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  • 1
    Electronic Resource
    Electronic Resource
    Investigation of carrier transport through silicon wafers by photocurrent measurements (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 4000-4008 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Measurement of the ac photocurrent in metal/insulator/semiconductor capacitors can be used as a tool to measure minority-carrier diffusion and lifetime. The amplitude of the ac photocurrent generated at a silicon surface biased into inversion depends on the number of excess minority carriers present at that surface. By comparing this amplitude when intensity-modulated light is directed to each side of the same device, minority-carrier diffusion from the back to the front of the device can be characterized. An analytical model of this transport process predicts the dependence of the ac photocurrent on frequency and wafer thickness, and allows the determination of a value of the bulk lifetime free of the influence of surface recombination. Measurements under low-light intensity levels are presented on n-type silicon wafers with lifetimes in the 10–100 μs range. Lifetimes are found about a factor of 2 lower than those measured with noncontact photoconductive decay, at high-light intensity levels. This is expected due to the difference between high- and low-level minority-carrier injection. Fitting the data to the model also yields a value of 115 μm for the average depth at which carriers are generated and diffuse to the front with backside illumination at 940 nm.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.356022
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  • 2
    Electronic Resource
    Electronic Resource
    A new instrument for the simultaneous determination of pH and redox potential (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 4341-4346 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A significant upgrading of a recently introduced biosensor system, called potentiometric alternating biosensor is presented. The transducer consists of a light-addressable silicon chip, which provides regions properly modified and functionalized to yield sensitivity to either pH or redox potentials. The computer controlled system drives an array of light sources, allowing two-dimensional signal acquisition and processing. The system can provide multiparameter information related to the local modifications made on the sensing surface of the transducer. This work presents a detailed description of the measuring principles and the spatial resolution obtainable with the system. In addition, the complete circuit design is presented, both for signal conditioning, and for the bidimensional matrix addressing. A typical experiment for selective measurements is presented. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145325
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  • 3
    Electronic Resource
    Electronic Resource
    More information on the calibration of scanning stylus microscopes by two-dimensional fast Fourier-transform analysis (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 2860-2863 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An analysis of two-dimensional fast Fourier transform from images of periodical lattices (like highly oriented pyrolytic graphite) has been performed to understand and decouple the various parameters which account for distorted images in stylus microscopy. The effects of the various sources of image distortion have been described by means of linear maps and a mathematical approach has been developed to find the various correction coefficients resulting from the Fourier space analysis which restore the correct geometry of the images. Furthermore, the trend analysis of the distortion angle upon the scanning frequency shows the possibility of decoupling the role of "static'' and "time dependent'' distortion parameters. This possibility may be used for an a priori prediction of possible distortions in stylus microscopy and thus for a real-time correction of the images during scanning.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145207
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  • 4
    Electronic Resource
    Electronic Resource
    A simple method for preparing calibration standards for the three working axes of scanning probe microscope piezo scanners (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 748-751 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A method for preparing samples suitable for calibrating scanning probe microscopes (SPM) and for eliminating any distortions in images is described. Samples consist of polystyrene particles organized in monolayers and bilayers with hexagonal-ordered domains. The monolayer is not uniform, but is characterized by areas without particles. These discontinuities allow the measurement of the thickness of the monolayer in order to calibrate the z axes, while the lattice constant of the domains can be used as a calibration standard for the x and y axes. The nondeformability of the particles after the deposition on the substrate has been studied by an optical microscope, equipped for interferometric measurements, scanning force microscopy, and scanning tunneling microscopy. The use of these standards directly as substrates for samples is proposed to correct the distortions in the SPM images. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146803
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