A method for preparing samples suitable for calibrating scanning probe microscopes (SPM) and for eliminating any distortions in images is described. Samples consist of polystyrene particles organized in monolayers and bilayers with hexagonal‐ordered domains. The monolayer is not uniform, but is characterized by areas without particles. These discontinuities allow the measurement of the thickness of the monolayer in order to calibrate the z axes, while the lattice constant of the domains can be used as a calibration standard for the x and y axes. The nondeformability of the particles after the deposition on the substrate has been studied by an optical microscope, equipped for interferometric measurements, scanning force microscopy, and scanning tunneling microscopy. The use of these standards directly as substrates for samples is proposed to correct the distortions in the SPM images.
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March 1996
Research Article|
March 01 1996
A simple method for preparing calibration standards for the three working axes of scanning probe microscope piezo scanners
Dario Alliata;
Dario Alliata
Technobiochip, Via della Marina, 57030 Marciana (LI), Italy
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Ciro Cecconi;
Ciro Cecconi
Technobiochip, Via della Marina, 57030 Marciana (LI), Italy
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Claudio Nicolini
Claudio Nicolini
Technobiochip, Via della Marina, 57030 Marciana (LI), Italy
Institute of Biophysics, University of Genova, Via Giotto 2, 16153 Genova, Italy
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Rev. Sci. Instrum. 67, 748–751 (1996)
Article history
Received:
October 19 1995
Accepted:
December 14 1995
Citation
Dario Alliata, Ciro Cecconi, Claudio Nicolini; A simple method for preparing calibration standards for the three working axes of scanning probe microscope piezo scanners. Rev. Sci. Instrum. 1 March 1996; 67 (3): 748–751. https://doi.org/10.1063/1.1146803
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