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  • American Institute of Physics (AIP)  (9)
  • American Association of Petroleum Geologists (AAPG)  (3)
  • Cambridge University Press
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 90 (2001), S. 6458-6465 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Particulate composites with negative stiffness inclusions in a viscoelastic matrix are shown to have higher thermal expansion than that of either constituent and exceeding conventional bounds. It is also shown theoretically that other extreme linear coupled field properties including piezoelectricity and pyroelectricity occur in layer- and fiber-type piezoelectric composites, due to negative inclusion stiffness effects. The causal mechanism is a greater deformation in and near the inclusions than the composite as a whole. A block of negative stiffness material is unstable, but negative stiffness inclusions in a composite can be stabilized by the surrounding matrix and can give rise to extreme viscoelastic effects in lumped and distributed composites. In contrast to prior proposed composites with unbounded thermal expansion, neither the assumptions of void spaces nor slip interfaces are required in the present analysis. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 4757-4760 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Formation of Schottky barrier contacts to n-type 6H-SiC for a number of metals chosen to include a variety of physical and chemical properties has been investigated. The metals (Pd, Au, Ag, Tb, Er, Mn, Al, and Mg) were deposited onto room temperature surfaces terminated with a submonolayer coverage of oxygen. The metal/6H-SiC interface chemistry and Schottky barrier height φB during contact formation were obtained with x-ray photoemission spectroscopy; the electrical properties of subsequently formed thick contacts were characterized by current-voltage and capacitance-voltage techniques. The øB values for these metals extend over a wide 1.3 eV range. To a varying degree φB depends on the 6H-SiC crystal face (Si vs C). Mg and Al (Si face of latter) have φB=0.3 eV, a value which is suitable for nonalloyed ohmic contacts.
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 6375-6381 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Hall measurements were conducted at temperatures up to 1000 K on unintentionally doped n-type β(3C)- and α(6H)-SiC thin films epitaxially grown on both on-axis and vicinal Si (100) and α(6H)-SiC (0001) by chemical vapor deposition. The carrier concentration versus temperature data were analyzed using a compensation model. The β-SiC films grown on Si were highly compensated (NA/ND=0.73–0.98). The compensation ratio was not as large in the SiC films grown on α-SiC (NA/ND=0.36, for β-SiC on α-SiC, and 0.02, for α-SiC on α-SiC). The donor ionization energy for β-SiC on Si was calculated to be 14–21 meV. Analogous values for β- and α-SiC films on α-SiC were 33 and 84 meV, respectively. These values are smaller than those for N determined from photoluminescence studies.
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 86 (1999), S. 1765-1767 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Room temperature photoreflectance (PR) was used to investigate the surface state densities of GaAs and In0.52Al0.48As surface intrinsic-n+ structures. The built-in electric field and thus the surface barrier height are evaluated using the observed Franz–Keldysh oscillations in the PR spectra. Based on the thermionic emission theory and current-transport theory, the surface state density as well as the pinning position of the Fermi level can be determined from the dependence of the surface barrier height on the pump beam intensity. Even though this method is significantly simpler, easier to perform, and time efficient compared with other approaches, the results obtained agree with the literature. © 1999 American Institute of Physics.
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 92 (2002), S. 920-926 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A lattice-matched In0.53Ga0.47As/In0.52Al0.48As single quantum well (SQW) structure grown by gas source molecular beam epitaxy has been investigated by photoreflectance (PR) and photoluminescence (PL). The PR measurements allowed the observation of interband transitions from the heavy- and light-hole valence subbands to the conduction subbands. The transition energies measured from the PR spectra agree with those calculated theoretically. Two features corresponding to the ground state transition coming from the SQW and the band gap transition generated from the buffer layer are observed in the PL spectra and are in good agreement with the PR data. The effect of the temperature on the transition energies is essentially same as that in the gap transition of the bulk structure. The values of the Varshni coefficients of InGaAs/InAlAs were obtained from the relation between the exciton transition energy and the temperature. The built-in electric field could be determined and located from a series of PR spectra by sequential etching processes. The phase spectra obtained from the PR spectra by the Kramers–Kronig transformation were analyzed in terms of the two-ray model, and calculated the etching depth in each etching, and thus leading to the etching rate. The etching rate obtained from phase shift analysis agrees with that measured by atomic force microscopy. The etching results suggest that a built-in electric field exists at the buffer/substrate interface and it also enables us to determine the etching rate. © 2002 American Institute of Physics.
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  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 70 (1997), S. 1296-1298 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Phase images of 20–30-nm-diam silicon spheres were collected by holographic methods in a field-emission transmission electron microscope. The spherical geometry enables the effect of specimen thickness on the electron-wave phase to be separated from the intrinsic Si electron-optical refractive effects allowing a determination of the mean inner potential Φ0. This work finds Φ0=11.9±0.9 V characterizing amorphous Si and 12.1±1.3 V characterizing crystalline Si. The phase images can resolve a 2-nm-thick native oxide layer and give Φ0 for SiO2=10.1±0.6 V. The phase data can quickly recognize a surface layer, and the effect of a surface layer on the determination of the bulk mean potential can be minimized. © 1997 American Institute of Physics.
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 83 (1998), S. 2857-2859 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Built-in electric fields and interfacial state densities (Dit) in a series of oxide–GaAs heterostructures fabricated by in situ molecular beam epitaxy were studied using room temperature photoreflectance. The samples investigated were air-, Al2O3–Ga2Ox–, and Ga2O3(Gd2O3)–GaAs. We found that the built-in electric fields are 48, 44, and 38 kV/cm for air-, Al2O3-, and Ga2Ox–GaAs samples, respectively. For the Ga2O3(Gd2O3)–GaAs sample, the built-in electric field is negligibly small, indicating a very low interfacial state density. Estimated by the low field limit criterion, Dit is less than 1×1011 cm−2 eV−1. Our results on the Ga2O3(Gd2O3)–GaAs sample are consistent with the data obtained previously using capacitance–voltage measurements in quasistatic/high frequency modes and photoluminescence measurements. © 1998 American Institute of Physics.
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  • 8
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 68 (1996), S. 3452-3454 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Photoreflectance measurements have been performed on a δ-doped GaAs homojunction. Two Franz–Keldysh oscillation features originating from two different regions (a buffer layer and a top layer) of the structure superimpose with each other in the photoreflectance spectrum. By properly selecting the reference phase, one of the features can be suppressed, thus enabling us to determine the electric fields from the two regions unambiguously. The electric field in the top layer is 3.5±0.2×105 V/cm, which is in good agreement with theoretical calculation. The electric field in the buffer layer is 1.2±0.1×104 V/cm. © 1996 American Institute of Physics.
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  • 9
    Publication Date: 2015-07-07
    Description: Using a seismic database from the Qiongdongnan Basin in the South China Sea, this study demonstrates that shelf-edge trajectories and stratal stacking patterns are reliable, but understated, predictors of deep-water sedimentation styles and volumes of deep-water sand deposits, assisting greatly in locating sand-rich environments and in developing a more predictive and dynamic stratigraphy. Three main types of shelf-edge trajectories and their associated stratal stacking patterns were recognized: (1) flat to slightly falling trajectories with negative trajectory angles ( $${T}_{\mathrm{se}}$$ ) (–2° to 0°) and negative shelf-edge aggradation to progradation ratios ( $$\mathrm{d}y/\mathrm{d}x$$ ) (–0.04 to 0) and associated progradational and downstepping stacking patterns with low clinoform relief ( $${R}_{\mathrm{c}}$$ ) (150–550 m [492–1804 ft]) and negative differential sedimentation on the shelf and basin ( $${A}_{\mathrm{s}}/{A}_{\mathrm{b}}$$ ) (–0.6 to 0); (2) slightly rising trajectories with moderate $${T}_{\mathrm{se}}$$ (0°–2°) and medium $$\mathrm{d}y/\mathrm{d}x$$ (0–0.04), and associated progradational and aggradational stacking patterns with intermediate $${R}_{\mathrm{c}}$$ (250–400 m [820–1312 ft]) and intermediate $${A}_{\mathrm{s}}/{A}_{\mathrm{b}}$$ (0–0.6); and (3) steeply rising trajectories with high $${T}_{\mathrm{se}}$$ (2°–6°) and high $$\mathrm{d}y/\mathrm{d}x$$ (0.04–0.10) and associated dominantly aggradational stacking patterns with high $${R}_{\mathrm{c}}$$ (350–650 m [1148–2132 ft]) and high $${A}_{\mathrm{s}}/{A}_{\mathrm{b}}$$ (1–2). Each trajectory regime represents a specific stratal stacking patterns, providing new tools to define a model-independent methodology for sequence stratigraphy. Flat to slightly falling shelf-edge trajectories and progradational and downstepping stacking patterns are empirically related to large-scale, sand-rich gravity flows and associated bigger and thicker sand-rich submarine fan systems. Slightly rising shelf-edge trajectories and progradational and aggradational stacking patterns are associated with mixed sand/mud gravity flows and moderate-scale slope-sand deposits. Steeply rising shelf-edge trajectories and dominantly aggradational stacking patterns are fronted by large-scale mass-wasting processes and associated areally extensive mass-transport systems. Therefore, given a constant sediment supply, then $${T}_{\mathrm{se}}$$ , $$\mathrm{d}y/\mathrm{d}x$$ , $${R}_{\mathrm{c}}$$ , and $${A}_{\mathrm{s}}/{A}_{\mathrm{b}}$$ are all proportional to intensity of mass-wasting processes and to amounts of mass-transport deposits, and are inversely proportional to the intensity of sand-rich gravity flows and to amounts of deep-water sandstone. These relationships can be employed to relate quantitative characteristics of shelf-edge trajectories and stratal stacking patterns to deep-water sedimentation styles.
    Print ISSN: 0149-1423
    Electronic ISSN: 0149-1423
    Topics: Geosciences
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  • 10
    Publication Date: 2013-02-04
    Description: A series of short and steep unidirectionally migrating deep-water channels, which are typically without levees and migrate progressively northeastward, are identified in the Baiyun depression, Pearl River Mouth Basin. Using three-dimensional seismic and well data, the current study documents their morphology, internal architecture, and depositional history, and discusses the distribution and depositional controls on the bottom current–reworked sands within these channels. Unidirectionally migrating deep-water channels consist of different channel-complex sets (CCSs) that are, overall, short and steep, and their northeastern walls are, overall, steeper than their southwestern counterparts. Within each CCS, bottom current–reworked sands in the lower part grade upward into muddy slumps and debris-flow deposits and, finally, into shale drapes. Three stages of CCSs development are recognized: (1) the early lowstand incision stage, during which intense gravity and/or turbidity flows versus relatively weak along-slope bottom currents of the North Pacific intermediate water (NPIW-BCs) resulted in basal erosional bounding surfaces and limited bottom current–reworked sands; (2) the late lowstand lateral-migration and active-fill stage, with gradual CCS widening and progressively northeastward migration, characterized by reworking of gravity- and/or turbidity-flow deposits by vigorous NPIW-BCs and the CCSs being mainly filled by bottom current–reworked sands and limited slumps and debris-flow deposits; and (3) the transgression abandonment stage, characterized by the termination of the gravity and/or turbidity flows and the CCSs being widely draped by marine shales. These three stages repeated through time, leading to the generation of unidirectionally migrating deep-water channels. The distribution of the bottom current–reworked sands varies both spatially and temporally. Spatially, these sands mainly accumulate along the axis of the unidirectionally migrating deep-water channels and are preferentially deposited to the side toward which the channels migrated. Temporally, these sands mainly accumulated during the late lowstand lateral-migration and active-fill stage. The bottom current–reworked sands developed under the combined action of gravity and/or turbidity flows and along-slope bottom currents of NPIW-BCs. Other factors, including relative sea level fluctuations, sediment supply, and slope configurations, also affected the formation and distribution of these sands. The proposed distribution pattern of the bottom current–reworked sands has practical implications for predicting reservoir occurrence and distribution in bottom current–related channels.
    Print ISSN: 0149-1423
    Electronic ISSN: 0149-1423
    Topics: Geosciences
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