ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The temperature dependence of the complex refractive indices of SbSI, MoS2, and BiVO4 have been investigated using spectroscopic ellipsometry. The wavelength of maximum temperature dependence was identified for an in depth study of the sensitivity of the reflectance coefficient to a small ac temperature modulation. It was found feasible to detect temperature changes of 10−3, 10−2, and 10−2 °C by monitoring the reflectance coefficient of SbSI, MoS2, and BiVO4, respectively, using null ellipsometry. It is thus possible to use the pyro-optic phenomena for long wavelength infrared imaging, analogous to pyroelectrics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.351132
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