Publication Date:
2019-07-13
Description:
A description is presented of the fabrication of a new InSb CCD chip based on an improved process which eliminates the limitations inherent with the earlier techniques. This process includes planar junction formation and an aluminum and SiO2 material system which is amenable to state-of-the-art chemical and plasma delineation techniques. Further, the new chip integrates for the first time in monolithic format InSb IR detectors with an InSb CCD. The reported experiments represent the first operation of an InSb infrared CCD array. In addition to fuller characterization of the 20-element charge-coupled infrared imaging device, several factors which influence device performance are currently being addressed. These include surface state density, the CCD output circuit, and storage time (dark current).
Keywords:
INSTRUMENTATION AND PHOTOGRAPHY
Type:
AIAA PAPER 78-1728
,
American Institute of Aeronautics and Astronautics and NASA, Conference on ''Smart'' Sensors; Nov 14, 1978 - Nov 16, 1978; Hampton, VA
Format:
text
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