Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
23 (1990), S. 476-484
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
The use of a one-dimensional position-sensitive detector for diffuse X-ray scattering measurements is described. Calibration procedures for scattering angle and intensity measurements are discussed. Some nonuniformities have been found in the counting efficiency as a function of distance along the detector. A procedure is described for measuring the diffuse scattering in a section of reciprocal space.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S002188989000646X
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