ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We have developed a technique for detecting single-ions that uses CR-39 plastic. Chemical etching of the plastic enables us to visualize both the incident sites and the existence of the single-ion incidences as etch pits. Using this technique, we obtained a singularity rate of 88.3%. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1150107
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