ISSN:
1432-0630
Keywords:
73.40.Lq
;
72.20Jv
;
72.80.Cw
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract P-n junctions of silicon-wedge microcontacts with variable constrictions down to 0.1 μm diameter exhibit current transport behavior completely different from the conventional large-area junctions. Generation and recombination dominate for junctions larger than 1 μm diameter; smaller junctions show a predominance of space charge and resistive effects.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00618875
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