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  • 1
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    In:  Other Sources
    Publication Date: 2011-08-24
    Description: Resistivity of a Thin Film Deposited on a Conductive Substrate is a computer program developed to aid in the solution of the class of problems where resistivity measurements are needed for a substance deposited on a substrate of higher resistivity than the deposited layer. One of the ways in which a semiconductor material is characterized is by measurement of its resistivity. In the development of silicon carbide (SiC) for use as a semiconductor material for high temperature applications, it became necessary to measure the resistivity of the thin SiC film while it was still attached to the silicon upon which it had been grown epitaxially. The problem is that the presence of the silicon substrate will introduce error in the measured resistivity of the SiC. This program assumes that the resistivity of a thin film of conducting material deposited on another layer of conducting material is measured using the four-point probe. Using the four-point probe measurements, this program calculates the "true" resistivity of the deposited layer on a substrate of finite and different resistivity. Starting from basic principles, an expression for the ratio of measured voltage difference to injected current is developed. This expression involves the probe spacing, relative thicknesses of the layers, and the substrate resistivity as parameters, as well as the unknown resistivity of the deposited layer. The unknown resistivity can be found by iteratively evaluating the theoretical expression. This must be done numerically. The program is written in FORTRAN 77 and targeted for use on an IBM PC or compatible. It can be modified for use on any machine with a FORTRAN 77 compiler. It requires 46K of memory and has been implemented under MS-DOS 3.2.1. The program was developed in 1986.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: LEW-14389
    Format: text
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  • 2
    Publication Date: 2016-06-07
    Description: Laser anemometers (LA's) for use in the study of the hot section components of turbomachinery are being developed. Specifically, laser anemometers are being developed for use in the 50.8-cm (20-in.) diameter warm turbine and high-pressure turbine (HPT) facilities at Lewis. A brief review of the status of the program along with some preliminary data taken in an open-jet burner are presented.
    Keywords: LASERS AND MASERS
    Type: Turbine Eng. Hot Sect. Tec; Turbine Eng. Hot Sec
    Format: application/pdf
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  • 3
    Publication Date: 2016-06-07
    Description: Laser anemometers are being developed for use in the turbine facilities at Lewis that are involved in the Turbine Engine Hot Section Technology Program. The status of the program is given along with some results accomplished since 1983.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: Turbine Engine Hot Section Technology, 1984; 11 p
    Format: application/pdf
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  • 4
    Publication Date: 2019-06-28
    Description: A series of FORTRAN-77 programs is described which correct for the effect of a conducting substrate when a linear four-point probe is used to measure the resistivity of a thin film. The resistivity of the film is given in terms of the thicknesses of the film and substrate, the known resistivity of the substrate, and the measured delta V/I. A full development is given as well as a complete description of the operation of the programs. The programs themselves can be obtained through COSMIC, and are identified as LEW No. 14381.
    Keywords: COMPUTER PROGRAMMING AND SOFTWARE
    Type: NASA-TM-87262 , E-2954
    Format: application/pdf
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  • 5
    Publication Date: 2019-06-28
    Description: A real-time Sensor Failure Simulator (SFS) was designed and assembled for the Advanced Detection, Isolation, and Accommodation (ADIA) program. Various designs were considered. The design chosen features an IBM-PC/XT. The PC is used to drive analog circuitry for simulating sensor failures in real-time. A user defined scenario describes the failure simulation for each of the five incoming sensor signals. Capabilities exist for editing, saving, and retrieving the failure scenarios. The SFS has been tested closed-loop with the Controls Interface and Monitoring (CIM) unit, the ADIA control, and a real-time F100 hybrid simulation. From a productivity viewpoint, the menu driven user interface has proven to be efficient and easy to use. From a real-time viewpoint, the software controlling the simulation loop executes at greater than 100 cycles/sec.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-TM-87271 , E-3137 , NAS 1.15:87271
    Format: application/pdf
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  • 6
    Publication Date: 2019-06-28
    Description: A newly developed alloy, palladium-13 weight percent chromium (Pd13Cr), was identified by United Technologies Research Center under a NASA contract to be the best material for high temperature strain gage applications. An electrical resistance strain gage that can provide accurate static strain measurement to a temperature higher than that of a commercially available gage is urgently needed in aerospace and aeronautics research. A strain gage made of a 25.4 micron (1 mil) diameter Pd13Cr wire has been recently demonstrated to be usable for static strain measurements to 800 C. This compares to the 400 C temperature limit of the commercially available strain gages. The performance of the Pd-Cr gage, however, strongly depends on the quality of the Pd13Cr wire. Four batches of Pd-Cr wires purchased from three different manufacturers were therefore evaluated to determine the best source of the wire for strain gage applications. The three suppliers were Precious Metal Institute in China, Sigmund Cohn Co., and G & S Titanium, Inc. in the United States. Two batches of wires obtained from Previous Metal Institute in 1987 and 1992, respectively are referred to herein as China87 and China92 wires. The mechanical, chemical and electrical properties of these wires, both as-received and after high temperature exposures at 800 C for 50 hours were analyzed. The elastic modulus and the failure strength of the wires were evaluated using a tensile test machine equipped with a laser speckle strain measurement system. The chemical and microstructural properties of the wires were inspected using a plasma atomic emission spectrometer and a scanning electron microscope (SEM) equipped with an energy dispersive X-ray spectroscope (EDS). The electrical stability and repeatability of the wires were determined by measuring the electrical resistance of the wires during three thermal cycles to 1000 C and a ten-hour soak at 1000 C. As a result of this study, the wire which has the highest strength, the least impurities content, the best oxidation resistance and the best electrical stability will be selected for upcoming strain gage applications.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: NASA-TM-106857 , E-9448 , NAS 1.15:106857
    Format: application/pdf
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  • 7
    Publication Date: 2019-06-28
    Description: A digital optical torquemeter system designed for applications at high rotational speeds was fabricated and tested for zero stability at speeds up to 20,000 rpm. Data obtained in a spin rig and with simulated inputs demonstrate that the system is capable of measuring torque bar twist to within 0.03 degrees at speeds of 30,000 rpm. The optical system uses fiber optic bundles to transmit light to the torque bar and to silicon avalanche detectors. The system is microcomputer based and provides measurements of average torque and torque as a function of angular shaft position. The torquemeter requires no bearings or other contact between the rotating torque bar and the nonrotating optics, and tolerates movement of the torque bar as large as 1 mm relative to the optics.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: NASA-TM-82914 , E-1189 , NAS 1.15:82914
    Format: application/pdf
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  • 8
    Publication Date: 2019-06-28
    Description: The fringe type laser anemometer is analyzed using the Cramer-Rao bound for the variance of the estimate of the Doppler frequency as a figure of merit. Mie scattering theory is used to calculate the Doppler signal wherein both the amplitude and phase of the scattered light are taken into account. The noise from wall scatter is calculated using the wall bidirectional reflectivity and the irradiance of the incident beams. A procedure is described to determine the optimum aperture mask for the probe volume located a given distance from a wall. The expected performance of counter type processors is also discussed in relation to the Cramer-Rao bound. Numerical examples are presented for a coaxial backscatter anemometer. Previously announced in STAR as N84-25019
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: AIAA PAPER 84-1459
    Format: text
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  • 9
    Publication Date: 2019-07-13
    Description: Simulations of laser Doppler anemometer (LDA) systems have focused primarily on noise studies or biasing errors. Another possible source of error is the choice of filter types and filter cutoff frequencies. Before it is applied to the counter portion of the signal processor, a Doppler burst is filtered to remove the pedestal and to reduce noise in the frequency bands outside the region in which the signal occurs. Filtering, however, introduces errors into the measurement of the frequency of the input signal which leads to inaccurate results. Errors caused by signal filtering in an LDA counter-processor data acquisition system are evaluated and filters for a specific application which will reduce these errors are chosen.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: NASA-TM-87047 , E-2609 , NAS 1.15:87047 , Intern. Laser Anemometry Symp., ASME Winter Ann. Meeting,; Nov 17, 1985 - Nov 21, 1985; Miami, FL; United States
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  • 10
    Publication Date: 2019-07-13
    Description: The fringe type laser anemometer is analyzed using the Cramer-Rao bound for the variance of the estimate of the Doppler frequency as a figure of merit. Mie scattering theory is used to calculate the Doppler signal wherein both the amplitude and phase of the scattered light are taken into account. The noise from wall scatter is calculated using the wall bidirectional reflectivity and the irradiance of the incident beams. A procedure is described to determine the optimum aperture mask for the probe volume located a given distance from a wall. The expected performance of counter type processors is also discussed in relation to the Cramer-Rao bound. Numerical examples are presented for a coaxial backscatter anemometer.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: NASA-TM-83658 , E-2099 , NAS 1.15:83658 , AIAA PAPER 84-1459 , Joint Propulsion Conf.; Jun 11, 1984 - Jun 13, 1984; Cincinnati, OH; United States
    Format: application/pdf
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