ISSN:
1476-4687
Quelle:
Nature Archives 1869 - 2009
Thema:
Biologie
,
Chemie und Pharmazie
,
Medizin
,
Allgemeine Naturwissenschaft
,
Physik
Notizen:
[Auszug] PREVIOUS investigations have shown that transmission electron microscopy is a powerful tool for the examination of structure and imperfections in metals and semiconductors1. For transmission electron microscopy, specimen thicknesses must be of the order of a few hundred Å. In the case of ...
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1038/1991054a0
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