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  • American Institute of Physics (AIP)  (2)
  • 1995-1999  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 748-751 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A method for preparing samples suitable for calibrating scanning probe microscopes (SPM) and for eliminating any distortions in images is described. Samples consist of polystyrene particles organized in monolayers and bilayers with hexagonal-ordered domains. The monolayer is not uniform, but is characterized by areas without particles. These discontinuities allow the measurement of the thickness of the monolayer in order to calibrate the z axes, while the lattice constant of the domains can be used as a calibration standard for the x and y axes. The nondeformability of the particles after the deposition on the substrate has been studied by an optical microscope, equipped for interferometric measurements, scanning force microscopy, and scanning tunneling microscopy. The use of these standards directly as substrates for samples is proposed to correct the distortions in the SPM images. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 4341-4346 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A significant upgrading of a recently introduced biosensor system, called potentiometric alternating biosensor is presented. The transducer consists of a light-addressable silicon chip, which provides regions properly modified and functionalized to yield sensitivity to either pH or redox potentials. The computer controlled system drives an array of light sources, allowing two-dimensional signal acquisition and processing. The system can provide multiparameter information related to the local modifications made on the sensing surface of the transducer. This work presents a detailed description of the measuring principles and the spatial resolution obtainable with the system. In addition, the complete circuit design is presented, both for signal conditioning, and for the bidimensional matrix addressing. A typical experiment for selective measurements is presented. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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