Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
69 (1996), S. 1942-1944
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
An x-ray diffraction study of YBa2Cu3O7−x (YBCO) films deposited on YAlO3 (001) substrates by metal organic chemical vapor deposition is reported. The twinning orientation of YBCO on YAlO3 is compared to the one observed for films deposited on MgO (001), SrTiO3 (001), and LaAlO3 (012) substrates. The φ scans performed on hhl type reflections and the grazing incidence x-ray diffraction on the 020/200 reflections of YBCO reveal a particular epitaxial relationship on YAlO3: there is only one twinning direction relatively to the substrate. The [110] and [11¯0] directions of YBCO are aligned with the [010] direction of YAlO3. This twinning geometry may be explained by coherency strains. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.117629
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