analyzer evaluation and klystron prototype fabrication, mechanical and electrical design improvements resulted in the delivery of a prototype klystron meeting all requirements. It is concluded that the development of a new high power klystron for the DSN was very successful as demonstrated by the prototype results.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: The Telecommun. and Data Acquisition Rept.; p 157-173
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  • 21
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    A comparison of radiation damage in transistors from cobalt-60 gamma rays and 2.2 MeV electrons (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: The total ionizing dose response of ten bipolar transistor types has been measured using Co-60 gamma rays and 2.2 MeV electrons from exposure levels of 750, 1500, and 3000 Gy(Si). Gain measurements were made for a range of collector-emitter voltages and collector currents.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 22
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    Portable design rules for bulk CMOS (1982)
    In:  Other Sources
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    Publication Date: 2011-08-18
    Description: It is pointed out that for the past several years, one school of IC designers has used a simplified set of nMOS geometric design rules (GDR) which is 'portable', in that it can be used by many different nMOS manufacturers. The present investigation is concerned with a preliminary set of design rules for bulk CMOS which has been verified for simple test structures. The GDR are defined in terms of Caltech Intermediate Form (CIF), which is a geometry-description language that defines simple geometrical objects in layers. The layers are abstractions of physical mask layers. The design rules do not presume the existence of any particular design methodology. Attention is given to p-well and n-well CMOS processes, bulk CMOS and CMOS-SOS, CMOS geometric rules, and a description of the advantages of CMOS technology.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: VLSI Design; 1982
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  • 23
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    Off-line, built-in test techniques for VLSI circuits (1982)
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    Publication Date: 2011-08-18
    Description: It is shown that the use of redundant on-chip circuitry improves the testability of an entire VLSI circuit. In the study described here, five techniques applied to a two-bit ripple carry adder are compared. The techniques considered are self-oscillation, self-comparison, partition, scan path, and built-in logic block observer. It is noted that both classical stuck-at faults and nonclassical faults, such as bridging faults (shorts), stuck-on x faults where x may be 0, 1, or vary between the two, and parasitic flip-flop faults occur in IC structures. To simplify the analysis of the testing techniques, however, a stuck-at fault model is assumed.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Computer; June 198
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  • 24
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    The measurement of lightning environmental parameters related to interaction with electronic systems (1982)
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    Publication Date: 2011-08-18
    Description: The measurement of electromagnetic fields and related quantities in a lightning environment is a challenging problem, especially at high frequencies and/or in the immediate vicinity of the lightning arcs and corona. This paper reviews the techniques for accomplishing such measurements in these regimes with examples. These sensors are often the same as for the nuclear electromagnetic pulse (EMP), but significant differences also appear.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Electromagnetic Compatibility; EMC-24; May 1982
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  • 25
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    Partial discharge testing under direct voltage conditions (1982)
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    Publication Date: 2011-08-18
    Description: DC partial discharge (PD) (corona) testing is performed using a multichannel analyzer for pulse storing, and data is collected during increase of voltage and at quiescent voltage levels. Thus high voltage ceramic disk capacitors were evaluated by obtaining PD data interspersed during an accelerated life test. Increased PD activity was found early in samples that later failed catastrophically. By this technique, trends of insulation behavior are revealed sensitively and nondestructively in high voltage dc components.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Aerospace and Electronic Systems; 18; Jan. 198
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  • 26
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    Modern multistage depressed collectors - A review (1982)
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    Publication Date: 2011-08-18
    Description: The design and performance of the Lewis Research Center (LeRC) electrostatic collector and the associated passive permanent magnetic beam reconditioning (refocusing) are discussed and compared with numerous experimental results on wide- and narrow-band TWT and two klystron cases. Universal designs for efficient collectors for TV klystrons are presented. Collectors other than those based on the symmetric LeRC concept are reviewed only briefly, either because they have not been treated analytically or because only sporadic or incomplete experimental evaluation results are available. It is concluded that significant, a priori predictable performance improvements for TWTs have been demonstrated and that a substantial reduction in the dc power input to TV klystron transmitters could be effected by using well-designed multistage depressed collectors.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE; vol. 70
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  • 27
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    An optimization technique for lumped-distributed two ports (1982)
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    Publication Date: 2011-08-18
    Description: A frequency domain direct efficient analysis and an optimization technique of a large class of lumped-distributed networks containing active elements are presented. Sensitivity and Hessian matrix calculations are performed using truncated Taylor series expansion of two-port parameters of subnetworks. An interactive computer program was developed to demonstrate the application of the method. Examples of network optimizations are included to illustrate the powerfulness of the technique.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Microwave Theory and Techniques; MTT-30; Dec. 198
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  • 28
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    Intermediate power conditioners - Where are we now? (1982)
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    Publication Date: 2011-08-18
    Description: It has been recognized in the photovoltaic (PV) industry that even in the event of a dramatic reduction in the price of generating PV cells, the costs for the other components of the system represent still a major obstacle towards commercialization. A project was, therefore, initiated with the aim to develop baseline and conceptual power conditioner designs which would attempt to meet a specified set of cost and performance goals in the 30 to 200 kW (Intermediate) size. Resulting Intermediate Size Power Conditioner Studies led to a number of conclusions. There is a need for a set of guidelines or standards for utility interconnection. The advent of new devices with more power handling capability will change the desired topology.
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  • 29
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    Life test of 50 AH NiH2 battery (1982)
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    Publication Date: 2016-06-07
    Description: Life cycle testing on a battery is reported. The cells were built in 1975, put into battery in 1976, and flown in 1977 in low Earth orbit.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 487-499
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  • 30
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    Cycling characteristics on NiH2 cells in standard and daily energy balance Leo orbits (1982)
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    Publication Date: 2016-06-07
    Description: A plot of end-of-charge and end-of-discharge voltage versus the number of cycles completed, and end-of-charge and end-of-discharge pressure versus cycles completed are presented.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 501-512
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  • 31
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    Chargeability of nickel electrodes studied by optical microscopy (1982)
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    Publication Date: 2016-06-07
    Description: Some of the operational characteristics of some nickel hydrogen cells are explained. Some strange capacity excursions with cycling were seen.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 459-470
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  • 32
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    A method for battery activation (1982)
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    Publication Date: 2016-06-07
    Description: A technique to activate nickel cadmium batteries is described. The method shortened the time required for activation, eliminated the temperature rise in the batteries, and produced a voltage on the discharge that was better than when the C/20 was run for 48 hours during tests. Various methods of activation are described and evaluated. Results of alternate conditioning charge schemes are presented along with voltage/temperature characteristics for multiple level nickel cadmium battery chargers.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: The 1981 GSFC Battery Workshop; p 423-433
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  • 33
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    Effects of the mode of storage on the capacity fading of the sintered nickel electrodes (1982)
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    Publication Date: 2016-06-07
    Description: A systematic investigation of the effect of temperature and two conditions of storage, shortened and open circuit, on the capacity fading of sintered nickel electrodes in NiCd batteries was conducted. All testing was done on sintered electrodes in flooded cells. Cycling tests to measure the capacity were performed at room temperature. The capacity out to one volt, a capacity useful for satellite applications. Test results indicated that: the shortened electrode showed a higher rate of loss than the open circuit electrodes; there was an increase in both modes with an increase in temperature; there was a loss of capacity with time of storage; a general degradation was observed as a function of time; shortened electrodes showed a higher end of charge than the open circuit ones; and at room temperature there was a lower loss in the open circuit electrode than in the shortened one.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 367-386
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    SMM parallel battery operation in orbit (1982)
    In:  Other Sources
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    Publication Date: 2016-06-07
    Description: A parallel battery system for the SMM spacecraft is described. The battery system performance as a function of lifetime over orbit was evaluated. The following equipment performance specifications were examined during a typical orbit: battery current and discharges, voltage limitations, battery temperature variations, and current sensor performance. Tabulated battery performance data is also included.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: The 1981 GSFC Battery Workshop; p 305-315
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  • 35
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    NiCd cell reversals during reconditioning (1982)
    In:  Other Sources
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    Publication Date: 2016-06-07
    Description: An accelerated battery test with 15 periods of cell reversals during reconditioning was performed. The nature and extent of hydrogen generation was examined, and the effects of reversals on battery performance were determined.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 271-284
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  • 36
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    NiCd battery cycle life prediction equation for low Earth orbit (1982)
    In:  Other Sources
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    Publication Date: 2016-06-07
    Description: Cycle life analysis of the nickel cadmium battery is given. The life prediction equation is limited to spacecraft in low Earth orbits.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 213-222
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  • 37
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    Electrochemical models for the discharge characteristics of the NiCd cell (1982)
    In:  Other Sources
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    Publication Date: 2016-06-07
    Description: Models are developed and discussed as a technique for evaluating the discharge characteristics of the nickel cadmium battery. Results are compared with available experimental data.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 177-188
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  • 38
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    Recent test results on lithium BCX cells (1982)
    In:  Other Sources
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    Publication Date: 2016-06-07
    Description: Texts included: short circuit analysis, voltage reversal, high temperature exposure, parallel loading sharing, capacity tests, shock and vibration tests, and assembly tests. Both the AA and D cell configurations were tested. Certification of the cells is discussed and applications are highlighted.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 55-75
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  • 39
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    New NiCd Battery Standard and Guide (1982)
    In:  CASI
    Details
    Publication Date: 2016-06-07
    Description: The preparation and contents guides designed to provide specifications and standards for NiCd batteries for space missions are discussed. Requirements were established to assure proper in orbit performance and compliance with handling procedures to minimize degradation. The guides were designed to benefit both industries and the military. The surveys include: reasons given for and against the use of flight batteries in systems tests; use of rechargeable batteries during space vehicle testing; and military standards and specifications.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 353-366
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  • 40
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    GPS on-orbit battery performance (1982)
    In:  Other Sources
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    Publication Date: 2016-06-07
    Description: Three batteries designed for the GPS system were evaluated. The batteries were wired together, and during the eclipse period were discharged through parallel diodes into a boost converter which then boosted the battery voltage up to the totally regulated bus voltage. Each battery, with a system life of approximately five years, had its own charger. During testing the battery was maintained or used on trickle charge. Data are presented for the battery capacity during the reconditioning. Raw data for each eclipse period and calculations for the average discharge voltage for each battery are given. Thermal cycling for one of the batteries and reconditioning cycles and regimes for all of the batteries are discussed. A reconditioning discharge curve is also given. The problem of temperature cycling in one of the batteries was resolved by redesigning the battery radiator system.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 341-352
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  • 41
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    Progress in secondary lithium batteries (1982)
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    Publication Date: 2016-06-07
    Description: The lithium/molybdenum trisulfide system is discussed. This system has a higher potential energy density than that of lithium/titanium disulfide. Possible energy densities and performance values for cells, projected from preliminary data obtained on small cells, are summarized. The electrode structure is emphasized as an important factor in the decreasing of capacity upon cycling.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 141-148
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  • 42
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    Heat generation rates in lithium thionyl chloride cells (1982)
    In:  Other Sources
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    Publication Date: 2016-06-07
    Description: An empirical equation that is useful for good first approximation in thermal modeling is presented. Indications and measurements of electrochemical heat effects were investigated. The particular cells of interest are of the D size, with spiral wound configuration and were instrumented with a thermocouple. It is found that cathode limited cells can explode on reversal at moderate temperatures.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 91-99
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  • 43
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    Alternate seal configuration for lithium primary cells (1982)
    In:  Other Sources
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    Publication Date: 2016-06-07
    Description: The problem of glass degradation in the glass-to-metal seals in lithium/sulfur dioxide cells is discussed. The glass degradation mechanism is attributed to lithium reacting with glass which is a result of deposition of lithium at the glass/metal/electrolyte interface. The worst degradation was observed when cells were stored in the inverted position. Alternate sealing methods were examined and a modified Ziegler seal is considered to be one of the best possible methods. The seal consists of a crimp type soft seal using a plastic annulus and a metal tube. Results of degradation tests are presented.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 45-54
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  • 44
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    Accelerating rate calorimetry: A new technique for safety studies in lithium systems (1982)
    In:  Other Sources
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    Publication Date: 2016-06-07
    Description: The role of exothermic reactions in battery test modes is discussed. The exothermic reactions are characterized with respect to their time-temperature and time-pressure behavior. Reactions occuring for any major exotherm were examined. The accelerating rate calorimetry methods was developed to study lithium cells susceptibility to thermal runaway reactions following certain abuse modes such as forced discharge into reversal and charging.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 31-44
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  • 45
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    Comparisons of different plate treatment and designs: An update (1982)
    In:  Other Sources
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    Publication Date: 2016-06-07
    Description: Nine groups of cells were studied. The first group was the control. The basic design was cadmium in the positive plate, and no negative treatment. The plate loading level was the IUE. The separator was pellon. The test regime for the remaining cells was a 90 minute cycle with 40% depth of discharge and a temperature of 20 C. The charge rate was 9.6 amps to a voltage limit. The discharge rate was 9.6 amps.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: The 1981 GSFC Battery Workshop; p 435-442
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  • 46
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    Sintered plaque characteristics (1982)
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    Publication Date: 2016-06-07
    Description: The structural transformations occurring during sintering, the fabrication of a slurry produced sintered plaque, are detailed. Degradation of the positive electrode in performance in cycling in a nickel hydrogen battery were traced to the quality of the sintered plaque. Electrode degradation was found to be a limiting factor in the battery cycle life. Details of microstructural characterization and distribution of pores, examination of plastic flow during shrinkage, and observations of the rounding of nickel powder particles during the slurry process are presented.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 387-402
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  • 47
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    Update: Viking Lander NiCd batteries. Year six (1982)
    In:  Other Sources
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    Publication Date: 2016-06-07
    Description: The performance of NiCd batteries on the Viking Mars landers is discussed. During evaluation, three of the four batteries were maintained in the discharged state. Battery charge regimes and close-together, deep-discharge, reconditioning cycles to retard degradation of batteries are discussed. The effect of elevated temperatures during Martian summer on battery performance were also considered. Tabulated data for average battery capacity as a function of time are given. A design uplink to allow more frequent, greater depth of discharge reconditioning cycles was proposed.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 327-339
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  • 48
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    Nickel system manufacturing update (1982)
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    Publication Date: 2016-06-07
    Description: The electrochemical positive electrode was used in nickel hydrogen for six or seven years with very good results, primarily because of the dimensional stability and the high electrical utilization of the active material.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 547-549
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  • 49
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    Positive electrode processing for Hughes NiH2 cells (1982)
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    Publication Date: 2016-06-07
    Description: The basic procedures were developed for the manufacture of nickel cadmium batteries. An electrochemical impregnation in an aqueous ethanol solution is used in this process. Several additional controls were instituted for production of flight electrodes, including a Hughes controlled MCD, a solution reserved exclusively for the impregnation of Hughes positive electrodes a system of complete traceability for individual electrodes, an electrical characterization test to provide information on weight and capacity at the plaque level, and a stress test to provide data on capacity, weight, and physical parameters at the electrode level.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 471-480
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  • 50
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    RCA SATCOM in-orbit experience: An update (1982)
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    Publication Date: 2016-06-07
    Description: The SATCOM in-orbit battery performance was evaluated. The capacitance and constant current charge rates for each of the three batteries were monitored. A typical eclipse discharge profile was generated and attendant reconditioning recharge conditions were considered. Battery temperatures, pressures, and average battery voltages are presented in tabular form. In-orbit data from monitoring the end of discharge voltage during eclipses, a key performance parameter, are also given.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 317-326
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  • 51
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    DSCS 3 life test progress report (1982)
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    Publication Date: 2016-06-07
    Description: Life test considerations for a spacecraft power supply system, a battery system, designed for synchronous communication satellites for the Defense Satellite Communication System are described. The following equipment specifications considered in the life tests were: the nickel cadmium cells; bus conductors; diodes; battery casings; electric discharges; voltage drops; pressure, and temperature measurements. Battery performance data collected during eclipse periods is presented in tabular form.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 293-304
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  • 52
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    An improved equation for discharge voltage (1982)
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    Publication Date: 2016-06-07
    Description: An improved equation for battery discharge voltage was developed. By looking at the voltage discharge curves, some prediction of cell life could be made.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 257-269
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  • 53
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    Time-to-failure analysis for NiCd batteries in a CPS orbit (1982)
    In:  Other Sources
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    Publication Date: 2016-06-07
    Description: Cells operating at five degrees Celsius or less, and going to 60 to 65 percent depth of discharge, were studied as to whether they could achieve a useful working life of 7.5 years in a GPS orbit. The characteristics of various orbits were compared and it is noted that the GPS orbit experiences only 220 cycles a year and must be treated as a geosynchronous rather than a low Earth orbit. Cell degradation is considered to be the result of both trickle-charge degradation and degradation due to cycling. Time-to-failure values are presented for selected temperatures and depth of discharges.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 223-236
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  • 54
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    Navy position on lithium safety (1982)
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    Publication Date: 2016-06-07
    Description: The Navy's position on safety of lithium batteries is discussed. Testing includes: short circuit with all fuses bypassed; forced discharge at the fuse value; and a modified incineration test.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 157-163
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  • 55
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    Factors affecting cycle life in ambient temperature of secondary lithium batteries (1982)
    In:  Other Sources
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    Publication Date: 2016-06-07
    Description: Three major factors are discussed: electrode integrity, electrolyte stability, and dendrite formation. It is concluded that elastomers can function as improved binders for rechargeable cathodes. The cathodes can retain integrity under long cycle life with no visual deteriorations. It is found that microelectrodes can be made from powdery cathode materials for voltammetry studies.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 123-140
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  • 56
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    Case-positive versus case-negative designs for low-rate lithium thionyl chloride cells (1982)
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    Publication Date: 2016-06-07
    Description: Case polarity design choices are discussed. Two examples of case-negative designs are presented. One battery is thionyl chloride limited and the other is lithium limited. The case-positive design is thionyl chloride limited. It is found that the case-positive/case-negative design consideration does not seem to have much bearing on storage. However, during low rate discharge, the case-negative cells show a steadily decreasing capacity as you go to lower and lower rates.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 77-90
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  • 57
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    Galileo battery (1982)
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    Publication Date: 2016-06-07
    Description: A general discussion of the battery requirements for the Galileo probe is presented. Problems arising from mission changes are emphasized.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 237-256
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  • 58
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    Life prediction model comparisons (1982)
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    Publication Date: 2016-06-07
    Description: Predictive failure models for nickel cadmium batteries are discussed. Emphasis is given to the McDermott model, the Lander model, and the JPL failure model.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 201-212
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  • 59
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    Nickel-hydrogen flight relay and cell shorting test (1982)
    In:  Other Sources
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    Publication Date: 2016-06-07
    Description: A relay used on a standard flight configuration of nickel-hydrogen cells is discussed.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 525-532
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  • 60
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    OAO-C end-of-mission power subsystem engineering evaluation (1982)
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    Publication Date: 2016-06-07
    Description: The battery performance on both Orbiting Astronomical Observatory missions was excellent. The end-of-mission power subsystem tests on the battery and the solar arrays provides a real-time degradation analysis for these two components.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: The 1981 GSFC Battery Workshop; p 285-292
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  • 61
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    Destruct/non-destruct evaluation of cycled NiCd cells (1982)
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    Publication Date: 2016-06-07
    Description: AC impedance techniques are discussed for a non-destruct analysis of nickel cadmium batteries. A technique for determining battery cycle life is the ultimate goal.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 165-176
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  • 62
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    Discharge of 1400 AH lithium thionyl chloride cells into voltage reversal (1982)
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    Publication Date: 2016-06-07
    Description: The development of a high energy density battery is discussed. Tests were conducted on a 1400 AH cell and they include: drop tests, crush tests, vibration and shock tests, hydrostatic pressure effects, charge current tests, and discharge tests. None of these tests led to a venting or explosion of the cell. Criteria are presented for extending RV safety of a 1400 AH cell.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 101-112
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  • 63
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    High rate, high reliability Li/SO2 cells (1982)
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    Publication Date: 2016-06-07
    Description: The use of the lithium/sulfur dioxide system for aerospace applications is discussed. The high rate density in the system is compared to some primary systems: mercury zinc, silver zinc, and magnesium oxide. Estimates are provided of the storage life and shelf life of typical lithium sulfur batteries. The design of lithium cells is presented and criteria are given for improving the output of cells in order to achieve high rate and high reliability.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 15-30
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  • 64
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    Some properties of NiH2 cells (1982)
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    Publication Date: 2016-06-07
    Description: Different tests on a flight type cell are discussed. The temperature was measured at the cell flange. The cell was charged to rollover at .75 C rate at 40 degrees C for the first temperature. At that point a voltage reading was taken. Charging was done for an arbitrary ten seconds at .75 C, 30 C, 20 C, 10 C and zero C to obtain momentarily stable voltages.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 513-524
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  • 65
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    NiH2 cell test update (1982)
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    Publication Date: 2016-06-07
    Description: Testing at 9500 cycles on one cell and at 7500 on a second is reported. A third cell failed.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 533-545
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  • 66
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    COMSAT Labs life test data for NiH2 cells (1982)
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    Publication Date: 2016-06-07
    Description: Data concerning a ten cell nickel hydrogen battery are presented. The plates are electrochemically impregnated using slurry plaque.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 481-485
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  • 67
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    Comparisons of different plate treatments and designs: Analysis (1982)
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    Publication Date: 2016-06-07
    Description: The design and process changes on cell performance and life were studied. The merits of each design were analyzed physically, chemically, and electrochemically. A teardown analysis of each cell was carried out. On opening the cell it was found that the cell pack was moist with the electrolyte, the extent varying from one cell to another. The cell components, the positives, the negatives, and the separators, could be separated easily for cell pack of an uncycled cell. The separators from the uncycled cell were clean and white. In the case of cycled cells the separators were stuck to the surface of the negative plates. During the removal of these separators from the negative plates invariably a thin layer of the separator material was strongly adhering to the surface of the negative plates and could not be removed as easily as in the case of the uncycled cells. The separators had dark patches due to cadmium migration.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 443-458
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  • 68
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    Recent developments in the NSWC composite electrode (1982)
    In:  Other Sources
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    Publication Date: 2016-06-07
    Description: A characterization of the physical parameters and life cycle data on nickel composite electrodes was conducted. Attempts to improve the nickel composite electrodes with respect to longevity, light weight, and low cost were made. The physical characteristics of a group of electrodes were examined with emphasis on the porosity of the plaques, the thickness of the electrodes, and the potential presence of electrolytes contamination. It was concluded that the nickel composite electrodes exhibit good life cycle characteristics and that their fabrication seems to present real possibilities for the future as a method of making electrodes that are durable, lightweight, and low cost.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 403-414
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  • 69
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    NiCd battery failure analysis (1982)
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    Publication Date: 2016-06-07
    Description: The failure of a nickel cadmium battery undergoing tests is discussed. Reasons for the complete destruction of the battery while undergoing preparation for thermal vacuum testing are given.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 189-200
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  • 70
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    Army position on lithium battery safety (1982)
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    Publication Date: 2016-06-07
    Description: User requirements for lithium sulfur batteries are presented. They include careful analysis of design and quality control, along with certain equipment specifications. Some of the specifications include: hermetically sealed cells; lithium limited cells with stoichiometry of lithium to sulfur dioxide as a ratio of one; low moisture content in the cells; and battery capacity.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 149-156
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    High-rate lithium thionyl chloride cells (1982)
    In:  Other Sources
    Details
    Publication Date: 2016-06-07
    Description: A high-rate C cell with disc electrodes was developed to demonstrate current rates which are comparable to other primary systems. The tests performed established the limits of abuse beyond which the cell becomes hazardous. Tests include: impact, shock, and vibration tests; temperature cycling; and salt water immersion of fresh cells.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 113-122
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    Origin and control of instability in SCR/triac three-phase motor controllers (1982)
    In:  CASI
    Details
    Publication Date: 2016-06-07
    Description: The energy savings and reactive power reduction functions initiated by the power factor controller (PFC) are discussed. A three-phase PFC with soft start is examined analytically and experimentally to determine how well it controls the open loop instability and other possible modes of instability. The detailed mechanism of the open loop instability is determined and shown to impose design constraints on the closed loop system. The design is shown to meet those constraints.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Marshall Space Flight Center The 1982 NASA(ASEE Summer Fac. Fellowship Program; 30 p
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    Stripe filters on multispectral linear arrays (1982)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: Dielectric interference filters deposited directly on top of existing 200 element charge coupled device linear imaging arrays were designed, fabricated and evaluated. The optical performance of the filters was verified with regard to crosstalk between adjacent detector elements. The filters showed an average in-band transmittance greater than 80% and a total out of band transmittance of less than 5%. Filter stability was adequate for operation in a space environment. The filter elements were definable in 12 to 25 micron element size compatible with existing silicon detectors. These type of measurement were made: (1) spectral transmission of the filter as deposited on witness plates; (2) spectral response of the silicon sensing device; (3) any optical interaction between filter and sensing device; (4) the response of the filter/sensor combination; and (5) repeatability and uniformity of filter characteristics. Detailed discussion of these evaluations are given.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-CR-175305 , NAS 1.26:175305
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    High density circuit technology, part 4 (1982)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: An accurate study and evaluation of dielectric thin films is conducted in order to find the material or combination of materials which would optimize NASA'S double layer metal process. Emphasis is placed on polyimide dielectrics because of their reported outstanding dielectric characteristics (including electrical, chemical, thermal, and mechanical) and ease of processing, as well as their rapid acceptance by the semiconductor industry.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-CR-162041 , NAS 1.26:162041 , MSSU-EIRS-EE-82-2-PT-4
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    High density circuit technology, part 3 (1982)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: Dry processing - both etching and deposition - and present/future trends in semiconductor technology are discussed. In addition to a description of the basic apparatus, terminology, advantages, glow discharge phenomena, gas-surface chemistries, and key operational parameters for both dry etching and plasma deposition processes, a comprehensive survey of dry processing equipment (via vendor listing) is also included. The following topics are also discussed: fine-line photolithography, low-temperature processing, packaging for dense VLSI die, the role of integrated optics, and VLSI and technology innovations.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-CR-162040 , NAS 1.26:162040 , MSSU-EIRS-EE-82-2-PT-3
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    High density circuit technology, part 2 (1982)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: A multilevel metal interconnection system for very large scale integration (VLSI) systems utilizing polyimides as the interlayer dielectric material is described. A complete characterization of polyimide materials is given as well as experimental methods accomplished using a double level metal test pattern. A low temperature, double exposure polyimide patterning procedure is also presented.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-CR-162039 , NAS 1.26:162039 , MSSU-EIRS-EE-82-2-PT-2
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    Testing and failure analysis to improve screening techniques for hermetically sealed metallized film capacitors for low energy applications (1982)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: Effective screening techniques are evaluated for detecting insulation resistance degradation and failure in hermetically sealed metallized film capacitors used in applications where low capacitor voltage and energy levels are common to the circuitry. A special test and monitoring system capable of rapidly scanning all test capacitors and recording faults and/or failures is examined. Tests include temperature cycling and storage as well as low, medium, and high voltage life tests. Polysulfone film capacitors are more heat stable and reliable than polycarbonate film units.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-CR-162071 , NAS 1.26:162071
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    Characteristics of RF resulting from dielectric discharges (1982)
    In:  Other Sources
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    Publication Date: 2019-06-28
    Description: This paper presents measurements of the electromagnetic radiation pulses and the replacement current pulses which result from the breakdown of Mylar and Kapton samples. The observed dependence of the characteristics of the replacement current pulse as a function of electron beam energy is discussed. The characteristics of the electromagnetic radiation pulses are also analyzed in the text of this paper. The source of the irradiating electrons is a monoenergetic electron beam whose energy was varied from 12.5 KeV to 25 KeV.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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    Single event upset vulnerability of selected 4K and 16K CMOS static RAM's (1982)
    In:  Other Sources
    Details
    Publication Date: 2019-06-28
    Description: Upset thresholds for bulk CMOS and CMOS/SOS RAMS were deduced after bombardment of the devices with 140 MeV Kr, 160 MeV Ar, and 33 MeV O beams in a cyclotron. The trials were performed to test prototype devices intended for space applications, to relate feature size to the critical upset charge, and to check the validity of computer simulation models. The tests were run on 4 and 1 K memory cells with 6 transistors, in either hardened or unhardened configurations. The upset cross sections were calculated to determine the critical charge for upset from the soft errors observed in the irradiated cells. Computer simulations of the critical charge were found to deviate from the experimentally observed variation of the critical charge as the square of the feature size. Modeled values of series resistors decoupling the inverter pairs of memory cells showed that above some minimum resistance value a small increase in resistance produces a large increase in the critical charge, which the experimental data showed to be of questionable validity unless the value is made dependent on the maximum allowed read-write time.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 80
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    A monolithic lead sulfide-silicon MOS integrated-circuit structure (1982)
    In:  Other Sources
    Details
    Publication Date: 2019-06-28
    Description: A technique is developed for directly integrating infrared photoconductive PbS detector material with MOS transistors. A layer of chromium, instead of aluminum, is deposited followed by a gold deposition in order to ensure device survival during the chemical deposition of the PbS. Among other devices, a structure was fabricated and evaluated in which the PbS was directly coupled to the gate of a PMOS. The external bias, load, and source resistors were connected and the circuit was operated as a source-follower amplifier. Radiometric evaluations were performed on a variety of different MOSFETs of different geometry. In addition, various detector elements were simultaneously fabricated to demonstrate small element capability, and it was shown that elements of 25 x 25 microns could easily be fabricated. Results of room temperature evaluations using a filtered 700 K black body source yielded a detectivity at peak wavelength of 10 to the 11th cm (root Hz)/W at 100 Hz chopping frequency.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Electron Devices; ED-29; Dec. 198
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  • 81
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    Model calculations of lightning electric fields (1982)
    In:  Other Sources
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    Publication Date: 2019-06-28
    Description: Calculated time-domain waveforms and frequency spectra are presented for three of the most important processes in a lightning discharge to ground: the return stroke, the stepped leader, and the preliminary breakdown. For each of these processes, the model calculations are given for 200 m and 50 km. The calculations are compared with available time and frequency domain measurements.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 82
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    Parametric study of minimum converter loss in an energy-storage dc-to-dc converter (1982)
    In:  Other Sources
    Details
    Publication Date: 2019-06-28
    Description: Through a combination of analytical and numerical minimization procedures, a converter design that results in the minimum total converter loss (including core loss, winding loss, capacitor and energy-storage-reactor loss, and various losses in the semiconductor switches) is obtained. Because the initial phase involves analytical minimization, the computation time required by the subsequent phase of numerical minimization is considerably reduced in this combination approach. The effects of various loss parameters on the optimum values of the design variables are also examined.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 83
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    A high efficiency 3 kW switchmode battery charger (1982)
    In:  Other Sources
    Details
    Publication Date: 2019-06-28
    Description: This paper discusses the design approach and status of a high-efficiency switchmode battery charger designed to charge a 108 V battery from the 115 Vac line. The charger contains a transformer isolated boost chopper operating at 20 kHz. The boost inductor current is programmed to follow the ac line voltage such that high power factor operation and low line distortion are obtained.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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    Design, construction and long life endurance testing of cathode assemblies for use in microwave high-power transmitting tubes (1982)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: The ability of state of the art cathode types to produce current densities of 2A/sq cm, respectively, over a minimum designed life of 30,000 hours of continuous operation without failures was demonstrated. The performance of the state of the art cathode types was evaluated by endurance testing while operating under identical electrical geometrical, and vacuum conditions that realistically duplicate the operating conditions present in a transmitter tube. Although there has been considerable life testing done on high current density types of cathodes, these have beem primarily limited to diodes. A diode and high power microwave tube are grossly different devices. A comparison of these two devices is provided. A diode and high power microwave tube are quite different; one could therefore assume different internal environments, especially in the cathode region. Therefore, in order to establish life capabilities of the cathodes just mentioned, they should be tested in a vehicle which has an internal environment similar to that of a high power microwave tube.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-CR-168112 , NAS 1.26:168112 , IR-5
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    Computer simulations of optimum boost and buck-boost converters (1982)
    In:  Other Sources
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    Publication Date: 2019-06-28
    Description: The development of mathematicl models suitable for minimum weight boost and buck-boost converter designs are presented. The facility of an augumented Lagrangian (ALAG) multiplier-based nonlinear programming technique is demonstrated for minimum weight design optimizations of boost and buck-boost power converters. ALAG-based computer simulation results for those two minimum weight designs are discussed. Certain important features of ALAG are presented in the framework of a comprehensive design example for boost and buck-boost power converter design optimization. The study provides refreshing design insight of power converters and presents such information as weight annd loss profiles of various semiconductor components and magnetics as a function of the switching frequency.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Aerospace and Electronic Systems; AES-18; Sept
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  • 86
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    Off-nadir antenna bias correction using Amazon rain sigma(0) data (1982)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: The radar response from the Amazon rain forest was studied to determine the suitability of this region for use as a standard target to calibrate a scatterometer like that proposed for the National Oceanic Satellite System (NOSS). Backscattering observations made by the SEASAT Scatterometer System (SASS) showed the Amazon rain forest to be a homogeneous, azimuthally-isotropic, radar target which was insensitive to polarization. The variation with angle of incidence was adequately modeled as scattering coefficient (dB) = a theta b with typical values for the incidence-angle coefficient from 0.07 to 0.15 dB/deg. A small diurnal effect occurs, with measurements at sunrise being 0.5 dB to 1 dB higher than the rest of the day. Maximum-likelihood estimation algorithms presented here permit determination of relative bias and true pointing angle for each beam. Specific implementation of these algorithms for the proposed NOSS scatterometer system is also discussed.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-CR-165921 , NAS 1.26:165921 , RSL-TR-343-6
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    Design of a multistage depressed collector for the F-16 radar dual mode transmitter tube (1982)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: The design of a multistage depressed collector (MDC) for use with the F-16 radar dual mode transmitter tube is described. The methods employed and the rationale on which the design is based are presented.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-TM-82982 , E-1413 , NAS 1.15:82982
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  • 88
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    An improved switching converter model (1982)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: The nonlinear modeling and analysis of dc-dc converters in the continuous mode and discontinuous mode was done by averaging and discrete sampling techniques. A model was developed by combining these two techniques. This model, the discrete average model, accurately predicts the envelope of the output voltage and is easy to implement in circuit and state variable forms. The proposed model is shown to be dependent on the type of duty cycle control. The proper selection of the power stage model, between average and discrete average, is largely a function of the error processor in the feedback loop. The accuracy of the measurement data taken by a conventional technique is affected by the conditions at which the data is collected.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-CR-169669 , NAS 1.26:169669
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    High speed computerized data acquisition of photovoltaic V-I characteristics (1982)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: The voltage current (V-I) characteristics of the photovoltaic array were studied under actual environmental conditions. A method of data acquisition was devised that uses a capacitor charge technique to obtain the V-I characteristic and a computerized data system to display, record and process the data. The capacitor charge technique uses an array shorting transistor and a capacitor bank to sweep the array operating voltage and current from short circuit to open circuit in a specified time (approximately 125 ms). The computerized data system is synchronized with this transition and repetitively samples the array voltage and current during the transition and records the ambient conditions. This data is then normalized by the computer to standard conditions (100 mW/sq cm, 28 C) and is available in tabular and graphic form for both the voltage current and voltage power characteristics. The capacitor charge technique is described.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-TM-82967 , E-1387 , NAS 1.15:82967 , DOE/NASA/20485-12
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    Modeling and analysis of several classes of self-oscillating inverters. I - State-plane representations. II - Model extension, classification, and duality relationships (1982)
    In:  Other Sources
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    Publication Date: 2019-06-28
    Description: The present investigation is concerned with an important class of power conditioning networks, taking into account self-oscillating dc-to-square-wave transistor inverters. The considered circuits are widely used both as the principal power converting and processing means in many systems and as low-power analog-to-discrete-time converters for controlling the switching of the output-stage semiconductors in a variety of power conditioning systems. Aspects of piecewise-linear modeling are discussed, taking into consideration component models, and an equivalent-circuit model. Questions of singular point analysis and state plane representation are also investigated, giving attention to limit cycles, starting circuits, the region of attraction, a hard oscillator, and a soft oscillator.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Circuits and Systems; CAS-29; June 198
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    Flip-flop resolving time test circuit (1982)
    In:  Other Sources
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    Publication Date: 2019-06-28
    Description: Integrated circuit (IC) flip-flop resolving time parameters are measured by wafer probing, without need of dicing or bonding, throught the incorporation of test structures on an IC together with the flip-flop to be measured. Several delays that are fabricated as part of the test circuit, including a voltage-controlled delay with a resolution of a few picosecs, are calibrated as part of the test procedure by integrating them into, and out of, the delay path of a ring oscillator. Each of the delay values is calculated by subtracting the period of the ring oscillator with the delay omitted from the period with the delay included. The delay measurement technique is sufficiently general for other applications. The technique is illustrated for the case of the flip-flop parameters of a 5-micron feature size NMOS circuit.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Journal of Solid-State Circuits; SC-17; Aug. 198
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    Electrical properties of multi p-n junction devices (1982)
    In:  Other Sources
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    Publication Date: 2019-06-28
    Description: The electrical properties of multi p-n junction devices are analyzed. It is found that this type of device possesses bistable characteristics similar to that of a Shockley diode and thus provides an alternative realization of devices for switching applications. The inherently greater current gains involved in the operations of such a device yield in principle higher breakover voltages and higher holding currents. Furthermore, the incorporation of heterostructures in this device introduces a new degree of freedom in tailoring their switching characteristics. Multi p-n heterojunction devices operating as SCR lasers were fabricated, and the experimental results are presented.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Electron Devices; ED-29; June 198
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    Far-infrared imaging antenna arrays (1982)
    In:  Other Sources
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    Publication Date: 2019-06-28
    Description: A far-infrared monolithic imaging antenna array with diffraction-limited resolution has been demonstrated. The optical system is similar to an oil-immersion microscope, except that the position of the object and the image are interchanged. The array is a series of evaporated silver bow-tie antennas of 75 nm thick, spaced at 310 microns, on a fused-quartz substrate; the bow angle of 60 deg gives an impedance of 150 ohm to match to bismuth microbolometers. The measured responsivity of the array elements is 1-2 V/W at the relatively low bias of 1 mA. Previous measurements have shown that the bolometers are 1/f noise limited up to 100 kHz and that they have a frequency response of 5 MHz. The antenna array should be adequate for far-infrared plasma interferometer measurements.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Applied Physics Letters; 40; Feb. 1
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    Method for sequentially processing a multi-level interconnect circuit in a vacuum chamber (1982)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: The processing of wafer devices to form multilevel interconnects for microelectronic circuits is described. The method is directed to performing the sequential steps of etching the via, removing the photo resist pattern, back sputtering the entire wafer surface and depositing the next layer of interconnect material under common vacuum conditions without exposure to atmospheric conditions. Apparatus for performing the method includes a vacuum system having a vacuum chamber in which wafers are processed on rotating turntables. The vacuum chamber is provided with an RF sputtering system and a DC magnetron sputtering system. A gas inlet is provided in the chamber for the introduction of various gases to the vacuum chamber and the creation of various gas plasma during the sputtering steps.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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    Component technology for space power systems (1982)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: The Lewis/OAST program for the development of Component Technology for Space Power Systems is described. The program is divided into five generic areas: semiconductor devices (transistors, thyristors, and diodes); conductors (materials and transmission lines); dielectrics; magnetic devices; and thermal control devices. Examples of progress in each of the five areas is discussed. Bipolar power transistors up to 1000 V at 100 A with a gain of 10 and a 0.5 mu sec rise and fall time are presented. A new class of semiconductor devices with a possibility of switching 1000 000 V is described. Several 100 kW rotary power transformer designs and a 25 kW, 20 kHz transformer weighting 3.2 kg have been developed. Progress on the creation of diamond-like films for thermal devices and intercalated carbon fibers with the strength of steel and the conductivity of copper at one third the mass of copper is presented.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-TM-82928 , E-1322 , NAS 1.15:82928
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    LSI/VLSI design for testability analysis and general approach (1982)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: The incorporation of testability characteristics into large scale digital design is not only necessary for, but also pertinent to effective device testing and enhancement of device reliability. There are at least three major DFT techniques, namely, the self checking, the LSSD, and the partitioning techniques, each of which can be incorporated into a logic design to achieve a specific set of testability and reliability requirements. Detailed analysis of the design theory, implementation, fault coverage, hardware requirements, application limitations, etc., of each of these techniques are also presented.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-CR-169145 , JPL-Pub-82-50 , NAS 1.26:169145
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    Discriminator aided phase lock acquisition for suppressed carrier signals (1982)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: A discriminator aided technique for acquisition of phase lock to a suppressed carrier signal utilizes a Costas loop which is initially operated open loop and control voltage for its VCXO is derived from a phase detector that compares the VCXO to a reference frequency thus establishing coarse frequency resolution with the received signal. Then the Costas loop is closed with the low-pass filter of the channel having a bandwidth much greater (by a factor of about 10) than in the I channel so that a frequency discriminator effect results to aid carrier resolution. Finally, after carrier acquisition, the Q-channel filter of the Costas loop is switched to a bandwidth substantially equal to that of the I-channel for carrier tracking.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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    Control means for a solid state crossbar switch (1982)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: A control system for a solid state crossbar switch which allows a plurality of switch control and interrogation functions to be implemented by time sharing related circuitry is described. The crossbar switch includes a plurality of X ports and Y ports, each X-Y port intersection designating a specific X-Y intersection latch which controls a plurality of associated switches for interconnecting one set of data lines associated with the X port to another set of data lines associated with the Y port. The control system continuously and sequentially addresses each of the X-Y intersection latches at a 10 megahertz rate. During this addressing, the control circuitry includes a capability for interrogating each intersection latch for determining which are in a set condition, ensuring that only one X-Y intersection latch is set on an X row and Y column defining that latch, resetting all of the X-Y intersection latches, and determining which of the X-Y intersection latches are in a set condition.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 99
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    Photoelectric detection system (1982)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: A photoelectric beam system for the detection of the arrival of an object at a discrete station wherein artificial light, natural light, or no light may be present is described. A signal generator turns on and off a signal light at a selected frequency. When the object in question arrives on station, ambient light is blocked by the object, and the light from the signal light is reflected onto a photoelectric sensor which has a delayed electrical output but is of the frequency of the signal light. Outputs from both the signal source and the photoelectric sensor are fed to inputs of an exclusively OR detector which provides as an output the difference between them. The difference signal is a small width pulse occurring at the frequency of the signal source. By filter means, this signal is distinguished from those responsive to sunlight, darkness, or 120 Hz artificial light. In this fashion, the presence of an object is positively established.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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  • 100
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    Liquid-immersible electrostatic ultrasonic transducer (1982)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: A broadband megahertz range electrostatic acoustic transducer for use in a liquid environment is described. A liquid tight enclosure includes a metallic conducting membrane as part of its outside surface and has a means inside the liquid tight enclosure for applying a tension to the membrane and for mounting an electrode such that the flat end of the electrode is aproximately parallel to the membrane. The invention includes structure and a method for ensuring that the membrane and the flat end of the electrode are exactly parallel and a fixed predetermined distance from each other.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
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