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  • 1
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Fatigue & fracture of engineering materials & structures 20 (1997), S. 0 
    ISSN: 1460-2695
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract— In this investigation the Electron Channelling Contrast (ECC) technique in scanning electron microscopy (SEM) was applied to reveal the dislocation structures in the vicinity of surface fatigue cracks in comparison to those of cyclically-deformed recrystallized polycrystalline copper. The plastic zone around a fatigue crack was found to consist of an innermost region containing cells, followed by a region containing dense veins and PSBs, surrounded by a structure of loose veins, bundles and loop patches typical of the cyclically deformed matrix. A relation between plastic strain amplitude values deduced from cyclic stress-strain investigations and the dislocation structures near fatigue cracks are given. Typical regions of damage accumulation were identified and plastic strain contours for surface fatigue cracks established. The essentially non-destructive ECC technique is particularly suited to identify the changes in mesoscopic dislocation structures from surface layers to the interior of specimens over large specimen areas.
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  • 2
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Advances in Space Research 1 (1981), S. 117-120 
    ISSN: 0273-1177
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Solid State Electronics 9 (1966), S. 1119-1122+IN3-IN4+1123-1124 
    ISSN: 0038-1101
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Fatigue & fracture of engineering materials & structures 2 (1979), S. 0 
    ISSN: 1460-2695
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract A detailed characterization of the room temperature fatigue properties of powder metallurgical Mo, Mo–W and Ti–Zr–Mo (TZM) alloys is presented. In particular the factors affecting fatigue crack nucleation and growth behaviour are described. Fatigue tests were carried out by conventional rotating-bending and compared with results from a time-saving 20 kHz resonance push-pull test method. Fatigue strength data were determined by a statistical evaluation of test results from a sufficiently large number of specimens. The results show an increase in fatigue strength with alloying additions. Fatigue cracks were observed nucleating at highly localized slip bands at the specimen surface with the fatigue crack zones comprising only a small fraction of the total specimen cross-section. Fatigue crack growth rates at low stress intensities and threshold stress intensity values for crack growth were determined for a stress ratio of R=– 1 using a 20 kHz resonance test method. These latter values were found to be sensitively dependent on microstructure, composition and processing history.
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  • 5
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Fatigue & fracture of engineering materials & structures 12 (1989), S. 0 
    ISSN: 1460-2695
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract— The notch size effect (i.e. the decrease of the notched fatigue limit with increasing notch size for the same stress concentration factor) was quantitatively derived by describing the threshold conditions for the propagation of a short semi-elliptical crack nucleated at the notch root. A close relation between the Kitagawa—Takahashi diagram for the short crack threshold stress and the dependence of the notched fatigue limit on the notch size was shown. The derived relation for the notch size effect was experimentally verified for several specimen/notch geometries in the cases of pressure vessel steel and copper.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Fatigue & fracture of engineering materials & structures 9 (1986), S. 0 
    ISSN: 1460-2695
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: The fact that very small notches (cavities, holes, scratches, etc.) have no effect on the fatigue limit of metallic materials is well known. This paper presents both a qualitative explanation for the existence of non-damaging notches and a quantitative derivation of their critical sizes. The condition for a notch (characterized by the stress concentration factor Kt and the notch root radius ρ) to be non-damaging in a metallic material (characterized by a critical crack size l0) is(K2t− 1)ρ≤ 4.5 l0.The critical crack size can be expressed with good approximation in terms of the threshold stress intensity for fatigue crack growth and the plain fatigue limit. Therefore the above relation can be applied for an engineering evaluation of non-damaging notches. Test results obtained for copper and a pressure vessel steel demonstrate the applicability of the proposed method.
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Naturwissenschaften 61 (1974), S. 78-79 
    ISSN: 1432-1904
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology , Chemistry and Pharmacology , Natural Sciences in General
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [s.l.] : Nature Publishing Group
    Nature 199 (1963), S. 1054-1056 
    ISSN: 1476-4687
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Notes: [Auszug] PREVIOUS investigations have shown that transmission electron microscopy is a powerful tool for the examination of structure and imperfections in metals and semiconductors1. For transmission electron microscopy, specimen thicknesses must be of the order of a few hundred Å. In the case of ...
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  • 9
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 7 (1972), S. 712-714 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Springer
    Monatshefte für Chemie 103 (1972), S. 482-491 
    ISSN: 1434-4475
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Description / Table of Contents: Zusammenfassung In Au-diffundierten, Phosphor-dotierten Si-Scheiben wurden durch Transmissionselektronenmikroskopie feine Ausscheidungsteilchen beobachtet, von denen angenommen wurde, daß sie aus einer Au−P-Verbindung bestehen. Um die für eine Identifizierung dieser Ausscheidung mittels Elektronenbeugung notwendigen Daten der Kristallstruktur zu eihalten, wurde eine geringe Menge von Au2P3-Einkristallen durch eine Gasphasentransportreaktion der Elemente hergestellt. Die erhaltenen Kristalle wurden chemisch und durch Röntgenbeugung untersucht. Weiters wurden Aussagen über die Morphologie und die Stabilität der Au2P3-Kristalle erhalten.
    Notes: Abstract Fine precipitate particles assumed to consist of a Au−P compound were observed by transmission electron microscopy in Au-diffused phosphorus-doped Si-wafers. To obtain crystal structure data required for an electron diffraction identification of this precipitate, a small amount of Au2P3 single crystals was grown from the elements by a vapor transport method and analyzed by chemical and X-ray diffraction methods. In addition, information on the morphology and stability of Au2P3 crystals was obtained.
    Type of Medium: Electronic Resource
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