ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A single channel AM reflectometer, operating in the frequency range of 33.0≤f≤50.0 GHz, has been developed to provide edge electron density profiles on TdeV. The X-mode cut-off layer, covering densities ne≤1019 m−3 for 1.5 T operation, is used to measure a portion of the plasma edge region 0.9≤r/a≤1.2. Briefly, our design consists in launching a microwave beam amplitude modulated at 201 MHz. The reflected wave is detected and downconverted to 1 MHz to facilitate filtering and phase detection. Finally, a linear phase detector compares the phase of the resulting signal (1 MHz) with that of the reference source. The design and construction of the reflectometer will be described and preliminary results presented. © 1997 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1147733
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